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X-Parameters

NVNA Nonlinear Measurements and ADS Simulation and DesignKeysight's X-parameters* functionality can help you overcome a key challenge in RF engineering, namely that of nonlinear impedance differences, harmonic mixing, and nonlinear reflection effects that occur when components are cascaded under large signal operating conditions. X-parameters help solve this complex cascading problem: if you measure the X-parameters of a set of components individually, you can calculate the X-parameters and hence the nonlinear transfer function of any cascade made from them. Calculations based on X-parameters are usually performed within a harmonic balance simulator environment.

Use the tabs below to locate technical resources on the development and use of X-parameters, as well as information on Related Products and Solution Partners.

See Measurement Solution Example: X-Parameter Measurements

X-parameters" is a trademark of Keysight Technologies, Inc. The X-parameters format and underlying equations are open and documented. For more information on the use of this trademark, refer to X-parameters Open Documentation, Trademark Usage & Partnerships.

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Keysight eventos en España 
Bienvenido a la página de eventos organizados por Keysight en España.

Seminar

 
Designing Custom RF and Analog Filters through Direct Synthesis Webcast 
Original broadcast August 1, 2013

Webcast - recorded

 
Discrete Oscillator Design Tools and Techniques Webcast 
Original broadcast Sept. 16, 2010

Webcast - recorded

 
Electronic Measurement Events in Europe, Middle East & Africa 
Electronic Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.

Seminar

 
Keysight EEsof EDA Customer Education and Services 
Brief overview of Keysight EEsof EDA Customer Education and Services.

Training Materials 2010-08-11

 
Power Amplifier Design with X-Parameter* Power Transistor Models  
Original broadcast September 6, 2012

Webcast - recorded

 
RF System Design, Prototype & Production With X-Parameters in One Pass 
Live broadcast December 4, 2014; 10am PT/1pm ET

Webcast

 
Tolerance Analysis for Planar Microwave Circuits Webcast 
Original broadcast December 3, 2013

Webcast - recorded