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Application Information About Specific Components & Devices

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Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note 
Keysight's InfiniiVision Series oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses.

Application Note 2015-08-01

M9155/6/7C and M9155/6/7CH40 DC to 26.5/40 GHz PXI Hybrid Switch Modules - Flyer 
This 2-page flyer provides a brief overview for the Keysight M9155/6/7C PXI and M9155/6/7CH40 DC to 26.5/40 GHz PXI Hybrid Switch Modules.

Brochure 2015-05-19

PDF PDF 660 KB
Dialog Semiconductor adopts IC-CAP, MBP, MQA, and WaferPro Express software 
Keysight announces that Dialog Semiconductor has adopted the Keysight EEsof EDA IC-CAP, MBP, MQA, and WaferPro Express software to perform foundry technology characterization, model validation, model customization and enhancement.

Press Materials 2015-05-11

 
Testing Automotive Electronic Parking Brake Controls with the TS-8989 - Application Note 
This application note discusses the configuration of a typical Keysight TS-8989 PXI Functional Test System for testing automotive electronic parking brake controls.

Application Note 2015-05-11

PDF PDF 772 KB
How to Design an RF Power Amplifier: Class J 
This short video will provide an introduction to Class J Power Amplifiers and demonstrate a superior, time saving methodology to design and practically realize a Class J RF power amplifier. First,a theoretical approach will be used to design an ideal circuit from first principles and then circuit design tools will be utilized to synthesize a more realistic circuit topology from the ideal case. The design process will be illustrated using a commercially available GaN MMIC device from Qorvo.

How-To Video 2015-05-07

 
Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2015-05-05

 
Network Analyzer - Selection Guide 
Provides an overview of Keysight’s network analyzer families, recommended solutions for various applications, related network analyzer products, and a comparison of specifications and features.

Selection Guide 2015-05-05

Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note 
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

Application Note 2015-05-01

PDF PDF 2.46 MB
Keysight Technologies Unveils WaferPro Express 2015 Platform for Wafer-Level Device Characterization 
Keysight announces WaferPro Express 2015, a measurement software platform for the automated characterization of wafer-level devices and circuit components.

Press Materials 2015-04-28

 
Measuring Dielectric Properties using Keysight's Materials Measurement Solutions - Brochure 
Quick guide for Keysight materials measurement solutions that can characterize the material under test by measuring dielectric properties such as permittivity and permeability.

Brochure 2015-04-27

PDF PDF 1.66 MB
Keysight EEsof EDA "How To Design Power Amplifier" Videos 
A collection of "How to Design Power Amplifier" Videos from Keysight EEsof EDA.

How-To Video 2015-04-22

 
Advanced Low-Frequency Noise Analyzer Overview 
This video will provide a brief overview of Keysight E4727A Advanced Low-Frequency Noise Analyzer (ALFNA), the next-generation system for measurement of 1/f noise and random telegraph noise. It will describe ALFNA’s innovative modular design and its technical advantages. It will also touch on wide-range applications and how they are enabled by ALFNA’s industry-leading technical specifications and rich feature set.

Product Tour 2015-04-21

 
Keysight Technologies to Showcase Semiconductor Parametric, Modeling Solutions at IRPS 2015 
Keysight announces it will demonstrate some of its many semiconductor parametric and modeling solutions at the 53rd International Reliability Physics Symposium (IRPS), Hyatt Regency Monterey Resort, Booth 203/205, Monterey, Calif., April 19-23.

Press Materials 2015-04-16

 
PXIe Vector Network Analyzer M937xA - Product Fact Sheet 
This two page flyer highlights the features and benefits of the Keysight PXI vector network analyzer which is a full two-port VNA that fits in just one slot.

Brochure 2015-03-29

PDF PDF 271 KB
Characterization of PCB Insertion Loss with a New Calibration Method - Application Note 
In this application note a new method for characterizing PCB loss by using AFR with 1X Open fixtures is proposed.

Application Note 2015-03-26

PDF PDF 700 KB
E5080A ENA Series Network Analyzer - Configuration Guide 
This configuration guide describes standard configurations, options, accessories and peripherals for the E5080A network analyzers.

Configuration Guide 2015-03-25

PDF PDF 879 KB
Automated X-Ray Inspection System Keysight Technologies - Technical Overview 
This is a technical datasheet. Keysight has developed a sealed ultra-high vacumn X-ray tube that provides stable output throughout a significantly long life.

Application Note 2015-03-24

PDF PDF 644 KB
Keysight WaferPro Express 
The Keysight WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.

Product Tour 2015-03-24

 
WaferPro Express Software 
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

Brochure 2015-03-15

PDF PDF 1.49 MB
Challenges and Solutions for Power Testing in Automotive Applications - Technical Overview 
This technical overview provides a synopsis of automotive electronic systems, the challenges they face and what tools automotive electronics engineers need to meet them. It concludes with a discussion of Keysight’s solutions to these challenges.

Technical Overview 2015-03-12

PDF PDF 1.18 MB
How to Design an RF Power Amplifier: Class E 
This video provides an introduction to Class E Power Amplifiers and demonstrates a superior, time saving methodology to design and practically realize a Class E RF power amplifier using first principles to build an ideal circuit and then utilizing circuit design tools to synthesize a more realistic circuit topology from the ideal case.

How-To Video 2015-03-11

 
Introducing Keysight E5080A ENA Vector Network Analyzer - Demo 
This video introduces the Keysight E5080A ENA vector network analyzer, which has the new touch-based GUI and offers the industry’s best combination of RF measurement performance and speed.

Demo 2015-02-12

MP4 MP4 49.80 MB
i3070 High Node Count Test Solution - Technical Overview 
Keysight's high node count test solution allows any Keysight 3070/i3070 Series 3 or Series 5 four-module test system to be easily upgraded into an ultra-high pin count test system

Technical Overview 2015-02-12

PDF PDF 645 KB
The World’s Highest Pin Count In-Circuit Test Solutions - Brochure 
Keysight's new i3070 and 3070 in-circuit test (ICT) high node count test solution is the world’s highest pin count ICT system, bringing an unprecedented level of performance and portability to users.

Brochure 2015-02-12

PDF PDF 212 KB
Improving Speed and Accuracy in the Testing of BTS Filters and Duplexers - Application Brief 
This application brief explains why the E5080A ENA Series Network Analyzer is the ideal solution for BTS filters and duplexers manufacturing test.

Application Note 2015-02-11

PDF PDF 597 KB

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