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Digital Design & Interconnect Standards

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In digital standards, every generational change puts new risks in your path. We see it first hand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of.

Keysight - achieve your best design

Achieve signal integrity in high-speed design with these useful tools, demos, videos and more

 

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The Type-C Revolution Demands Design and Test Innovations Webcast 
Original broadcast February 25, 2016

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USB Type-C Connector Webcast: A Validation Engineer's Dream! 
Original broadcast February 17, 2016

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MIPI – Overcome Test Challenges to Ensure Interoperability for your PHY Webcast 
Original broadcast June 23, 2015

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Validate PCIe® Power Saving with L1 Substate Analysis Webcast 
Original broadcast June 17, 2015

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DisplayPort 1.3 – PHY Layer Test Requirements Webcast 
Live broadcast May 27, 2015; 10am PT / 1pm ET

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Overcoming MIPI M-PHY Protocol Layer Test Challenges Webcast 
Live broadcast August 26, 2014; 10am PT / 1pm ET

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Physical Layer design challenges for PCI Express® 3.0 and 2.0 designs 
You will learn advanced techniques for PCI Express phy-layer validation covering the latest PCIe 3.0 specification requirements as well as practical extensions to PCIe 2.0 and 1.1 designs. This seminar analyzes transmitter and receiver performance.

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