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Ground Bounce Basics and Best Practices 
This article offers a description of the physical properties that result in ground bounce during board test.

应用说明 2003-01-28

PDF PDF 138 KB
Design for Testability - Test for Designability 
This paper addresses testability considerations, both physical and logical, and focuses on both the new constraints and the new freedoms of modern manufacturing test in the ever-changing challenge.

应用说明 2003-01-28

PDF PDF 852 KB
A New Process for Measuring and Displaying Board Test Coverage 
Written by Kenneth P. Parker, Keysight Technologies. First presented at Apex 2003, Anaheim, California.

应用说明 2003-01-01

PDF PDF 116 KB
UNIX vs. Windows Differences for 3070 Users 
This documentation serves as a PC transition guide to help existing 3070 customers migrate from the Unix platform to the PC platform.

应用说明 2002-09-19

 
Windows & Unix Feature Comparison 
The Windows & Unix 3070 Feature Comparison document provides a detailed listing of features translated to the Windows based 3070 from the Unix based 3070.

应用说明 2002-07-31

PDF PDF 71 KB
3070 In System Programming (ISP) Family 
On Board Programming, Bottom Line Benefits

应用说明 2002-07-25

PDF PDF 200 KB
Maintaining Power with Dual Stage Fixtures 
Occasionally there is a need to do dual stage fixturing where power must be maintained during parts of both stages.

应用说明 2002-06-07

PDF PDF 48 KB
PLD Programming on the Keysight 3070 Using the PLD ISP Product 
In-System Programmable PLDs are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.

应用说明 2002-02-26

PDF PDF 242 KB
3070 Series 3 Flash70 Programming Guide 
This guide contains information about the procedures, tasks, and syntax required to perform flash programming with HP 3070 test systems.

应用说明 2001-09-12

PDF PDF 1.85 MB
3070 Board Tests are Reliable, Repeatable and Transportable. Here's Why. 
It would take a very long paper to discuss all of the factors that make Keysight 3070 tests so reliable, repeatable, and transportable. This paper selects a few of the important ones.

应用说明 2001-08-15

PDF PDF 223 KB
Breakthrough Innovations: Keysight Automated Silicon Nails 
Automated Silicon Nails takes the popular IEEE 1149.1 Boundary-Scan standard even further by using Boundary-Scan chains to automatically test non-Boundary-Scan devices.

应用说明 2001-08-15

PDF PDF 460 KB
In-System Programming on the Keysight 3070 
In-System Programmable devices are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.

应用说明 2001-07-02

PDF PDF 205 KB
Tying a Power Supply to Multiple Boards in a Panel 
If you have a situation with multiple boards on a panel, and you need to wire one or more power supplies to each board, you often can wind up with problems wiring power and ground. Usually, you'll see warnings of the type FXT66.

应用说明 2001-06-12

PDF PDF 16 KB
Writing Flash Memory with Keysight 3070 Systems 
Flash memory is traditionally programmed on PROM programmers, but some manufacturers report a one percent damage rate due to the extra handling steps required!

应用说明 2001-05-18

PDF PDF 31 KB
Reducing Process Defect Escapes with Vectorless Test 
Process defects that escape in-circuit test lead at best to increased repair costs, and at worst to a "bone pile1" problem.

应用说明 2001-05-17

PDF PDF 512 KB
Up-and-Down Programming DUT Power Supplies 
There seems to be some confusion on what the current limits are when using the DUT supplies in the Keysight 3070 system. While this article is not meant to be an exhaustive treatise on the subject, a little clarification might help.

应用说明 2001-05-17

PDF PDF 23 KB
A Quality Test Demands A Quality Fixture 
A Check List for getting a quality board test fixture first time, every time.

应用说明 2001-05-16

PDF PDF 26 KB
Electrical In-circuit Test Methods for Limited-access Boards 
This paper surveys the various electrical test methods and tools available to address testing boards that lack full electrical access.

应用说明 2001-02-27

PDF PDF 47 KB
Improved Fault Coverage in a Combined X-ray and In-Circuit Test Environment 
Cutting functional test failures in half and doubling the faults detected at process test! These are some of the case study results observed in combined X-ray and in-circuit test environments.

应用说明 2001-02-27

PDF PDF 575 KB
Printed Circuit Board Split-Pad Test Method and Design 
This application note describes the split-pad concept for use with a bed of nails style test fixture.

应用说明 1999-06-01

PDF PDF 50 KB
Boundary-Scan Technology, Justification, and Test Implementation for Designers 
This paper provides practical insight for designers on the merits, design, and test implementation of Boundary-Scan Technology.

应用说明 1998-05-27

PDF PDF 29 KB
3070 Increasing Throughput 
There are decisions one can make that causes a Keysight 3070 test program to be slower or faster than what Test Consultant generates automatically. This paper offers many tips about how to optimize your system's performance.

应用说明 1997-03-03

PDF PDF 41 KB
How To Float, or Series, Keysight 3070 DUT Supplies 
The Keysight 3070 development software does an amazing job of calculating the wiring needed to build fixtures. Even so there are occasionally cases which require wiring that the standard Keysight 3070 software can not handle.

应用说明 1997-01-23

PDF PDF 34 KB

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