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Series II Compliance with the Machinery Directive (in Europe) - specific installation procedures 
Series II will meet requirements of Machinery Directive in European Community member countries, if the following steps, which are described in the document, are taken during installation of equipment.

어플리케이션 노트 2001-05-17

 
Reducing Process Defect Escapes with Vectorless Test 
Process defects that escape in-circuit test lead at best to increased repair costs, and at worst to a "bone pile1" problem.

어플리케이션 노트 2001-05-17

PDF PDF 512 KB
Running Rocky Mountain Basic from Board Test Basic 
Many of you have existing programs written in Rocky Mountain Basic (RM-Basic), or have found the RM-Basic program examples given in Keysight manuals, and wish to use them to do external instrumentation control using the Keysight 3070 Board Test Family.

어플리케이션 노트 2001-05-17

PDF PDF 23 KB
A Quality Test Demands A Quality Fixture 
A Check List for getting a quality board test fixture first time, every time.

어플리케이션 노트 2001-05-16

PDF PDF 26 KB
8757 Amplifier Measurements (345-1) 
This Application Note describes Microwave Component Measurements: Amplifier Measurements Using the Scalar Network Analyzer.

어플리케이션 노트 2001-05-15

PDF PDF 1.13 MB
Electrical In-circuit Test Methods for Limited-access Boards 
This paper surveys the various electrical test methods and tools available to address testing boards that lack full electrical access.

어플리케이션 노트 2001-02-27

PDF PDF 47 KB
Improved Fault Coverage in a Combined X-ray and In-Circuit Test Environment 
Cutting functional test failures in half and doubling the faults detected at process test! These are some of the case study results observed in combined X-ray and in-circuit test environments.

어플리케이션 노트 2001-02-27

PDF PDF 575 KB
Performing Two-Tone Measurements with the Keysight 8360 (PN 8360-4) 
This Product Note illustrates how to use two Keysight 8360 synthesized sweepers to obtain two tracking signals offset by a fixed frequency (fixed offset).

어플리케이션 노트 2001-01-11

PDF PDF 84 KB
Hybrid32 Migration 
This document is provided to help users of HybridPlus Pin Cards more easily incorporate the Hybrid32 technology into their existing systems.

어플리케이션 노트 2000-11-01

PDF PDF 61 KB
Measuring Characteristic Impedance of Short Rambus Motherboard Traces (AN 1304-4) 
This application note tells you how to perform characteristic impedance measurements on Rambus motherboards and SO-RIMM's using TDR with normalization and verification.

어플리케이션 노트 2000-11-01

Evaluating Microstrip with Time Domain Reflectometry (AN 1304-1) 
This application note discusses microstrip transmission line techniques that were evaluated using TDR measurements.

어플리케이션 노트 2000-11-01

RF Component Measurements - Mixer Measurements Using the 8753B Netwotk Analyzer - Product Note 
This Product Note describes several procedures and hardware setups for measuring the performance of a mixer or frequency translator using the 8753B Vector Network Analyzer.

어플리케이션 노트 2000-11-01

PDF PDF 3.49 MB
Practical Noise-Figure Measurement and Analysis for Low-Noise Amplifier Designs (AN 1354) 
This Application Note is a timely and detailed examination of the process needed for making practical noise figure measurements of low-noise amplifiers which includes software modeling.

어플리케이션 노트 2000-09-01

PDF PDF 1.65 MB
Simplified Motor Spin-up Analysis (AN 1200-1) 
This Application Brief offers the Keysight 53310A Modulation Domain Analyzer as a solution to the problem of characterizing a motor's performance without the need for external controller.

어플리케이션 노트 2000-08-01

Direct Characterization of Motion Control Systems (AN 1200-2) 
This Application Brief is one of a series. It demonstrates how the Keysight 53310A makes it easy to capture and view velocity profiles, without the need for an external controller.

어플리케이션 노트 2000-08-01

Network Analysis - Filter And Amplifier Measurement Examples (AN 1287-4) 
The network analyzer is used for a variety of device and component characterization tasks in both laboratory and production environments.

어플리케이션 노트 2000-08-01

Fundamentals of Modal Testing (AN 243-3) 
This modal test 56 page Application Note provides an verview of structural dynamics theory, the measurement process for acquiring frequency response data, parameter estimation (curve fitting), and the analytical techniques of structural analysis and their relation to experimental testing (such...

어플리케이션 노트 2000-05-01

Bearing Runout Measurements (AN 243-7) 
This Application Note introduces the challenge of making runout measurements in disk drives, which is a critical step in increasing storage capacity. It explains the test setup required and shows measurements of repeatable and non-repeatable runout, synchronous and asynchronous runout, and...

어플리케이션 노트 2000-05-01

Testing CDMA Base Station Amplifiers (AN 1307) 
The objective of this Application Note is to cover the basic measurement fundamentals of characterizing the linear and non-linear behavior of CDMA power amplifiers.

어플리케이션 노트 2000-05-01

Improving Network Analyzer Measurements of Frequency-translating Devices (1287-7) – Application Note 
This Application Note explores current test equipment solutions and techniques that can be used to accurately characterize and test frequency-translating devices.

어플리케이션 노트 2000-03-01

Keysight TestJet Technology White Paper 
This paper describes the Keysight TestJet technique, which makes use of a property of most digital ICs in use in the mid-1990s: the lead frame.

어플리케이션 노트 2000-01-01

 
A Low Cost, Surface Mount X-Band Mixer (AN 1052) 
This Application Note is for information only. Keysight no longer sells or supports these products.

어플리케이션 노트 1999-11-01

PDF PDF 35 KB
Low Cost Mixer for the 10.7 to 12.8 GHz Direct Broadcast Satellite Market (AN 1136) 
This Application Note is for information only. Keysight no longer sells or supports these products.

어플리케이션 노트 1999-11-01

PDF PDF 54 KB
Printed Circuit Board Split-Pad Test Method and Design 
This application note describes the split-pad concept for use with a bed of nails style test fixture.

어플리케이션 노트 1999-06-01

PDF PDF 50 KB
Test Strategy for Complex Printed Circuit Board Assemblies 
This paper proposes a new test strategy for complex boards since the trend in Printed Circuit Board Assembly (PCBA) technology is towards higher complexity.

어플리케이션 노트 1999-02-22

PDF PDF 195 KB

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