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Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

内部通讯 2014-10-14

 
Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note 
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

应用说明 2014-10-11

PDF PDF 731 KB
CAN Triggering and Decode Demo Video 
Using the DSOX AUTO options for InfiniiVision X-Series oscilloscopes

基本演示 2014-09-19

LIN Triggering and Decode Demo Video 
Using the DSOX AUTO option for InfiniiVision X-Series oscilloscopes

基本演示 2014-09-18

PXI Vector Network Analyzer - Configuration Guide 
This configuration guide describes standard configurations, options, accessories, upgrade kits and compatible peripherals for the M937XA PXIe vector network analyzer (PXI VNA).

配置指南 2014-09-10

PDF PDF 3.79 MB
Keysight Technologies Introduces Design and Test Solutions at European Microwave Week 
Keysight announces that it will demonstrate a wide range of new, high-performance flexible test solutions at the European Microwave Week 2014, Oct. 7–9, Rome, Fiera di Roma, Booth F100. The test solutions are used by engineers for designing and testing components for radar systems, antennas and next-generation wireless devices.

新闻资料 2014-09-03

 
GoldenGate RFIC Solutions 
This brochure highlights the benefits of the GoldenGate RFIC Simulator.GoldenGate is the most trusted simulation, analysis and verification solution available for integrated RF circuit design within Cadence Virtuoso.

手册 2014-09-03

PDF PDF 954 KB
使用 i1000D SFP 在线测试系统 测试汽车保险丝盒 
使用 i1000D SFP 在线测试系统 测试汽车保险丝盒

应用说明 2014-08-06

Antenna Measurements for mm-wave Devices – MVG-Orbit/FR 
Antenna Measurements for mm-wave Devices from MCG-Orbit/FR and Keysight.

Solution Brief 2014-08-04

 
WaferPro Express Software - Brochure 
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

手册 2014-08-04

PDF PDF 810 KB
Wafer-level Measurement Solutions – Cascade Microtech 
Accurate and Repeatable Wafer-level Measurements from Cascade Microtech and Keysight.

Solution Brief 2014-08-04

 
Keysight EEsof EDA Customer Support - Brochure 
Whether you are a novice or an experienced user, Keysight EEsof EDA’s customer support offerings are designed to help you every step of the way.

手册 2014-08-03

PDF PDF 175 KB
Keysight EEsof EDA Software and Modular Solutions for Universities 
Keysight works in collaboration with universities to provide tools that enable education and research for the engineers of tomorrow. The brochure outlines available programs, software and hardware.

手册 2014-08-03

PDF PDF 1.44 MB
EDA Support Services - Flyer 
Keysight Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.

手册 2014-08-03

PDF PDF 454 KB
Modifying DDR Libraries for Silicon Nail Test Generation on the Keysight x1149 Boundary Scan Analyzer 
This application note describes how to modify DDR libraries to generate silicon nails tests on the Keysight x1149 Boundary Scan Analyzer.

应用说明 2014-08-03

PDF PDF 1.57 MB
RF and Microwave Industry-Ready Student Certification Program - Brochure 
This program confirms a student’s technical knowledge, design expertise, and hands-on measurement proficiency in the use of Keysight EEsof software design tools and Keysight instruments.

手册 2014-08-03

PDF PDF 562 KB
CAN, LIN and FlexRay Protocol Triggering and Decode for Infiniium 90000 Series - Data Sheet 
Keysight Technologies oscilloscope automotive options help electronic system designers test and debug the physical layer of automotive serial buses faster.

产品资料 2014-08-03

Releasing the “Test Sequence” and “Test” to Production on the Keysight x1149 Boundary Scan Analyzer 
This application note describes how to release test sequences and tests to production when using the Keysight x1149 Boundary Scan Analyzer.

应用说明 2014-08-03

PDF PDF 5.52 MB
IC-CAP Device Modeling Software - Technical Overview 
This Technical Overview presents Keysight Technologies IC-CAP Device Modeling Software Release 2006. The IC-CAP software automates the process of accurate device characterization for today's RFIC designer.

技术总览 2014-08-02

Simulating Envelope Tracking with Advanced Design System Software - Application Note 
This example applies envelope tracking to an example amplifier to show techniques of using Advanced Design System (ADS) for this type of design.

应用说明 2014-08-02

PDF PDF 2.38 MB
Helping you focus where it counts in aerospace and defense - Brochure 
This brochure covers the latest A/D test resources focused on Radar, EW, Satellite, MicComm and SDR.

手册 2014-08-01

PDF PDF 8.68 MB
Keysight Technologies: Powering the Solar Revolution - Brochure 
This brochures presents Keysight's solutions for testing solar cells, panels, modules and inverters.

手册 2014-07-31

PDF PDF 584 KB
Solutions For Wireless Handset Battery Drain Characterization 
This brochure describes the use of wireless handset battery drain characterization to maximize battery operating time without jeopardizing your schedule.

手册 2014-07-31

PDF PDF 4.74 MB
Time Domain Reflectometry Theory - Application Note 
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

应用说明 2014-07-31

Characterizing the I-V Curve of Solar Cells and Modules 
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

应用说明 2014-07-31

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