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Optimizing Power Savings on WiMax and Other Cellular WWAN Interface Devices - Application Note 
This document describes how to optimze power savings on WiMax and other cellular WWAN interface devices.

應用手冊 2008-07-15

High Node Count Fixturing Solutions for Keysight Short-Wire Test Fixtures 
This paper discusses problems encountered in building large, high node count vacuum actuated test fixtures for the Keysight 3070 family of board test systems.

應用手冊 2008-04-30

PDF PDF 67 KB
The Future of In-Circuit Testing in the High-speed, Complex Electronics Environment 
As board complexity and node counts continue to rise and high speed differential signaling continues to grow in popularity, In-Circuit Test needs to move quickly beyond the traditional realms. This article explores this in detail.

應用手冊 2007-10-31

Tips for X-ray Users On Exporting NDF’s With No Loads Set To False 
Navigating CAD can be a time consuming process. Small tips can be extremely helpful in creating quality programs in a short amount of time.

應用手冊 2007-10-18

 
X-ray Test Users Utilize BOM Explorer to Change  
Automated X-ray Inspection 5DX Users can save time by implementing these quick and easy steps to use BOM explorer to change "no pops" to "untested".

應用手冊 2007-10-12

 
Making the Most of Keysight Throughput Multiplier on Medalist In-Circuit Test Systems 
Keysight Throughput Multiplier reduces test time on in-circuit test systems by testing up to four boards of a single-board-type panel simultaneously. The tips in this application note will help users make the most of this valuable tool.

應用手冊 2007-10-12

 
Automating Keysight 14565B Software Battery Drain Measurements with LabVIEW 
This document describes the process of making battery drain measurements with the Keysight 14565B and National Instruments Labview

應用手冊 2007-10-11

PDF PDF 188 KB
Medalist SP50 User Tips for Nominal Paste Factor Field  
Registered users, on valid support contracts, can login to learn about how using the Nominal Paste Factor appropriately can improve the system measurement results on the Medalist SP50 Solder Paste Inspection System.

應用手冊 2007-10-11

 
Accelerate Wireless Mobile Device Design Validation with Automated Test Solution 
This document describes how to accelerate wireless mobile device design validation using Keysight automated test solutions.

應用手冊 2007-10-11

In Situ Investigations of Corrosion Via SPM - Application Note 

應用手冊 2007-07-05

PDF PDF 805 KB
Accurate Mixer Measurements with ENA Frequency-Offset Mode (AN 1463-6) 
Recommended measurement procedures for evaluating mixers.

應用手冊 2007-05-07

Advanced Measurement Techniques for RF Amplifiers Using Unique Functions of the Keysight E5071C ENA 
This application note will briefly review the basic measurement fundamentals of characterizing amplifiers with network analyzers.

應用手冊 2007-04-27

Maximising Test Coverage with Keysight Medalist VTEP v2.0 
This paper describes how to get the most from Keysight Technologies’ industry-leading vectorless test innovation, the Medalist VTEP v2.0 which is a suite of solution comprising VTEP, iVTEP and NPM.

應用手冊 2007-04-17

Improving the Test Efficiency of the MEMS Capacitive Sensor using the E4980A 
This application brief describes the features of the Keysight E4980A and how it can dramatically improve the test efficiency of MEMS capacitive sensors.

應用手冊 2007-04-13

Improving Test Efficiency of MEMS Electrostatic Actuator using the E4980A 
This application brief describes how the Keysight E4980A can greatly improve the test efficiency of MEMS electrostatic actuators.

應用手冊 2007-04-12

Characterizing Electromagnetic MEMS Optical Switch Actuator using the E4980A 
This application brief describes how the Keysight E4980A improves the test efficiency of electromagnetic MEMS optical switch actuators.

應用手冊 2007-04-04

Characterizing Electromagnetic MEMS Optical Scanner using the E4980A 
This application brief describes how the Keysight E4980A can greatly improve the test efficiency of electromagnetic MEMS optical scanners.

應用手冊 2007-04-04

Battery Drain Analysis Improves Mobile-Device Operating Time - Application Note 
Using specialized tools and analysis techniques can help you create mobile-device designs that extend battery life and improve your productivity.

應用手冊 2007-02-01

Evaluating Battery Run-down Performance of the 66319D and the 14565B (AN 1427) 
This application note describes how to easily and accurately evaluate the performance of a mobile wireless device while being directly powered by its battery.

應用手冊 2007-01-31

Mobile Communications Device Testing (AN 1310) 
Pulsed battery drain currents, regulated charge currents, and remote DUT fixtures, dictate the need for specialized power sourcing, loading, and measurement capabilities for testing mobile communications devices.

應用手冊 2007-01-16

PDF PDF 251 KB
Current Drain Analysis Enhances WLAN Network Card Design and Test - Application Note 
This application note explains how to simplify the complex task of accurately measuring and evaluating the current drain of a WLAN network card for its various operating modes.

應用手冊 2006-12-14

Highly Accurate Amplifier ACLR and ACPR Testing with the Keysight N5182A MXG Vector Signal Generator 
This note discusses ACLR/ACPR as a key performance characteristic for power amplifiers used to test wireless communications systems and how the Keysight MXG vector signal generator is used to test them.

應用手冊 2006-08-30

Improving Meas. and Calibration Accuracy using the Frequency Converter (1408-3) – Application Note 
Improving Measurement and Calibration Accuracy Using the Frequency Converter Application - AN 1408-3

應用手冊 2006-08-08

8510 Mixers - Amplitude and Phase Measurements of Frequency Translation Devices (8510-7A) 

應用手冊 2006-07-13

8510 Amplifier Linear and Non-Linear Measurements (PN 8510-18) 
This Product Note discusses techniques for measuring transmission and reflection characteristics of many amplifiers and active devices.

應用手冊 2006-07-13

PDF PDF 396 KB

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