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Improving Speed and Accuracy in the Testing of BTS Filters and Duplexers - Application Brief 
This application brief explains why the E5080A ENA Series Network Analyzer is the ideal solution for BTS filters and duplexers manufacturing test.

어플리케이션 노트 2015-02-11

CAN FD Eye-Diagram Mask Testing - Application Note 
Eye-diagram mask testing is used in a broad range of today’s serial bus applications. Learn more about eye-diagram testing for higher speed buses such as the new CAN FD serial bus.

어플리케이션 노트 2015-02-05

Time Domain Reflectometry Theory - Application Note 
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

어플리케이션 노트 2015-01-30

Detecting Tailgating Boards on the i3070 Inline In-Circuit Tester - Application Note 
Tailgating sensor improvements on the Keysight i3070 Series 5i inline in-circuit tester help to further minimize damages due to operator and upstream loading errors.

어플리케이션 노트 2015-01-05

PDF PDF 437 KB
Non-Contact Measurement Method for 13.56 MHz RFID Tags – Application Note 
For engineers working in RFID antenna design and test, this note discusses a non-contact method for measuring resonant frequencies of RFIDs using a network analyzer.

어플리케이션 노트 2014-12-05

PDF PDF 607 KB
The Impact of Electro-Thermal Coupling on HBT Power Amplifiers 
This paper describes the use of electrothermal simulation to understand, predict, and account for cross-circuit thermal coupling in a commercial HBT power amplifier.

어플리케이션 노트 2014-10-19

 
Radar Measurements - Application Note 
This application note focuses on the fundamentals of measuring basic pulsed radars and measurements for more complex or modulated pulsed radar systems.

어플리케이션 노트 2014-08-22

PDF PDF 6.84 MB
Achieving Accurate E-band Power Measurement with Keysight E8486A Waveguide Power Sensors 
E-band spectrum application has been gaining more application interests in the recent years. E8486A addresses the requirement for accurate RF power measurement in the mm-wave applications.

어플리케이션 노트 2014-08-04

Modifying DDR Libraries for Silicon Nail Test Generation on the Keysight x1149 Boundary Scan Analyzer 
This application note describes how to modify DDR libraries to generate silicon nails tests on the Keysight x1149 Boundary Scan Analyzer.

어플리케이션 노트 2014-08-03

PDF PDF 1.57 MB
Releasing the “Test Sequence” and “Test” to Production on the Keysight x1149 Boundary Scan Analyzer 
This application note describes how to release test sequences and tests to production when using the Keysight x1149 Boundary Scan Analyzer.

어플리케이션 노트 2014-08-03

PDF PDF 5.52 MB
Simulating Envelope Tracking with Advanced Design System Software - Application Note 
This example applies envelope tracking to an example amplifier to show techniques of using Advanced Design System (ADS) for this type of design.

어플리케이션 노트 2014-08-02

PDF PDF 2.38 MB
FlexRay Physical Layer Eye-diagram Mask Testing - Application Note 
Keysight provides seven different FlexRay mask files based on FlexRay physical layer standards/specifications for use with InfiniiVision 5000, 6000, and 7000 Series oscilloscopes (DSO or MSO)from Agilent.

어플리케이션 노트 2014-08-01

Characterizing the I-V Curve of Solar Cells and Modules 
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

어플리케이션 노트 2014-07-31

오프라인 vs 인라인: 자동 인라인 ICT로 전환 
소형 i1000D ICT 시스템을 이용한 완전 자동 인라인 인-서킷 테스트 전략의 경제성과 다양한 장점에 대해 알아보십시오.

어플리케이션 노트 2014-05-14

Characterizing CAN Bus Arbitration - Application note 
This app note will explain the CAN non-destructive bit-wise arbitration process. The InfiniiVision 4000 and 6000 X-Series oscilloscopes show examples of triggering and decoding those messages.

어플리케이션 노트 2014-04-28

PDF PDF 1.23 MB
저전력 측정에 대한 오실로스코프 평가 – 어플리케이션 노트 (영어) 
Infiniium 9000 시리즈 오실로스코프는 스코프, 로직 분석기, 프로토콜 분석기 등 세 개의 계측기를 하나로 통합하여 가장 광범위한 어플리케이션 소프트웨어 디버그 및 인증을 제공합니다.

어플리케이션 노트 2014-04-16

i1000D SFP 인서킷 테스트 시스템을 이용한 자동차 퓨즈 박스 테스트 - 어플리케이션 노트 
i1000D SFP(small footprint) 인라인 인-서킷 테스터는 모든 자동차가 원활하게 주행하는 데 없어서는 안 될 핵심 부품인 자동차 내부의 퓨즈박스를 테스트하는 도구입니다.

어플리케이션 노트 2014-03-26

Testplan Development on CVI Labwindows with TS-5400 PXI Series - Application Note 
This application note provides set-up guidelines to start developing your testplan on CVI Labwindows using the Keysight U8972A TS-5400 PXI Series functional test system.

어플리케이션 노트 2014-03-25

자동차 시리얼 버스 테스트 – 어플리케이션 노트 
이 어플리케이션 노트는 애질런트 오실로스코프를 사용하는 다양한 자동차 시리얼 버스의 성능에 대한 특성 분석의 예를 보여주고 권장 프로빙 솔루션에 대한 요약을 제공합니다.

어플리케이션 노트 2014-03-17

High Precision Time Domain Reflectometry - Application Note 
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

어플리케이션 노트 2014-01-23

Considerations in Making Small Signal Measurements - Application Brief 
The increasing demand for battery-powered mobile devices and energy-efficient green products has triggered a rising demand for a scope measurement solution that can measure the small signals.

어플리케이션 노트 2013-10-29

Debug Automotive Designs Faster with CAN-dbc Symbolic Trigger and Decode - Application Note 
Learn how to perform CAN symbolic-level triggering and decoding using a Keysight 9000 Series oscilloscope.

어플리케이션 노트 2013-09-24

PDF PDF 1.79 MB
Increasing Manufacturing Throughput of Automotive Controllers - Application Note 
This application note describes how automotive manufacturers can boost throughput using the Keysight TS-5400 Series 3 high performance PXI function test system for multiple devices under test.

어플리케이션 노트 2013-04-18

PDF PDF 783 KB
Make High Sensitivity, Wide Dynamic Range Current Measurement - Application Note 
The new N2820A Series high-sensitivity current probes from Keysight Technologies address the need for high-sensitivity current measurements with a wide dynamic range.

어플리케이션 노트 2013-02-26

Tips for Making Low Current Measurements with an Oscilloscope and Current Probe 
An oscilloscope and a clamp-on current probe provide an easy way to make current measurements without necessarily breaking the circuit.

어플리케이션 노트 2012-12-10

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