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Digital Design & Interconnect Standards

In digital standards, every generational change puts new risks in your path. We see it first hand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of.

Keysight - Insights for your best design

Learn more about Digital Design & Interconnect solutions from Keysight. 
 

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10 Hints for Getting the Most from your Frequency Counter 
Maximize the results you get from your frequency counter through 10 hints from better from understanding the architecture to making faster measurements.

Application Note 2008-04-18

10 Reasons to Upgrade to a 16800 or 16900 Series Logic Analyzer 
10 Reasons to Upgrade to a 16800 or 16900 Series Logic Analyzer

Application Note 2007-12-03

10GBASE-KR/40GBASE-KR4 Interconnect & Tx/Rx Tests - Test Solution Overview Using the ENA Option TDR 
This describes how to make measurements of 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect & Transmitter/Receiver (Tx/Rx) Tests by using the Keysight E5071C ENA Option TDR.

Technical Overview 2014-04-21

PDF PDF 3.54 MB
16900 Series Modular Logic Analyzers Video 
16900 Series Logic Analyzer Video

Demo 2006-11-01

42 Mbps DC-HSDPA Throughput with the 8960 
This video is a demonstration of the new E5515E measuring the maximum 42 Mbps throughput of a DC-HSDPA device in an environment that closely simulates real-world conditions

Demo 2012-03-05

 
6 Hints for Better SATA and SAS Measurements 
These 6 Hints for better SATA and SAS measurements cover Tx, Rx, Impedance and Return Loss, and Host/Device Digital testing challenges.

Application Note 2012-02-02

PDF PDF 1.59 MB
8 Hints for Debugging and Validating High-speed Buses 
8 Hints for Debugging High-speed Buses

Application Note 2002-03-05

PDF PDF 2.24 MB
802.11ac System Design and Verification Using the W1917 SystemVue WLAN library 
Keysight SystemVue and the W1917 WLAN library are used for communications system design and verification of a 5GHz 802.11ac WLAN physical layer.

Demo 2011-11-18

 
81134A Video Demonstration for Windows Media Player 
This version is suitable if you have a low-speed internet connection.

Demo 2004-05-11

WMF WMF 27.64 MB
86100D-9FP PAM-N Analysis Software for 86100D DCA-X Oscilloscopes - Data Sheet 
The 86100D-9FP PAM-N analysis software for 86100D DCA-X Series oscilloscopes helps you quickly and accurately analyze electrical and optical Pulse Amplitude Modulated (PAM) signals.

Data Sheet 2015-01-23

PDF PDF 3.16 MB
A Simple, Powerful Method to Characterize Differential Interconnects 
The Automatic Fixture Removal (AFR) process is a new technique to extract accurate, high bandwidth models of interconnects that is both simple and accurate.

Application Note 2011-06-17

PDF PDF 3.48 MB
A Time-Saving Method for Analyzing Signal Integrity in DDR Memory Buses 
This application note covers new tools and measurement techniques for characterizing and validating signal integrity of DDR (double data rate synchronous dynamic random access memory) signals.

Application Note 2008-09-10

Accurate Calibration of Receiver Stress Test Signals for PCI Express® Rev. 3.0 - Application Note 
This paper describes the calibration of the receiver-stress signal according to the base specification of PCIe3. The calibration of the RX test signal is different from PCIe 2.0.

Application Note 2011-06-22

Acheter le bon équipement. Maintenant. A 0% d’intérêt. 

Brochure 2016-04-18

PDF PDF 278 KB
ADS 2014 Dramatically Improves Design Productivity and Efficiency 
Agilent announces a powerful new version of Advanced Design System software, ADS 2014. Designed to dramatically improve design productivity and efficiency with new technologies and capabilities, ADS 2014 is the software's most significant ADS release to date.

Press Materials 2014-02-20

 
ADS Controlled Impedance Line Designer Solves Key Challenges in Designing Chip-to-Chip Links 
Agilent introduces Agilent EEsof EDA’s Controlled Impedance Line Designer. The software product quickly and accurately optimizes stack up and line geometry for multigigabit-per-second chip-to-chip links, using the most relevant metric.

Press Materials 2014-01-27

 
ADS Videos on YouTube 
Advanced Design System (ADS) Video Library playlist in Keysight EEsof EDA's Channel on YouTube

Demo 2016-01-28

 
ADS W2302EP/ET, W2500EP/ET, and W2312EP/ET Transient Convolution Products 
Advanced Design System W2302EP/ET Transient Convolution Element, W2500EP/ETTransient Convolution GT Option, and W2312EP/ET Transient Convolution Distributed Computing 8-pack

Brochure 2014-12-30

PDF PDF 1.16 MB
Advanced Design System Element Brochures 
ADS 2009 includes a number of powerful simulation elements.

Selection Guide 2009-04-02

 
Advanced Techniques for PCIe 3.0 Receiver Testing-Paper - Application Note 
Advanced Techniques for PCIe 3.0 Receiver Testing-Paper

Application Note 2011-09-01

PDF PDF 2.20 MB
Advanced VNA-Based Test Systems for Analysis of High-Speed Digital Interconnect - Application Note 
Discusses interconnect testing and present solutions based on the latest generation of test software (PLTS2011) for Keysight's line of performance network analyzers (PNAs) focused on Software.

Application Note 2012-01-19

Agilent Introduces Electrical Retimer Solution to Solve Challenges in Designing Chip-to-Chip Links 
Agilent introduces the latest addition to its repeater model library for quickly and accurately solving the challenge posed by signal distortion in the multigigabit-per-second regime.

Press Materials 2013-05-29

 
Agilent Introduces First-to-Market Functional Test Solution for MIPI D-PHY Standard Interconnects 

Press Materials 2011-10-04

 
Agilent Introduces Industry's First Digital Radio Frequency V4 Test Solution with Simultaneous Stimu 
Agilent Technologies Inc. (NYSE: A) today announced the industry's first digital radio frequency (DigRF) V4 test solution with dual-capture capability.

Press Materials 2011-03-02

 
Agilent Launches Industry's First Complete MIPI M-PHY Test Suite  

Press Materials 2011-10-04

 

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