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PNA - Antenna - Pulsed Measurements 
This paper presents advances in the instrumentation techniques that can be used for the measurement and characterization of antennas that are to be tested in a pulsed mode of operation.

Application Note 2004-01-06

PNA - Mixers - Absolute Group Delay of Multistage Converters 
This paper describes new calibration and measurement techniques for measuring absolute group delay of frequency converters with multiple mixing stages

Application Note 2003-11-24

Method for Vector mixer Characterization and Mixer Test System Vector Error Correction – White Paper 
A method for characterizing RF mixers, yielding magnitude and phase response for input match, output match,conversion loss, and mixers which have reciprocal conversion loss and for which the image response can be filtered out.

Application Note 2003-11-11

Creating Measurement-Based Amplifier Behavioral Models 
This Application Note describes a behavioral model used in circuit and system simulations to verify performance of the amplifier within a circuit or system.

Application Note 2003-10-01

High-Precision TDR with the Keysight 86100 DCA & Picosecond Pulse Labs 4020 Source Enhancement Module 
Learn how to build a high-precision time-domain reflectometry/time-domain transmission measurement system.

Application Note 2003-09-12

PDF PDF 288 KB
Test Coverage: What Does It Mean when a Board Test Passes? 
Originally presented at the 2002 International Test Conference -- Characterizing board test coverage as a percentage of devices or nodes having tests does not accurately portray coverage, especially in a limited access testing environment.

Application Note 2003-07-28

PDF PDF 266 KB
Discharge on Unpowered Keysight 3070 Systems 
This paper is applicable to both powered and unpowered Keysight 3070 systems, but does not explain how a discharge routine is created on an Unpowered system.

Application Note 2003-06-13

 
3D Inline Solder Paste Inspection - Benefit Realized 
100% solder paste inspection helps to reduce the contribution from the print process to solder joint defects.

Application Note 2003-06-01

PDF PDF 59 KB
Non-Volatile Memory Programming on the Keysight 3070 
The trend in non-volatile memory, like the general trend in electronic products, is to increase capability, reduce size, reduce cost, and get the final product to market faster than the competition.

Application Note 2003-05-29

PDF PDF 28 KB
Triggering PNA Microwave Network Analyzers for Antenna Measurements – Application Note 

Application Note 2003-05-28

Mixer Transmission Measurements Using The Frequency Converter Application (1408-01)–Application Note 
Microwave PNA Series Network Analyzer Application Note, mixer transmission measurements using the frequency converter application note 1408-1

Application Note 2003-05-16

Testing Transformers on Unpowered Systems 
This paper explains how to test basic analog parts, using unpowered systems.

Application Note 2003-03-21

PDF PDF 10 KB
Boundary Scan Helps EMS Companies Cut Test Costs and Increase Revenues 
Electronics Manufacturing Services (EMS) providers can utilize boundary-scan to reduce test cost expenses and also generate additional revenue opportunities.

Application Note 2003-03-01

PDF PDF 242 KB
Using Boundary Scan to Link Design and Manufacturing Test 
By leveraging boundary-scan tests generated in Design and re-using them at Manufacturing Test, manufacturers can produce long-term benefits in terms of lower costs, greater efficiencies and higher quality products.

Application Note 2003-03-01

PDF PDF 502 KB
What to Consider When Selecting the Optimal Test Strategy 
This paper addresses several issues for selecting the optimal inspection strategy, presenting data from many studies that Keysight has performed in the quest to find the optimal test / inspection strategy.

Application Note 2003-03-01

PDF PDF 175 KB
Ground Bounce Basics and Best Practices 
This article offers a description of the physical properties that result in ground bounce during board test.

Application Note 2003-01-28

PDF PDF 138 KB
System Issues in Boundary-Scan Board Test 
While Boundary-Scan is a powerful test tool, test engineers are finding out that yesterday's DFT rules and test approaches may actually be detrimental to successfully testing systems on a board.

Application Note 2003-01-28

PDF PDF 37 KB
Design for Testability - Test for Designability 
This paper addresses testability considerations, both physical and logical, and focuses on both the new constraints and the new freedoms of modern manufacturing test in the ever-changing challenge.

Application Note 2003-01-28

PDF PDF 852 KB
Keysight 3070 Now Powered by Industrial PC Controllers 
The Keysight 3070 is now controlled by PCs similar to others used in your production and office environment lowering system administration and learning costs.

Application Note 2003-01-23

PDF PDF 207 KB
Connecting a UPS to a 3070 Controller 
This paper describes how to connect a UPS to the 3070 testhead controller. It uses the Advanced Power Conversion Smart-UPS with PowerChute Plus software.

Application Note 2003-01-07

PDF PDF 87 KB
A New Process for Measuring and Displaying Board Test Coverage 
Written by Kenneth P. Parker, Keysight Technologies. First presented at Apex 2003, Anaheim, California.

Application Note 2003-01-01

PDF PDF 116 KB
How to Characterize CATV Amplifiers Effectively (AN 1288-4) 
This application note shows you how to effectively evaluate CATV amplifier performance using the 4396B Network/ Spectrum/Impedance Analyzer.

Application Note 2002-12-12

PDF PDF 463 KB
Evaluating Battery Run-down Performance of Mobile Wireless Devices 
This application note describes how to easily and accurately evaluate the performance of a mobile wireless device while being directly powered by its battery.

Application Note 2002-11-04

 
Comparison of Mixer Characterization using New Vector Characterization Techniques – White Paper 
This paper presents a novel method for characterizing RF mixers, yielding magnitude, phase, and group delay response of the conversion loss, as well as the input match and output match.

Application Note 2002-10-04

Using Battery Drain Analysis to Improve Mobile-Device Operating Time 
Using specialized tools and analysis techniques can help you create mobile-device designs that extend battery life.

Application Note 2002-09-19

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