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8757 Amplifier Measurements (345-1) 
This Application Note describes Microwave Component Measurements: Amplifier Measurements Using the Scalar Network Analyzer.

應用手冊 2001-05-15

PDF PDF 1.13 MB
Electrical In-circuit Test Methods for Limited-access Boards 
This paper surveys the various electrical test methods and tools available to address testing boards that lack full electrical access.

應用手冊 2001-02-27

PDF PDF 47 KB
Improved Fault Coverage in a Combined X-ray and In-Circuit Test Environment 
Cutting functional test failures in half and doubling the faults detected at process test! These are some of the case study results observed in combined X-ray and in-circuit test environments.

應用手冊 2001-02-27

PDF PDF 575 KB
Performing Two-Tone Measurements with the Keysight 8360 (PN 8360-4) 
This Product Note illustrates how to use two Keysight 8360 synthesized sweepers to obtain two tracking signals offset by a fixed frequency (fixed offset).

應用手冊 2001-01-11

PDF PDF 84 KB
RF Component Measurements - Mixer Measurements Using the 8753B Netwotk Analyzer - Product Note 
This Product Note describes several procedures and hardware setups for measuring the performance of a mixer or frequency translator using the 8753B Vector Network Analyzer.

應用手冊 2000-11-01

PDF PDF 3.49 MB
Measuring Characteristic Impedance of Short Rambus Motherboard Traces (AN 1304-4) 
This application note tells you how to perform characteristic impedance measurements on Rambus motherboards and SO-RIMM's using TDR with normalization and verification.

應用手冊 2000-11-01

Evaluating Microstrip with Time Domain Reflectometry (AN 1304-1) 
This application note discusses microstrip transmission line techniques that were evaluated using TDR measurements.

應用手冊 2000-11-01

Hybrid32 Migration 
This document is provided to help users of HybridPlus Pin Cards more easily incorporate the Hybrid32 technology into their existing systems.

應用手冊 2000-11-01

PDF PDF 61 KB
Practical Noise-Figure Measurement and Analysis for Low-Noise Amplifier Designs (AN 1354) 
This Application Note is a timely and detailed examination of the process needed for making practical noise figure measurements of low-noise amplifiers which includes software modeling.

應用手冊 2000-09-01

PDF PDF 1.65 MB
Simplified Motor Spin-up Analysis (AN 1200-1) 
This Application Brief offers the Keysight 53310A Modulation Domain Analyzer as a solution to the problem of characterizing a motor's performance without the need for external controller.

應用手冊 2000-08-01

Network Analysis - Filter And Amplifier Measurement Examples (AN 1287-4) 
The network analyzer is used for a variety of device and component characterization tasks in both laboratory and production environments.

應用手冊 2000-08-01

Direct Characterization of Motion Control Systems (AN 1200-2) 
This Application Brief is one of a series. It demonstrates how the Keysight 53310A makes it easy to capture and view velocity profiles, without the need for an external controller.

應用手冊 2000-08-01

Testing CDMA Base Station Amplifiers (AN 1307) 
The objective of this Application Note is to cover the basic measurement fundamentals of characterizing the linear and non-linear behavior of CDMA power amplifiers.

應用手冊 2000-05-01

Bearing Runout Measurements (AN 243-7) 
This Application Note introduces the challenge of making runout measurements in disk drives, which is a critical step in increasing storage capacity. It explains the test setup required and shows measurements of repeatable and non-repeatable runout, synchronous and asynchronous runout, and...

應用手冊 2000-05-01

Fundamentals of Modal Testing (AN 243-3) 
This modal test 56 page Application Note provides an verview of structural dynamics theory, the measurement process for acquiring frequency response data, parameter estimation (curve fitting), and the analytical techniques of structural analysis and their relation to experimental testing (such...

應用手冊 2000-05-01

Improving Network Analyzer Measurements of Frequency-translating Devices (1287-7) – Application Note 
This Application Note explores current test equipment solutions and techniques that can be used to accurately characterize and test frequency-translating devices.

應用手冊 2000-03-01

Keysight TestJet Technology White Paper 
This paper describes the Keysight TestJet technique, which makes use of a property of most digital ICs in use in the mid-1990s: the lead frame.

應用手冊 2000-01-01

 
A Low Cost, Surface Mount X-Band Mixer (AN 1052) 
This Application Note is for information only. Keysight no longer sells or supports these products.

應用手冊 1999-11-01

PDF PDF 35 KB
Low Cost Mixer for the 10.7 to 12.8 GHz Direct Broadcast Satellite Market (AN 1136) 
This Application Note is for information only. Keysight no longer sells or supports these products.

應用手冊 1999-11-01

PDF PDF 54 KB
Printed Circuit Board Split-Pad Test Method and Design 
This application note describes the split-pad concept for use with a bed of nails style test fixture.

應用手冊 1999-06-01

PDF PDF 50 KB
Test Strategy for Complex Printed Circuit Board Assemblies 
This paper proposes a new test strategy for complex boards since the trend in Printed Circuit Board Assembly (PCBA) technology is towards higher complexity.

應用手冊 1999-02-22

PDF PDF 195 KB
Discreet Analog Device Testing 
The Keysight 3070 series has quite a few built in features to make developing board tests easier, while protecting the operator, the board under test, and the 3070 itself from harm.

應用手冊 1998-10-29

PDF PDF 26 KB
Boundary-Scan Technology, Justification, and Test Implementation for Designers 
This paper provides practical insight for designers on the merits, design, and test implementation of Boundary-Scan Technology.

應用手冊 1998-05-27

PDF PDF 29 KB
Boundary Scan Ground Bounce Suppression 
Boundary-Scan circuitry, while in the process of testing interconnections, can set up and excite current surges on a board. This in turn can cause "ground bounce".

應用手冊 1998-04-24

PDF PDF 14 KB
Fixture Interface Pin (MINT Pin) Maintenance 
Fixture Interface Pins (MINT Pins) used in production testing will eventually get dirty enough to cause contact problems.

應用手冊 1998-03-01

PDF PDF 20 KB

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