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DDR, DDR2, DDR3, DDR4 Memory Design & Test

Double Data Rate (DDR) Synchronous Dynamic Random Access Memory (SDRAM) is implemented in several forms today:

Keysight’s solutions for DDR memory applications are driven and supported by Keysight experts that are active in the Joint Electronic Devices Engineering Council (JEDEC). Our involvement in standards groups and their related workshops, and specification development enables Keysight to bring the right solutions to the market when our customers need them.

Regardless of the DDR generation design challenges you are facing, Keysight offers a complete solution set from electrical to protocol. Work with Keysight and gain insights for your best design.

Keysight RF and Digital Learning Center - A commitment to learning with industry experts

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DesignCon 2017 
February 1-2, 2017; Santa Clara Convention Center, CA

Tradeshow

 
Overcoming 400G Test Challenges using PAM-4 Webcast 
Live broadcast December 13, 2016; 10am PT / 1pm ET

Webcast

 
Fundamentals of Arbitrary Waveform Generation Webcast 
Original broadcast January 27, 2016

Webcast - recorded

 
Digital & Photonics - Webcast Library 
Live and on-demand webcasts

Webcast

 
DisplayPort 1.3 over Type-C: Taming the Gotchas!  
Original broadcast May 3, 2016

Webcast - recorded

 
Identify and Eliminate Crosstalk from Your Designs Using Oscilloscopes Webcast 
Original broadcast April 20, 2016

Webcast - recorded

 
The Type-C Revolution Demands Design and Test Innovations Webcast 
Original broadcast February 25, 2016

Webcast - recorded

 
USB Type-C Connector Webcast: A Validation Engineer's Dream! 
Original broadcast February 17, 2016

Webcast - recorded

 
Use a Logic Analyzer to Troubleshoot and Validate Digital Designs Webcast 
Live broadcast March 2, 2016; 10am PT / 1pm ET

Webcast

 
Introducing the New Infiniium V-Series High-Performance Oscilloscope Webcast 
Original broadcast April 14, 2015

Webcast - recorded

 
Next generation BERT Ensures Signal Integrity in High-speed Digital Designs Webcast 
Original broadcast January 21, 2014

Webcast - recorded

 
Boundary Scan Webcast Series 
Live and on-demand webcasts

Webcast

 
Best practices in implementing boundary scan on limited access boards 
Original broadcast December 18, 2014

Webcast - recorded

 
Testing limited access SSD boards with boundary scan and external instruments webcast 
Original broadcast December 4, 2014

Webcast - recorded

 
Embedded testing of Intel Haswell and Broadwell chipsets on limited access client boards webcast 
Original broadcast November 13, 2014

Webcast - recorded

 
Testing DDR on limited access boards using boundary scan silicon nails 
Original broadcast October 30, 2014

Webcast - recorded

 
Maximizing test coverage of multiple limited access boards by linking multiple boundary scan chains 
Original broadcast October 9, 2014

Webcast - recorded

 
Extending boundary scan tests to improve test coverage of limited access boards webcast 
Original broadcast September 25, 2014

Webcast - recorded

 
Introduction to the Keysight x1149 Boundary Scan Analyzer Webcast 
Original broadcast August 26, 2014; 9am PT / 12pm ET

Webcast - recorded

 
Common DFT guidelines for implementing boundary scan on limited access boards webcast 
Original broadcast September 11, 2014

Webcast - recorded