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Serial Attached SCSI (SAS & SAS 2) Information Resource Center

Serial Attached SCSI (SAS) is a data-transfer technology for moving data to and from storage devices. SAS depends on a point-to-point serial protocol that replaces parallel SCSI bus technology that is commonly used in data centers, workstations and servers. The technology is based on a serial transmission scheme and uses an embedded clock with the 8b/10b data encoding scheme.

The SAS technology is currently at its second generation. It is referred to as SAS-2 and covers speeds of up to 6Gb/s, allowing for faster data transfer than the previous generation. Its predecessor, SAS-1 only covers speeds of up to 3Gb/s. One of the uniqueness of SAS is it offers backwards-compatibility with Serial ATA (SATA) storage devices. SATA devices may be connected to SAS backplanes, but SAS drives may not be connected to SATA backplanes.

The T10 technical committee of the International Committee for Information Technology Standards (INCITS) develops and maintains the SAS protocol and physical layers, while the SCSI Trade Association (SCSITA) promotes the technology. Keysight is an active member and contributor of the T10 and SCSITA, with consistent participation in workshops and specifications development. These resources you find here will provide you with an overview of SAS design, understand the latest measurement techniques, and illustrate design and debug approaches. Keysight - achieve your best design.

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12 Tips on How to Select Your Next Oscilloscope - WEBCAST 
In this webcast we will cover 12 topics for you to consider before selecting your next general purpose oscilloscope: from bandwidth, triggering and update rate to serial buses and probing. Providing trade-offs you can make to fit your budget.

Webcast - recorded

 
1500A & 10kV Device Measurement Solutions for Advanced Semiconductor Power Devices 
New Power Device Measurement Solutions (1500 A / 10 kV) for advanced Semiconductor Power Devices.

Webcast

 
1500A & 10kV Device Measurement Solutions for Advanced Semiconductor Power Devices. 
New Power Device Measurement Solutions (1500 A / 10 kV) for advanced Semiconductor Power Devices.

Webcast - recorded

 
1st Edition: Keysight Wireless Labs 2014 
Infrastructure BTS / Small Cells Key-Labs Day The Key Test Challenges for LTE-A R11, 12 and beyond Product Design Life Cycle from R&D to Manufacturing

Seminar

 
1st Edition: Keysight “Wireless Labs” 2014 
Terminal & Chipsets Key-Labs Day The Key Test Challenges for LTE-A R11, 12 and beyond Product Design Life Cycle from R&D to Manufacturing

Seminar

 
1st Keysight mm-wave and THz Users Meeting 
This event will be a forum for users of Keysight mm-wave and THz equipment to present and discuss new applications, measurement results, techniques and ideas, as well as sharing problems and potential areas of collaboration.

Seminar

 
3G Technology Overview 
This 2-day course will introduce engineers to the concepts of third generation cellular technologies.

Classroom Training

 
3GPP LTE Standards Update: Release 11, 12 and Beyond 
Original broadcast October 25, 2012

Webcast - recorded

 
802.11ac WLAN - Channel bandwidth power measurement application using Agilent 8990B PPA 
This web seminar shows you how the Agilent 8990B peak power analyzer can be used for 802.11ac testing WLAN transmitter testing.

Webcast - recorded

 
86100C/83496B and E5052B SSA-J Phase Noise e-Seminar 
You've Measured The Jitter, Now How Do You Reduce It? (1 hour, recorded April 26, 2007)

Seminar Materials 2007-04-26

 
89600 Series Vector Signal Analyzer Basics 
This is a complete course on the theory and operation of the 89600 series Vector Signal Analyzer (VSA), including an understanding of frequency, time, and modulation domain measurements.

Classroom Training

 
89600 Vector Signal Analyzer Course 
This course is recommended to first-time users of the 89600 Vector Signal Analyzer.

Classroom Training

 
8x8 MIMO and Carrier Aggregation Test Challenges for LTE Webcast 
Original broadcast April 25, 2013

Webcast - recorded

 
A Practical Approach to Verifying RFICs with Fast Mismatch Analysis 
Originally broadcast October 28, 2010

Webcast - recorded

 
Accelerate DDR4/LPDDR3 Memory Debug with Bus level Signal Integrity Insight Webcast 
Original broadcast March 4, 2014

Webcast - recorded

 
Accelerate FPGA Debug by Applying Latest Tools and Methods Webcast 
Original broadcast June 10, 2014

Webcast - recorded

 
Accelerating USB 3.0 Product Development 
Super speed USB presents new challenges for designers and developers. Whether you are designing host, hub or device, Electrical or protocol, Agilent offers a complete solution for debug and validate your design.

Webcast - recorded

 
Accurate Mixer Measurements Using Multi-tone X-parameter Models 
IMS 2010 MicroApps presentation by Mihai Marcu and Radoslaw M. Biernacki

Seminar Materials 2010-05-26

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Address the challenges of testing low-voltage ICs 
Address the challenges of testing low-voltage ICs

Webcast - recorded

 
Addressing Measurement Challenges of 160 MHz 802.11ac MIMO 
Original broadcast August 9, 2012

Webcast - recorded

 
Addressing the Challenges of Complex Spectral Environment Simulation with Wideband Precision AWGs 
Original broadcast July 30, 2014

Webcast - recorded

 
ADS Advanced EM in Germany (Münich)  
ADS Advanced EM Germany 2014

Classroom Training

 
ADS Advanced EM in Germany (Münich)  
ADS Advanced EM Germany 2014

Classroom Training

 
ADS AEL and PDK Development Class in Gent (Belgium) 
AEL training event in Gent March 2014

Classroom Training

 
ADS Learning Week in France (Les Ulis) 
ADS Learning Week France 2014

Classroom Training

 

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