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Keysight EEsof EDAユーザ向けメールマガジン -- しみゅレター 
キーサイトEDAソリューションの技術情報やアプリケーション情報を定期的にお知らせするEメールニュースレターです。

ニュースレター 2016-07-27

 
Follow Keysight EEsof EDA on Twitter! 
Twitter enables you to keep current on news and updates with Keysight EEsof through the exchange of quick, frequent answers to one simple question: What are you doing?

ニュースレター 2016-07-14

 
Signal Integrity Tips and Techniques Using TDR, VNA and Modeling - Article Reprint  
Time and frequency domain analyses for simulation and measurements provide quick solutions for characterizing signal losses and identifying elements that control performance.

記事 2016-03-31

PDF PDF 644 KB
The PDN Bandini Mountain and Other Things I Didn’t Know I Didn’t Know 
"In engineering, it's what you don't know you don't know that can ruin your day and keep you awake at nights." From Bert Simonovich's practical design notes.

雑誌記事 2016-03-30

 
Solving Electronics Design Challenges of an Aerospace System with EDA Tools  
Microwave Product Digest featured article on solving electronics design challenges of an aerospace system using EDA tools.

記事 2016-03-22

 
Minimizing Design Risk, Shortening Development Time of a Digital Transmission System 
Powerful design and simulation software provides valuable insights to help uncover and solve difficult design challenges at every stage of the design process.

事例紹介 2015-12-15

PDF PDF 1.17 MB
Keysight EEsof EDA makes it easy to get back to school—at least virtually 
Rick Nelson, executive editor of Evaluation Engineering, visited Keysight Technologies and had this to say about Keysight EEsof EDA.

記事 2015-09-11

 
Challenges extend from simulation to compliance 
Tami Pippert, Keysight Technologies’ high-speed digital marketing program manager, elaborates on how Keysight is enhancing its model generation, simulation, and data analysis technologies.

記事 2015-07-08

 
Improving IBIS-AMI Model Accuracy: Model-to-Model and Model-to-Lab Correlation Case Studies - Articl 
This DesignCon 2014 paper presents case studies for model-to-model & model-to-lab correlation methods & compares favorable/unfavorable factors for both methods. 10G, 11.5G and 23G SerDes data are used as examples.

記事 2015-04-02

PDF PDF 3.34 MB
Modeling, Extraction and Verification of VCSEL Model for Optical IBIS AMI 
A technique of modeling and extraction of VCSEL devices for IBIS-AMI has been proposed.

記事 2014-08-04

PDF PDF 1.18 MB
Touchstone v2.0 SI/PI S-Parameter Models for Simultaneous Switching Noise (SSN) Analysis of DDR4 
This article reprint presents a methodology to setup and analyze Simultaneous Switching Noise for DDR4 applications using Touchstone v2.0 models.

記事 2014-08-04

PDF PDF 8.20 MB
Mechanism of Jitter Amplification in Clock Channels 
In this paper. jitter amplification in clock channels is analyzed analytically using the techniques developed in "Frequency domain analysis of jitter amplification in clock channels."

記事 2014-08-04

PDF PDF 715 KB
De-Mystifying the 28 Gb/s PCB Channel: Design to Measurement 
This paper demonstrates a design methodology for 28 Gb/s SERDES channels using Xilinx Virtex-7 Tx to show the required trade-offs that enable robust performance that is easy to verify with measurement.

記事 2014-08-04

PDF PDF 2.84 MB
IBIS AMI Modeling of Retimer and Performance Analysis of Retimer based Active Serial Links 
This paper presents a novel retimer modeling approach based on IBIS-AMI to capture the performance of a retimer that operates up to 15 Gbps.

記事 2014-08-04

PDF PDF 1.88 MB
Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale - Application Note 
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

記事 2014-06-14

PDF PDF 515 KB
Tips and Advanced Techniques for Characterizing a 28 Gb/s Transceiver 
This paper shows the right combination of measurement and simulation techniques, and how the previously existing barriers for using de-embedding have been eliminated.

記事 2014-02-18

PDF PDF 3.82 MB
S-parameters Without Tears 
This article explains s-parameter theory and shows how to create accurate, delay-causal, and passive time-domain models by combining band-limited s-parameter data with knowledge about the physical characteristics of a component.

雑誌記事 2010-01-25

 
Keysight バックプレーンのビアの実用的な解析方法 

事例紹介 2009-10-20

PDF PDF 1.82 MB
Signal Integrity Simulation of PCI Express Gen 2 Channel 
Article reprint from XrossTalk Magazine, Janurary 2009, author Jason Boh.

記事 2009-03-23

PDF PDF 1.81 MB
Inphi Delivers Memory Interface Chip for DDR3-1600 Using Advanced Design System 
This Success Story details how Inphi delivered memory interface chip for DDR3-1600 using Keysight’s Advance Design System (ADS).

事例紹介 2009-03-12

PDF PDF 196 KB
Signal Integrity Analysis and Simulation Tools include IBIS Models 
This Article describes the types of models that need to be taken together for high-speed signal integrity analysis, and illustrates their use in a simulation of a high-speed memory circuit.

記事 2004-09-01

PDF PDF 411 KB