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LTE 生產測試設備

在製造環境中,您感受到強烈的市場壓力,特別是您必須成為業界第一個推出新技術的廠商。 比方說,能夠推出最早採用新技術的基地台設備製造商就可以拿到合約,而用戶端產品的新鮮度則只有短短的幾個月時間,因此您必須儘快將產品問世,同時保護您的底線。

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UXM Wireless Test Set Accelerates Marvell's LTE-Advanced Category 7 Chipset Development 
UXM Wireless Test Set Accelerates Marvell's LTE-Advanced Category 7 Chipset Development

新聞資料 2014-08-04

 
Agilent’s EXM Wireless Test Set Ready for Volume Production of LTE-A, 802.11ac WLAN Devices 
Agilent Technologies today announced the E6640A EXM wireless test set, which offers breakthrough manufacturing-test scalability in technology coverage, performance and capacity to test up to 32 cellular and wireless-connectivity devices in parallel.

新聞資料 2014-02-13

 
Greater Insight into LTE Design and Test 
This brochure discusses Keysight's leadership in LTE and presents our set of design and test solutions for LTE - from design simulation to signal generation and analysis through manufacturing and deployment.

型錄 2013-12-31

PDF PDF 2.11 MB
Solutions for LTE-Advanced Manufacturing Test - Application Note 
This “Solutions for LTE-Advanced Manufacturing Test” application note gives insight into how to better understand the requirements for LTE-Advanced Carrier Aggregation manufacturing test.

應用手冊 2013-12-18

E6640A EXM 無線測試儀 - 配置指南 
E6640A EXM 無線測試儀 - 配置指南

配置設定指南 2013-12-09

Agilent Technologies Announces Wireless Communications Test Set with Innovative Multiport Adapter 
Agilent Technologies introduced the E6607B EXT wireless communications test set and companion E6617A multiport adapter. Optimized for non-signaling testing, the EXT/MPA combination increases test throughput and reduces the cost of test in the manufacturing of current- and next-generation smartphones and tablets that contain multiformat and multiband technologies.

新聞資料 2012-08-01

 
EXT Wireless Communications Test Set Non-signaling Test Overview 
This application note explains how non-signaling test methods make it possible for manufacturers to reduce both test times and test equipment costs across a range of wireless technologies

應用手冊 2012-08-01

PDF PDF 290 KB
Greater insight. Greater confidence. Accelerate next-generation wireless - Brochure 
This brochure speaks to Keysight's Cellular from products, to experts to knowledge library and how Keysight gives you greater insight and greater confidence into Cellular.

型錄 2012-05-31

PDF PDF 1.37 MB
Agilent Technologies Announces Test Software for Equipment Based on Altair TDD/FDD LTE Chipset 

新聞資料 2012-02-28

 
Stimulus-Response Testing for LTE Components - Application Note 
This note focuses on the 3GPP LTE specifications that present some new challenges for manufacturers of components and equipment for LTE systems.

應用手冊 2010-05-03

Measuring ACLR Performance in LTE Transmitters - Application Note 
This note focuses on the adjacent channel leakage-power ratio (ACLR) test, a vital one for LTE.

應用手冊 2010-01-07

Solutions for Femtocell Manufacturing Test 
This short application brief discusses how to best accelerate the delivery of quality, low-cost femtocells to market.

應用手冊 2009-05-05