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In-System Programming on the Keysight 3070 
In-System Programmable devices are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.

Application Note 2001-07-02

PDF PDF 205 KB
Ultra-linear Power Amplifier Characterization Using Dynamic Range Extension Techniques 
This White Paper describes the feed-forward signal cancellation process that extends the dynamic range of current distortion measurement systems by at least 25 dB.

Application Note 2001-06-26

PDF PDF 382 KB
Tying a Power Supply to Multiple Boards in a Panel 
If you have a situation with multiple boards on a panel, and you need to wire one or more power supplies to each board, you often can wind up with problems wiring power and ground. Usually, you'll see warnings of the type FXT66.

Application Note 2001-06-12

PDF PDF 16 KB
Zero Volt Electronic Load 
Increasing demand for lower voltage power supplies is pressuring test system designers to identify electronic load test equipment designed to adequately perform at these lower voltages. In this Product Note read about how to configure Keysight DC Electronic Loads, with option J04, to perform...

Application Note 2001-06-07

PDF PDF 141 KB
Writing Flash Memory with Keysight 3070 Systems 
Flash memory is traditionally programmed on PROM programmers, but some manufacturers report a one percent damage rate due to the extra handling steps required!

Application Note 2001-05-18

PDF PDF 31 KB
Running Rocky Mountain Basic from Board Test Basic 
Many of you have existing programs written in Rocky Mountain Basic (RM-Basic), or have found the RM-Basic program examples given in Keysight manuals, and wish to use them to do external instrumentation control using the Keysight 3070 Board Test Family.

Application Note 2001-05-17

PDF PDF 23 KB
Up-and-Down Programming DUT Power Supplies 
There seems to be some confusion on what the current limits are when using the DUT supplies in the Keysight 3070 system. While this article is not meant to be an exhaustive treatise on the subject, a little clarification might help.

Application Note 2001-05-17

PDF PDF 23 KB
Reducing Process Defect Escapes with Vectorless Test 
Process defects that escape in-circuit test lead at best to increased repair costs, and at worst to a "bone pile1" problem.

Application Note 2001-05-17

PDF PDF 512 KB
Series II Compliance with the Machinery Directive (in Europe) - specific installation procedures 
Series II will meet requirements of Machinery Directive in European Community member countries, if the following steps, which are described in the document, are taken during installation of equipment.

Application Note 2001-05-17

 
A Quality Test Demands A Quality Fixture 
A Check List for getting a quality board test fixture first time, every time.

Application Note 2001-05-16

PDF PDF 26 KB
8757 Amplifier Measurements (345-1) 
This Application Note describes Microwave Component Measurements: Amplifier Measurements Using the Scalar Network Analyzer.

Application Note 2001-05-15

PDF PDF 1.13 MB
Electrical In-circuit Test Methods for Limited-access Boards 
This paper surveys the various electrical test methods and tools available to address testing boards that lack full electrical access.

Application Note 2001-02-27

PDF PDF 47 KB
Improved Fault Coverage in a Combined X-ray and In-Circuit Test Environment 
Cutting functional test failures in half and doubling the faults detected at process test! These are some of the case study results observed in combined X-ray and in-circuit test environments.

Application Note 2001-02-27

PDF PDF 575 KB
Performing Two-Tone Measurements with the Keysight 8360 (PN 8360-4) 
This Product Note illustrates how to use two Keysight 8360 synthesized sweepers to obtain two tracking signals offset by a fixed frequency (fixed offset).

Application Note 2001-01-11

PDF PDF 84 KB
Evaluating Microstrip with Time Domain Reflectometry (AN 1304-1) 
This application note discusses microstrip transmission line techniques that were evaluated using TDR measurements.

Application Note 2000-11-01

RF Component Measurements - Mixer Measurements Using the 8753B Netwotk Analyzer - Product Note 
This Product Note describes several procedures and hardware setups for measuring the performance of a mixer or frequency translator using the 8753B Vector Network Analyzer.

Application Note 2000-11-01

PDF PDF 3.49 MB
Hybrid32 Migration 
This document is provided to help users of HybridPlus Pin Cards more easily incorporate the Hybrid32 technology into their existing systems.

Application Note 2000-11-01

PDF PDF 61 KB
Measuring Characteristic Impedance of Short Rambus Motherboard Traces (AN 1304-4) 
This application note tells you how to perform characteristic impedance measurements on Rambus motherboards and SO-RIMM's using TDR with normalization and verification.

Application Note 2000-11-01

Practical Noise-Figure Measurement and Analysis for Low-Noise Amplifier Designs (AN 1354) 
This Application Note is a timely and detailed examination of the process needed for making practical noise figure measurements of low-noise amplifiers which includes software modeling.

Application Note 2000-09-01

PDF PDF 1.65 MB
Direct Characterization of Motion Control Systems (AN 1200-2) 
This Application Brief is one of a series. It demonstrates how the Keysight 53310A makes it easy to capture and view velocity profiles, without the need for an external controller.

Application Note 2000-08-01

Network Analysis - Filter And Amplifier Measurement Examples (AN 1287-4) 
The network analyzer is used for a variety of device and component characterization tasks in both laboratory and production environments.

Application Note 2000-08-01

Simplified Motor Spin-up Analysis (AN 1200-1) 
This Application Brief offers the Keysight 53310A Modulation Domain Analyzer as a solution to the problem of characterizing a motor's performance without the need for external controller.

Application Note 2000-08-01

Fundamentals of Modal Testing (AN 243-3) 
This modal test 56 page Application Note provides an verview of structural dynamics theory, the measurement process for acquiring frequency response data, parameter estimation (curve fitting), and the analytical techniques of structural analysis and their relation to experimental testing (such...

Application Note 2000-05-01

Bearing Runout Measurements (AN 243-7) 
This Application Note introduces the challenge of making runout measurements in disk drives, which is a critical step in increasing storage capacity. It explains the test setup required and shows measurements of repeatable and non-repeatable runout, synchronous and asynchronous runout, and...

Application Note 2000-05-01

Testing CDMA Base Station Amplifiers (AN 1307) 
The objective of this Application Note is to cover the basic measurement fundamentals of characterizing the linear and non-linear behavior of CDMA power amplifiers.

Application Note 2000-05-01

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