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Connecting a UPS to a 3070 Controller 
This paper describes how to connect a UPS to the 3070 testhead controller. It uses the Advanced Power Conversion Smart-UPS with PowerChute Plus software.

Application Note 2003-01-07

PDF PDF 87 KB
A New Process for Measuring and Displaying Board Test Coverage 
Written by Kenneth P. Parker, Keysight Technologies. First presented at Apex 2003, Anaheim, California.

Application Note 2003-01-01

PDF PDF 116 KB
How to Characterize CATV Amplifiers Effectively (AN 1288-4) 
This application note shows you how to effectively evaluate CATV amplifier performance using the 4396B Network/ Spectrum/Impedance Analyzer.

Application Note 2002-12-12

PDF PDF 463 KB
Evaluating Battery Run-down Performance of Mobile Wireless Devices 
This application note describes how to easily and accurately evaluate the performance of a mobile wireless device while being directly powered by its battery.

Application Note 2002-11-04

 
Comparison of Mixer Characterization using New Vector Characterization Techniques – White Paper 
This paper presents a novel method for characterizing RF mixers, yielding magnitude, phase, and group delay response of the conversion loss, as well as the input match and output match.

Application Note 2002-10-04

UNIX vs. Windows Differences for 3070 Users 
This documentation serves as a PC transition guide to help existing 3070 customers migrate from the Unix platform to the PC platform.

Application Note 2002-09-19

 
Using Battery Drain Analysis to Improve Mobile-Device Operating Time 
Using specialized tools and analysis techniques can help you create mobile-device designs that extend battery life.

Application Note 2002-09-19

Windows & Unix Feature Comparison 
The Windows & Unix 3070 Feature Comparison document provides a detailed listing of features translated to the Windows based 3070 from the Unix based 3070.

Application Note 2002-07-31

PDF PDF 71 KB
3070 In System Programming (ISP) Family 
On Board Programming, Bottom Line Benefits

Application Note 2002-07-25

PDF PDF 200 KB
Maintaining Power with Dual Stage Fixtures 
Occasionally there is a need to do dual stage fixturing where power must be maintained during parts of both stages.

Application Note 2002-06-07

PDF PDF 48 KB
Optimizing Bluetooth Device Battery Drain Measurements in Manufacturing (AN 1396) 
This application note discusses optimizing battery drain measurements in manufacturing test for Bluetooth devices.

Application Note 2002-04-03

Optical Spectrum Analyzer Amplifier Test Application (PN 86140-5) 
The product note explains how the Keysight OSA amplifier test application provides a cost-effective solution for reducing test time.

Application Note 2002-03-15

PDF PDF 642 KB
Keysight 3070 Outsource Series Pay-Per-Use Board Test System 
With a Keysight 3070 Outsource Pay-Per-Use System, you can define your system according to the products you have to test.

Application Note 2002-03-08

PDF PDF 247 KB
PLD Programming on the Keysight 3070 Using the PLD ISP Product 
In-System Programmable PLDs are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.

Application Note 2002-02-26

PDF PDF 242 KB
Battery Testing (AN 372-2) 
This Application Note shows how an electronic load can be used to discharge batteries of various chemistries to determine actual capacity, capacity retention and impedance.

Application Note 2002-02-22

Making Fuel Cell ac Impedance Measurements Utilizing Keysight N3300A Series Electronic Loads (PN... 
This 12-page product note discusses making ac impedance measurements on fuel cells that can help identify problems with the fuel cell components and help identify deviations in the fuel cell assembly process.

Application Note 2002-02-15

PDF PDF 320 KB
Design and Measurement of a 400 MHz Frequency Synthesizer: Accuracy Proof 
This Application Note explains the 400 MHz PLL design with examples and hence giving the engineer a powerful effective tool for designing real PLLs.

Application Note 2001-11-01

The 2001 CAD Benchmark Rat-Race Mixer Characterisation 
This AN highlights the benchmark specifications submitted to CAD vendors by Microwave Engineering Europe Magazine and also details Eagleware’s submitted simulations to Microwave Engineering Europe.

Application Note 2001-10-01

PDF PDF 478 KB
Synchronizing 3070 System Clocks 
These instructions are for synchronizing the system clocks of several network-connected UX workstations in the absence of an existing timeserver.

Application Note 2001-09-27

PDF PDF 66 KB
Network Analysis Basics - 10 Hints for Making Better Network Analyzer Measurements (AN 1291-1B) 
This Application Note contains hints to help you understand and improve your use of network analyzers, and a summary of network analyzers and their capabilities.

Application Note 2001-09-17

3070 Series 3 Flash70 Programming Guide 
This guide contains information about the procedures, tasks, and syntax required to perform flash programming with HP 3070 test systems.

Application Note 2001-09-12

PDF PDF 1.85 MB
Network Analysis - Balanced Measurement Example: Differential Amplifiers (1373-7) 
This Application Note describes Keysight balanced-measurement solutions they have developed that offer the most accurate method available for measuring differential RF circuits.

Application Note 2001-09-10

Breakthrough Innovations: Keysight Automated Silicon Nails 
Automated Silicon Nails takes the popular IEEE 1149.1 Boundary-Scan standard even further by using Boundary-Scan chains to automatically test non-Boundary-Scan devices.

Application Note 2001-08-15

PDF PDF 460 KB
3070 Board Tests are Reliable, Repeatable and Transportable. Here's Why. 
It would take a very long paper to discuss all of the factors that make Keysight 3070 tests so reliable, repeatable, and transportable. This paper selects a few of the important ones.

Application Note 2001-08-15

PDF PDF 223 KB
Comparing AOI and AXI 
Choosing the right technology requires looking at board mix, capital budget and other business considerations. But most of all, you need to understand the typical characteristics of each technology.

Application Note 2001-07-25

PDF PDF 42 KB

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