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RF & Microwave

For most of your RF & Microwave measurement needs, you can find application & solution information here.

Be sure to check the library of application notes for detailed information on using your equipment and successfully completing the measurements you need.

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2015 Keysight EEsof EDA Training Course Calendar 
Scheduled Keysight EEsof courses for the United States and Canada

Formation en classe

 
A Practical Approach to Verifying RFICs with Fast Mismatch Analysis 
Originally broadcast October 28, 2010

Webcast - enregistré

 
Characterizing phase-locked-loop signal transition behaviors such as microphonic/phase-hits 

Présentation de séminaire 2008-10-10

PDF PDF 1.26 MB
Genesys Webcasts - "How-To-Design" series  
Originally broadcast in 2009. Access the 6 WebEX recordings

Webcast - enregistré

 
Keysight EEsof EDA Customer Education and Services 
Brief overview of Keysight EEsof EDA Customer Education and Services.

Matériel de formation 2010-08-11

 
Making Early Design Tradeoffs using Advanced Measurement Based Behavioral Models 
This Presentation (Connecting Design and Test Seminar, paper #2) decribes early design tradeoffs using advanced measurement based behavioral models in detail.

Présentation de séminaire 2003-05-29

PDF PDF 2.22 MB
Oscilloscope Measurements Webcast Series 
Live and on-demand broadcasts that will teach you how to make precise measurements with its Infiniium line of real-time and sampling oscilloscopes.

Webcast

 
PCI Express 3.0 Compliance - Successfully Navigating the Standard Webcast 
Original broadcast May 7, 2013

Webcast - enregistré

 
Presentation on ADS for Wireline and High Speed Analog Design 
A detailed Presentation (presented on 21 May 2002) on using Advanced Design System for Wireline and High Speed Analog Design.

Présentation de séminaire 2002-05-21

PDF PDF 4.75 MB
Presentation on Simulating Phase Locked Loops using ADS 
This Presentation details PLL simulation using ADS, Envelope simulation, PLL component behavioral modeling, Phase noise, Spurs, Fractional N-simulation and Divide ratio using sigma delta modulator.

Présentation de séminaire 2010-08-19

PDF PDF 1 MB
Presentation on Trends in Signal Integrity Tests 
A joint Presentation presented by Michael Reser and Rainer Plitschka (Agilent Technologies) on parametric tests for high-speed serial technologies focusing on latest trends in Signal Integrity tests.

Matériel de formation 2006-09-01

PDF PDF 2.13 MB
SSA presentation material – customer viewable slides with speaker notes 

Présentation de séminaire 2008-10-10

PDF PDF 1.01 MB
Successful Modulation Analysis in 3 Steps Webcast 
Original broadcast January 22, 2014

Webcast - enregistré

 
Understanding Jitter and Wander Measurements and Standards, Second Edition 

Matériel de formation 2003-02-01

PDF PDF 6.18 MB