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PCI Express® (PCIe) Design & Test

Peripheral Component Interconnect Express, officially abbreviated as PCIe® or PCI Express®, is a computer expansion bus standard designed to replace the older bus standards such as PCI. 

PCIe 2.0 doubles the transfer rate of PCIe 1.0 to 5 GT/s and the per-lane throughput rises from 250 MB/s to 500 MB/s.

PCIe 3.0 has a 8 GT/s bit rate which is backward compatible with PCIe 2.0 and effectively delivers double the PCIe 2.0 bandwidth. 

PCIe 4.0 at 16 GT/s doubles data rates again, requiring extensive testing and validation to enable speed, while maintaining backward compatibility with earlier generations.

Regardless of the generation of PCIe design you are testing or the PCI Express design challenges you are facing, Keysight offers a complete solution set from design to test. Work with Keysight and gain insights for you best PCIe design.

See measurement solution examples to discover specific solutions for your PCIe needs

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Keysight Test-Drive 2016 
Various dates and locations in 2016

Seminar

 
Thunderbolt over Type-C – Overcoming Test Challenges Seminar 
Santa Clara, CA; June 7, 2016

Seminar

 
Identify and Eliminate Crosstalk from Your Designs Using Oscilloscopes Webcast 
Original broadcast April 20, 2016

Webcast - recorded

 
High Speed Digital Seminar Tour 2016 
Various dates and locations in 2016

Seminar

 
DisplayPort 1.3 over Type-C: Taming the Gotchas!  
Live broadcast May 3, 2016; 10am PT / 1pm ET

Webcast

 
PAM-4 Designs – Advanced Characterization and Debug Solutions Webcast 
Live broadcast May 18, 2016; 10am PT / 1pm ET

Webcast

 
USB-PD (Power Delivery) Testing over Type-C (USB-C) Seminar 
Santa Clara, CA - May 16, 2016

Seminar

 
Power Integrity Measurements Webcast – Choosing the Right Tools 
Original broadcast January 6, 2016

Webcast - recorded

 
Oscilloscope Test Automation Tools – Remote Programming and BenchVue Test Flow Webcast 
Original broadcast February 23, 2016

Webcast - recorded

 
Thunderbolt over Type-C – Overcoming Test Challenges Webcast 
Original broadcast February 24, 2016

Webcast - recorded

 
The Type-C Revolution Demands Design and Test Innovations Webcast 
Original broadcast February 25, 2016

Webcast - recorded

 
USB Type-C Connector Webcast: A Validation Engineer's Dream! 
Original broadcast February 17, 2016

Webcast - recorded

 
USB 3.1 Receiver Testing including devices using Type-C Webcast 
Original broadcast February 3, 2016

Webcast - recorded

 
What’s That You Were Asking About Oscilloscope Probes? 
Original broadcast February 10, 2016

Webcast - recorded

 
Supporting PAM-4 Optical Link Development Webcast 
Original broadcast December 10, 2015

Webcast - recorded

 
Digital & Photonics - Webcast Library 
Live and on-demand webcasts

Webcast

 
Testing USB 3.1 Type-C and Understanding the Type-C Test Environment Webcast 
Original broadcast December 3, 2015

Webcast - recorded

 
Transistor Measurement and Modeling Challenges Seminar 
Various dates and locations

Seminar

 
MIPI M-PHY, D-PHY and C-PHY Receiver Testing – Today and Tomorrow 
Original broadcast October 21, 2014

Webcast - recorded

 
Introducing Keysight’s New AWG for Optical and High Speed Digital Test Webcast 
Original broadcast October 8, 2015

Webcast - recorded

 
Fundamentals of PCIe® 3.0 EQ Test and Outlook on PCIe 16GT/s RX Test Webcast 
Original broadcast September 30, 2015

Webcast - recorded

 
Achieving Success at 16 Gigabit Operation with PCI Express® 4.0 Webcast 
Orignal broadcast September 10, 2015; 10am PT / 1pm ET

Webcast - recorded

 
PCIe - Assuring Gen4 Tx/Rx Performance with Hot TDR Webcast 
Original broadcast September 9, 2015

Webcast - recorded

 
DesignCon 2015 
Download Keysight's papers from Technical Conference; Jan 27-29, 2015; Santa Clara Convention Center

Tradeshow

 
MIPI – Overcome Test Challenges to Ensure Interoperability for your PHY Webcast 
Original broadcast June 23, 2015

Webcast - recorded

 

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