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Automotive FMCW Radar System Design using 3D Framework for Scenario Modeling 
Automotive Radar Architects can take advantage of Keysight SystemVue’s 3D simulation framework, radar reference designs, and links to MATLAB and T&M equipment to model FMCW radar system scenarios.

Application Note 2015-08-31

MEMS On-wafer Evaluation in Mass Production - Application Note 
This application note describes how to evaluate MEMS elements in the on-wafer stage in order to lower the total production cost in mass production.

Application Note 2015-08-27

Accurate Evaluation of MEMS Piezoelectric Sensor and Actuator using the 4294A - Application Note 
This application brief describes the benefits of using the Keysight 4294A for device characterization of MEMS piezoelectric sensors and actuators, along with its wide variety of analysis functions and features and how it improves design efficiency.

Application Note 2015-08-26

Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note 
Keysight's InfiniiVision Series oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses.

Application Note 2015-08-01

“Shotgunning”, a Bad Fit for Lead-Free Test 
Shotgunning, a common repair technique in functional test, will be negatively affected by lead-free processes. This article explores the technique and draws broad conclusions regarding the impact of lead-free on electronics manufacturing test

Application Note 2015-07-14

PDF PDF 99 KB
Programming with the N937xA PXIe Vector Network Analyzers - Application Note 
This application note discusses the process of developing a C# application using an IVI driver as the programming remote driver for the M937xA PXIe vector network analyzer.

Application Note 2015-07-07

PDF PDF 4.75 MB
Testing Automotive Electronic Parking Brake Controls with the TS-8989 - Application Note 
This application note discusses the configuration of a typical Keysight TS-8989 PXI Functional Test System for testing automotive electronic parking brake controls.

Application Note 2015-05-11

Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note 
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

Application Note 2015-05-01

PDF PDF 2.46 MB
Characterization of PCB Insertion Loss with a New Calibration Method - Application Note 
In this application note a new method for characterizing PCB loss by using AFR with 1X Open fixtures is proposed.

Application Note 2015-03-26

PDF PDF 700 KB
Automated X-Ray Inspection System Keysight Technologies - Technical Overview 
This is a technical datasheet. Keysight has developed a sealed ultra-high vacumn X-ray tube that provides stable output throughout a significantly long life.

Application Note 2015-03-24

PDF PDF 644 KB
Debug Automotive Designs Faster with CAN-dbc Symbolic Trigger and Decode - Application Note 
Learn about CAN-dbc symbolic triggering and how to improve debug of your automotive designs using an oscilloscope.

Application Note 2015-03-13

The Role of a Compact Low Voltage FE-SEM in MEMS Analysis - Application Note 
Overview of the 8500 high resolution imaging for MEMS devices without the need for metal coating to dissipate charge buildup.

Application Note 2015-03-11

PDF PDF 5.66 MB
Oscilloscopes to Test and Characterize Today’s Power Supplies - Application Brief 
InfiniiVision 3000 and 4000 X-Series oscilloscopes with the Power Measurements option provide automatic power supply characterization measurements that help you optimize your power supply designs.

Application Note 2015-02-20

Improving Speed and Accuracy in the Testing of BTS Filters and Duplexers - Application Brief 
This application brief explains why the E5080A ENA Series Network Analyzer is the ideal solution for BTS filters and duplexers manufacturing test.

Application Note 2015-02-11

CAN FD Eye-Diagram Mask Testing - Application Note 
Eye-diagram mask testing is used in a broad range of today’s serial bus applications. Learn more about eye-diagram testing for higher speed buses such as the new CAN FD serial bus.

Application Note 2015-02-05

Time Domain Reflectometry Theory - Application Note 
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Application Note 2015-01-30

Using Oscilloscope Segmented Memory for Serial Bus Applications - Application Note 
Learn how to use an oscilloscope's segmented memory to capture a longer time span and more serial packets while still digitizing at a high sample rate.

Application Note 2015-01-28

Detecting Tailgating Boards on the i3070 Inline In-Circuit Tester - Application Note 
Tailgating sensor improvements on the Keysight i3070 Series 5i inline in-circuit tester help to further minimize damages due to operator and upstream loading errors.

Application Note 2015-01-05

PDF PDF 437 KB
Non-Contact Measurement Method for 13.56 MHz RFID Tags – Application Note 
For engineers working in RFID antenna design and test, this note discusses a non-contact method for measuring resonant frequencies of RFIDs using a network analyzer.

Application Note 2014-12-05

PDF PDF 607 KB
The Impact of Electro-Thermal Coupling on HBT Power Amplifiers 
This paper describes the use of electrothermal simulation to understand, predict, and account for cross-circuit thermal coupling in a commercial HBT power amplifier.

Application Note 2014-10-19

 
Radar Measurements - Application Note 
This application note focuses on the fundamentals of measuring basic pulsed radars and measurements for more complex or modulated pulsed radar systems.

Application Note 2014-08-22

PDF PDF 6.84 MB
Achieving Accurate E-band Power Measurement with Keysight E8486A Waveguide Power Sensors 
E-band spectrum application has been gaining more application interests in the recent years. E8486A addresses the requirement for accurate RF power measurement in the mm-wave applications.

Application Note 2014-08-04

Releasing the “Test Sequence” and “Test” to Production on the Keysight x1149 Boundary Scan Analyzer 
This application note describes how to release test sequences and tests to production when using the Keysight x1149 Boundary Scan Analyzer.

Application Note 2014-08-03

PDF PDF 5.52 MB
Modifying DDR Libraries for Silicon Nail Test Generation on the Keysight x1149 Boundary Scan Analyzer 
This application note describes how to modify DDR libraries to generate silicon nails tests on the Keysight x1149 Boundary Scan Analyzer.

Application Note 2014-08-03

PDF PDF 1.57 MB
Simulating Envelope Tracking with Advanced Design System Software - Application Note 
This example applies envelope tracking to an example amplifier to show techniques of using Advanced Design System (ADS) for this type of design.

Application Note 2014-08-02

PDF PDF 2.38 MB

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