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Infiniium Z-Series Oscilloscopes - Data Sheet 
Keysight's Infiniium Z-Series oscilloscopes feature up to 63 GHz of real-time oscilloscope bandwidth and the industry's leading noise and jitter measurement floors.

產品型錄 2017-06-12

Sierra Circuits Interviews Heidi Barnes at DesignCon 
During DesignCon 2017, Sierra Circuits interviewed Heidi Barnes, Senior Applications Engineer at Keysight Technologies and recipient of the DesignCon Engineer of the Year Award.

基本展示 2017-06-07

 
Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

新聞簡訊 2017-06-02

 
S-parameters: Signal Integrity Analysis in the Blink of an Eye 
This article discusses new concepts for serial link design and analysis as applied to physical layer test and measurement techniques. Novel test fixtures and signal integrity software tools will be discussed in real world applications in the form of design case studies.

專文 2017-05-30

 
The Melting Trace Paradox 
Unlike other famous paradoxes such as the Zeno’s paradox, where Achilles and the Tortoise are involved, the melting trace paradox is one with a segment of copper trace and a current source.

專文 2017-05-24

 
脈衝振幅調變(PAM-4)設計和測試解決方案 
查看 PAM-4 和 PAM-N 模擬、輸出 / 傳輸、互連,及輸入 / 接收設計和測試解決方案範例。

選購指南 2017-05-09

 
N5990A Test Automation Software Platform - Data Sheet 
An efficient test strategy is a proven competitive advantage. Keysight's N5990A Test Automation Software Platform is a key element of winning strategies.

產品型錄 2017-05-04

PDF PDF 5.37 MB
Master 400G - Free Poster on 400 Gb/s Technologies 
This poster gives you a broad overview on all the new evolving standards for your path to 400Gb/s- in core fiber networks and data centers, for electrical and optical interconnects

型錄 2017-05-03

 
Keysight Technologies to Present a Vision for 5G Evolution at WAMICON 2017  
Keysight experts will be at WAMICON 2017, an annual IEEE Wireless and Microwave Conference, to discuss everything from circuit-level modeling to system verification for general RF, microwave, millimeter wave for 4G, emerging 5G communications, and aerospace & defense.

新聞資料 2017-04-10

 
How to Design for Power Integrity: DC-DC Converter Modeling and Simulation 
This video describes how to create an accurate DC-DC Converter measurement based model (MBM) from just a few simple measurements.

使用說明影片 2017-04-07

 
Download the 2017 Lightwave Catalog 
The catalog for high-performance optical T&M solutions provides information on test applications and test equipment for core fiber networks and data centers.

目錄 2017-03-31

 
W1714 SystemVue AMI Modeling Kit, W1713 SystemVue SerDes Model Library  
This datasheet provides an overview of the W1714 SystemVue AMI Modeling Kit, which consists of SerDes libraries for SystemVue plus automatic IBIS AMI model generation.

產品型錄 2017-03-21

Ensuring High Signal Quality in PCIe Gen3 Channels 
This Signal Integrity Journal article written by Keysight engineer, Anil Kumar Pandey includes the challenges of maintaining transmission channel signal quality in today's PCIe Gen3 Channels.

專文 2017-03-14

 
Electronic Components Tolerance and Test Limits for In-Circuit Test - Technical Overview 
In order for all assembled components to function correctly, components are measured and analyzed electrically using the In-circuit tester to ensure its value and performance are optimal.

技術總覽 2017-03-10

PDF PDF 634 KB
Accurate Statistical-Based DDR4 Margin Estimation Using SSN Induced Jitter Model 
This paper proposes a methodology, that improves the accuracy of DDR4 statistical simulation, by using the mask correction factor.

期刊 2017-03-04

 
Method of Implementation (MOI) for USB Type-C Cable/Adapter Assembly High Speed Compliance Test 
Keysight Method of Implementation (MOI) for USB Type-C to Type-C Cable, Type-C to Legacy Cable, Type-C to Legacy Adapter Assembly High Speed Compliance Test Using Keysight M937xA PXIe Multiport VNA

應用手冊 2017-02-24

PDF PDF 4.66 MB
Method of Implementation (MOI) for USB Type-C Cable Assembly Low Speed Compliance Test 
Keysight Method of Implementation (MOI) for USB Type-C to Type-C Cable Assembly Low Speed Compliance Test Using Keysight M937xA PXIe Multiport VNA

應用手冊 2017-02-24

PDF PDF 2.91 MB
Heidi Barnes: DesignCon 2017 Engineer of the Year 
EDN Network's Martin Rowe interviews Heidi Barnes, DesignCon 2017 Engineer of the Year.

專文 2017-02-23

 
Signal and Power Integrity Products & Options Summary  
Signal and Power Integrity Products & Options Summary

選購指南 2017-02-22

 
B4621B Bus Decoder for DDR2, DDR3, or DDR4 Debug and Validation - Data Sheet 
The B4621B protocol-decode software translates acquired signals into easily understood bus transactions showing associated data bursts for double- edge data-rate captures up to 2.5 Gb/s.

產品型錄 2017-02-21

PDF PDF 1.10 MB
Keysight Technologies Announces Heidi Barnes as the 2017 DesignCon Engineer of the Year 
Keysight is proud to announce that Heidi Barnes, a senior applications engineer for Keysight EEsof EDA's high-speed digital applications, was today announced as the 2017 DesignCon Engineer of the Year.

新聞資料 2017-02-02

 
IBIS-AMI Modeling of Asynchronous High Speed Link Systems 
DesignCon 2017 - This paper proposes a modified IBIS-AMI model simulation flow for asynchronous link systems.

應用手冊 2017-01-31

PDF PDF 1.38 MB
Non-Destructive Analysis and EM Model Tuning of PCB Signal Traces using the Beatty Standard 
DesignCon 2017 - This paper shows how, using a simple resonant test structure like the Beatty standard on a PCB, it is possible to verify the as-manufactured parameters and tune the PCB simulation model.

應用手冊 2017-01-31

PDF PDF 6.02 MB
End-to-End System-Level Simulations with Repeaters for PCIe Gen4: A How-To Guide 
DesignCon 2017 - The paper describes how to quickly and effectively evaluate the end-to-end link performance of a PCI-Express Gen-4 link involving a Root Complex, a Repeater, and an End Point.

應用手冊 2017-01-31

PDF PDF 1.51 MB
Signal Integrity Analysis and Compliance Test of PCIe Gen3 Serial Channel with IBIS-AMI 
DesignCon 2017 - In this paper, signal integrity analysis and compliance testing of a complete PCIe Gen3 channel with IBIS-AMI models is presented.

應用手冊 2017-01-31

PDF PDF 1.52 MB

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