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Education Corner - For Researchers and Educators

When classmates or colleagues work together, they can change the world. That’s our legacy, and it drives our vision: Keysight is dedicated to meaningful collaboration with researchers and educators. In the research lab, our history of innovation continues to enable new breakthroughs in science and technology. In classrooms and teaching labs, our instruments and software offer students experience with the same tools used by our customers in government and industry. When you connect with Keysight, we can help you shine in the lab and the classroom.

Faculty Spotlight highlights innovative university faculty programs’ collaboration with Keysight in their classroom and research. See the latest from Villanova University where Dr. Gang Feng and his students are studying how nanomaterials and their composites can help detect concussions.

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N9041B UXA X-Series Signal Analyzer, Multi-Touch - Application Brief 
This application brief explains the complexity of testing in millimeter wave and how the UXA meets those challenges.

Application Note 2017-04-17

PDF PDF 1.72 MB
Making Conducted and Radiated Emissions Measurements - Application Note 
This application note provides an overview of radiated and conducted emissions measurements as well as a methodology for EMI precompliance testing.

Application Note 2017-04-10

EMI Troubleshooting: The Need for Close Field Probes - Application Note 
This application note introduces close field probes and explains how specific probes offer distinct advantages in electromagnetic compatibility (EMC) radiated emission pre-compliance test.

Application Note 2017-04-03

Understanding the Differences Between Oscilloscopes and Digitizers for Wideband Signal Acquisitions  
This white paper compares the use of oscilloscopes and wideband digitizers for wideband signal applications.

Application Note 2017-03-30

PDF PDF 6.16 MB
System Cabling Errors and DC Voltage Measurement Errors in Digital Multimeters (AN 1389-1) 
This application note is one in a series of three, that will help you eliminate potential measurement errors and achieve the greatest accuracy with a DMM. This application note covers system cabling errors and dc voltage measurement errors and more.

Application Note 2017-03-14

Photodiode Test Using the Keysight B2980A Series - Application Note 
This application note explains how easy and accurately it is to make a photodiode test using the B2980A Series.

Application Note 2017-03-09

Resistance; DC Current; AC Current; and Frequency and Period Measurement Errors in DMMs 
This application note is the second in a series of three, that will help you eliminate potential measurement errors and achieve the greatest accuracy with a DMM. This application note covers resistance, dc current, ac current, and frequency and period measurement errors. . For an overview of system cabling errors and dc voltage measurement errors, see Application Note 1389-1. For a discussion of ac voltage measurement errors, see Application Note 1389-3.

Application Note 2017-03-09

Basics of Measuring the Dielectric Properties of Materials - Application Note 
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.

Application Note 2017-03-07

Precise Current Measurements of MCU Power-Saving Mode Transition using the CX3300 
The CX3300 enables you to easily and accurately visualize wide-band and low-level current waveforms of the MCU power-saving mode transition.

Application Note 2017-03-03

Precise Current Profile Measurements of Bluetooth® Low Energy Devices using the CX3300  
The CX3300 enables you to precisely visualize wide-band and low-level current waveforms and make quantitative evaluations of current waveforms, while reducing the power consumption of BLE devices.

Application Note 2017-03-03

The CX3300 Unveils Current Waveform Never Seen by Conventional Current Probes - Application Brief 
This application describes that the CX3300A can more clearly and precisely visualize current waveform measurements in comparison with a current probe.

Application Note 2017-03-03

Accurate Current Waveform Measurements of Non Volatile Memory Devices using the CX3300 
This application describes CX3300 enabling you to easily and accurately visualize never before seen true transient current waveform of NVM materials and devices.

Application Note 2017-03-03

Method of Implementation (MOI) for USB Type-C Cable Assembly Low Speed Compliance Test 
Keysight Method of Implementation (MOI) for USB Type-C to Type-C Cable Assembly Low Speed Compliance Test Using Keysight M937xA PXIe Multiport VNA

Application Note 2017-02-24

PDF PDF 2.91 MB
Method of Implementation (MOI) for USB Type-C Cable/Adapter Assembly High Speed Compliance Test 
Keysight Method of Implementation (MOI) for USB Type-C to Type-C Cable, Type-C to Legacy Cable, Type-C to Legacy Adapter Assembly High Speed Compliance Test Using Keysight M937xA PXIe Multiport VNA

Application Note 2017-02-24

PDF PDF 4.66 MB
7 Hints for Precise Current Measurements with the CX3300 Series Device Current Waveform Analyzer 
This application note explains 7 hints that can be undertaken in order to obtain more favorable current measurement with the CX3300.

Application Note 2017-02-21

Signal Analysis Measurement Fundamentals, Optimize Noise Floor, Resolution Bandwidth, and More 
Learn measurement fundamentals to optimize your signal analysis for greater insights

Application Note 2017-02-13

Electrochemistry 3-Electrode Measurement Workflows for Li-ion Cells and Sensors Using the B2900 SMU 
This application note shows the B2900A is well suited for electrochemical measurements with its capability to source and measure both voltage and current very accurately at 10 fA and 100 nV resolution.

Application Note 2017-02-08

Automotive Serial Bus Testing - Application Note 
This application note will show examples of characterizing the performance of various automotive serial buses using Keysight oscilloscopes and provide a summary of recommended probing solutions.

Application Note 2017-01-26

Evaluating Oscilloscope Fundamentals - Application Note 
We will discuss oscilloscope applications and give you an overview of basic measurements and performance characteristics.

Application Note 2017-01-20

Accelerating Spurious Emission Measurements Using Fast-Sweep Techniques - Application Note 
Searching for spurious emissions can be especially difficult and time-consuming. Learn about techniques you can use to optimize and speed your measurements.

Application Note 2017-01-20

Oscilloscope Waveform Update Rate Determines Ability to Capture Elusive Events - Application Note 
See how you can increase your odds of finding infrequent glitches with a high oscilloscope update rate.

Application Note 2017-01-17

Using real-time spectrum analysis to efficiently troubleshoot interference issues -Application Note  
This article describes real-time spectrum analysis (RTSA) as an optional capability for FieldFox handheld RF/uW analyzers, making them especially effective for interference and signal monitoring.

Application Note 2017-01-16

PDF PDF 7.51 MB
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity - Application Note 
Make the most accurate digital measurements by learning how to evaluate oscilloscope sample rates vs. signal fidelity.

Application Note 2017-01-11

Using Oscilloscope Segmented Memory for Serial Bus Applications - Application Note 
Learn how to use an oscilloscope's segmented memory to capture a longer time span and more serial packets while still digitizing at a high sample rate.

Application Note 2017-01-10

Oscilloscope Display Quality Impacts Ability to View Subtle Signal Details - Application Note 
The quality of your oscilloscope’s display can make a big difference in your ability to troubleshoot your designs effectively.

Application Note 2017-01-10

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