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CAN Triggering and Decode Demo Video 
Using the DSOX AUTO options for InfiniiVision X-Series oscilloscopes

基本演示 2014-09-19

LIN Triggering and Decode Demo Video 
Using the DSOX AUTO option for InfiniiVision X-Series oscilloscopes

基本演示 2014-09-18

Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

内部通讯 2014-09-09

 
GoldenGate RFIC Solutions 
This brochure highlights the benefits of the GoldenGate RFIC Simulator.GoldenGate is the most trusted simulation, analysis and verification solution available for integrated RF circuit design within Cadence Virtuoso.

手册 2014-09-03

PDF PDF 954 KB
Keysight Technologies Introduces Design and Test Solutions at European Microwave Week 
Keysight announces that it will demonstrate a wide range of new, high-performance flexible test solutions at the European Microwave Week 2014, Oct. 7–9, Rome, Fiera di Roma, Booth F100. The test solutions are used by engineers for designing and testing components for radar systems, antennas and next-generation wireless devices.

新闻资料 2014-09-03

 
使用 i1000D SFP 在线测试系统 测试汽车保险丝盒 
使用 i1000D SFP 在线测试系统 测试汽车保险丝盒

应用说明 2014-08-06

Wafer-level Measurement Solutions – Cascade Microtech 
Accurate and Repeatable Wafer-level Measurements from Cascade Microtech and Keysight.

Solution Brief 2014-08-04

 
Antenna Measurements for mm-wave Devices – MVG-Orbit/FR 
Antenna Measurements for mm-wave Devices from MCG-Orbit/FR and Keysight.

Solution Brief 2014-08-04

 
WaferPro Express Software - Brochure 
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

手册 2014-08-04

PDF PDF 57 KB
CAN, LIN and FlexRay Protocol Triggering and Decode for Infiniium 90000 Series - Data Sheet 
Keysight Technologies oscilloscope automotive options help electronic system designers test and debug the physical layer of automotive serial buses faster.

产品资料 2014-08-03

EDA Support Services 
Keysight Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.

手册 2014-08-03

PDF PDF 465 KB
Modifying DDR Libraries for Silicon Nail Test Generation on the Keysight x1149 Boundary Scan Analyzer 
This application note describes how to modify DDR libraries to generate silicon nails tests on the Keysight x1149 Boundary Scan Analyzer.

应用说明 2014-08-03

PDF PDF 1.57 MB
Releasing the “Test Sequence” and “Test” to Production on the Keysight x1149 Boundary Scan Analyzer 
This application note describes how to release test sequences and tests to production when using the Keysight x1149 Boundary Scan Analyzer.

应用说明 2014-08-03

PDF PDF 5.52 MB
Keysight EEsof EDA Software and Modular Solutions for Universities 
Keysight works in collaboration with universities to provide tools that enable education and research for the engineers of tomorrow. The brochure outlines available programs, software and hardware.

手册 2014-08-03

PDF PDF 1.44 MB
RF and Microwave Industry-Ready Student Certification Program 
This program confirms a student’s technical knowledge, design expertise, and hands-on measurement proficiency in the use of Keysight EEsof EDA software design tools and Keysight instruments.

手册 2014-08-03

PDF PDF 576 KB
IC-CAP Device Modeling Software 
Technical overview of Keysight's Integrated Circuit Characterization and Analysis Program (IC-CAP), complete and accurate parameter extraction for semiconductor device modeling

技术总览 2014-08-02

Simulating Envelope Tracking with Advanced Design System 
This example applies envelope tracking to an example amplifier to show techniques of using Advanced Design System (ADS) for this type of design.

应用说明 2014-08-02

PDF PDF 2.44 MB
Time Domain Reflectometry Theory - Application Note 
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

应用说明 2014-07-31

Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief 
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

应用说明 2014-06-24

Model Quality Assurance (MQA) 
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

手册 2014-06-18

PDF PDF 1.08 MB
Advanced Modeling Solutions for Nanoscale 3D FinFETs and High-Frequency/High-Power GaN HEMTs 
Agilent announces several innovations for the 2014 release of its industry-leading suite of device modeling and characterization software tools. The suite is comprised of IC-CAP, MBP, and MQA.

新闻资料 2014-06-18

 
Model Builder Program (MBP) 
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

手册 2014-06-18

PDF PDF 1.47 MB
Agilent Technologies and Cascade Microtech Announce Alliance to Streamline Wafer-Level Measurements 
Agilent Technologies and Cascade Microtech announce a strategic alliance to provide fully configured and validated RF measurement solutions that streamline wafer-level semiconductor measurements while delivering guaranteed configuration, installation and support.

新闻资料 2014-06-03

 
Genesys 2014 Delivers Breakthrough Modulated RF Analysis for Circuit, System Design 
Keysight announces the latest release of Genesys 2014.

新闻资料 2014-05-27

 
Offline vs Inline: Shifting to automated inline ICT - White Paper  
This paper discusses the benefits of adopting an inline in-circuit test strategy for electronics manufacturers looking to increase product quality and reliability while ensuring optimal ROIC.

应用说明 2014-05-14

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