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LTE 生產測試設備

在製造環境中,您感受到強烈的市場壓力,特別是您必須成為業界第一個推出新技術的廠商。 比方說,能夠推出最早採用新技術的基地台設備製造商就可以拿到合約,而用戶端產品的新鮮度則只有短短的幾個月時間,因此您必須儘快將產品問世,同時保護您的底線。

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Solutions for LTE-Advanced Manufacturing Test - Application Note 
This “Solutions for LTE-Advanced Manufacturing Test” application note gives insight into how to better understand the requirements for LTE-Advanced Carrier Aggregation manufacturing test.

應用手冊 2014-08-04

UXM Wireless Test Set Accelerates Marvell's LTE-Advanced Category 7 Chipset Development 
UXM Wireless Test Set Accelerates Marvell's LTE-Advanced Category 7 Chipset Development

新聞資料 2014-08-04

 
E6640A EXM Wireless Test Set Ready for Volume Production of LTE-A, 802.11ac WLAN Devices 
Agilent Technologies today announced the E6640A EXM wireless test set, which offers breakthrough manufacturing-test scalability in technology coverage, performance and capacity to test up to 32 cellular and wireless-connectivity devices in parallel.

新聞資料 2014-02-13

 
Greater Insight into LTE Design and Test 
This brochure discusses Keysight's leadership in LTE and presents our set of design and test solutions for LTE - from design simulation to signal generation and analysis through manufacturing and deployment.

型錄 2013-12-31

PDF PDF 2.11 MB
E6640A EXM 無線測試儀 - 配置指南 
E6640A EXM 無線測試儀 - 配置指南

配置設定指南 2013-12-09

EXT Wireless Communications Test Set Non-signaling Test Overview 
This application note explains how non-signaling test methods make it possible for manufacturers to reduce both test times and test equipment costs across a range of wireless technologies

應用手冊 2012-08-01

PDF PDF 290 KB
Agilent Technologies Announces Wireless Communications Test Set with Innovative Multiport Adapter 
Agilent Technologies introduced the E6607B EXT wireless communications test set and companion E6617A multiport adapter. Optimized for non-signaling testing, the EXT/MPA combination increases test throughput and reduces the cost of test in the manufacturing of current- and next-generation smartphones and tablets that contain multiformat and multiband technologies.

新聞資料 2012-08-01

 
Greater insight. Greater confidence. Accelerate next-generation wireless - Brochure 
This brochure speaks to Keysight's Cellular from products, to experts to knowledge library and how Keysight gives you greater insight and greater confidence into Cellular.

型錄 2012-05-31

PDF PDF 1.37 MB
Agilent Technologies Announces Test Software for Equipment Based on Altair TDD/FDD LTE Chipset 

新聞資料 2012-02-28

 
Stimulus-Response Testing for LTE Components - Application Note 
This note focuses on the 3GPP LTE specifications that present some new challenges for manufacturers of components and equipment for LTE systems.

應用手冊 2010-05-03

Measuring ACLR Performance in LTE Transmitters - Application Note 
This note focuses on the adjacent channel leakage-power ratio (ACLR) test, a vital one for LTE.

應用手冊 2010-01-07

Solutions for Femtocell Manufacturing Test 
This short application brief discusses how to best accelerate the delivery of quality, low-cost femtocells to market.

應用手冊 2009-05-05