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Boundary Scan Helps EMS Companies Cut Test Costs and Increase Revenues 
Electronics Manufacturing Services (EMS) providers can utilize boundary-scan to reduce test cost expenses and also generate additional revenue opportunities.

Notes d’application 2003-03-01

PDF PDF 242 KB
What to Consider When Selecting the Optimal Test Strategy 
This paper addresses several issues for selecting the optimal inspection strategy, presenting data from many studies that Keysight has performed in the quest to find the optimal test / inspection strategy.

Notes d’application 2003-03-01

PDF PDF 175 KB
Using Boundary Scan to Link Design and Manufacturing Test 
By leveraging boundary-scan tests generated in Design and re-using them at Manufacturing Test, manufacturers can produce long-term benefits in terms of lower costs, greater efficiencies and higher quality products.

Notes d’application 2003-03-01

PDF PDF 502 KB
Ground Bounce Basics and Best Practices 
This article offers a description of the physical properties that result in ground bounce during board test.

Notes d’application 2003-01-28

PDF PDF 138 KB
Design for Testability - Test for Designability 
This paper addresses testability considerations, both physical and logical, and focuses on both the new constraints and the new freedoms of modern manufacturing test in the ever-changing challenge.

Notes d’application 2003-01-28

PDF PDF 852 KB
System Issues in Boundary-Scan Board Test 
While Boundary-Scan is a powerful test tool, test engineers are finding out that yesterday's DFT rules and test approaches may actually be detrimental to successfully testing systems on a board.

Notes d’application 2003-01-28

PDF PDF 37 KB
New Features in Version 5.0 Software for 3070 
Typically, when Keysight's Manufacturing Test Division introduces a new software revision for its flagship 3070 In-Circuit Tester, it only communicates with customers about the major new features.

Notes d’application 2003-01-28

PDF PDF 84 KB
Keysight 3070 Now Powered by Industrial PC Controllers 
The Keysight 3070 is now controlled by PCs similar to others used in your production and office environment lowering system administration and learning costs.

Notes d’application 2003-01-23

PDF PDF 207 KB
Connecting a UPS to a 3070 Controller 
This paper describes how to connect a UPS to the 3070 testhead controller. It uses the Advanced Power Conversion Smart-UPS with PowerChute Plus software.

Notes d’application 2003-01-07

PDF PDF 87 KB
A New Process for Measuring and Displaying Board Test Coverage 
Written by Kenneth P. Parker, Keysight Technologies. First presented at Apex 2003, Anaheim, California.

Notes d’application 2003-01-01

PDF PDF 116 KB
When to Use AOI, When to Use AXI, and When to Use Both 
by Stig Oresjo, senior test strategy consultant at Keysight Technologies.

Notes d’application 2002-12-01

PDF PDF 70 KB
Optimizing Power Product Usage to Speed Design Validation Testing (AN 1434) - Application Note 
This 15-page application note presents methods and techniques to decrease setup time and test time.

Notes d’application 2002-11-22

Preparing a .cc File for Export to Test Link 
This procedure describes the process of converting ECAD data into a form that can be used by Test Link.

Notes d’application 2002-10-16

PDF PDF 70 KB
UNIX vs. Windows Differences for 3070 Users 
This documentation serves as a PC transition guide to help existing 3070 customers migrate from the Unix platform to the PC platform.

Notes d’application 2002-09-19

 
Windows & Unix Feature Comparison 
The Windows & Unix 3070 Feature Comparison document provides a detailed listing of features translated to the Windows based 3070 from the Unix based 3070.

Notes d’application 2002-07-31

PDF PDF 71 KB
3070 In System Programming (ISP) Family 
On Board Programming, Bottom Line Benefits

Notes d’application 2002-07-25

PDF PDF 200 KB
Remote Network Connections Creation for the Operator Logon 
Operator logon on the Keysight 5DX Series II System is limited, in that it does not allow Operator to make network connections that are required for sending images and res files to the PLR workstation.

Notes d’application 2002-06-30

 
Maintaining Power with Dual Stage Fixtures 
Occasionally there is a need to do dual stage fixturing where power must be maintained during parts of both stages.

Notes d’application 2002-06-07

PDF PDF 48 KB
Using NDFCOL.EXE, the NDF "Line Up the Columns" Utility 
NDFCOL.EXE is a handy little utility that will form neat columns of data in NDF files.

Notes d’application 2002-06-06

 
Obtaining a Listing of Applications on Series II Systems 
There is currently no easy way to obtain a list of all resident applications on a 5DX System or TDW. It is difficult to match panel name with hash name and see when the application was last updated.

Notes d’application 2002-06-01

 
Sampling on the Keysight 5DX 
Sampling Mode allows test coverage to be optimized with line speed. This document explore the setup procedure for the Keysight 5DX for sampling.

Notes d’application 2002-05-08

 
Keysight 3070 Outsource Series Pay-Per-Use Board Test System 
With a Keysight 3070 Outsource Pay-Per-Use System, you can define your system according to the products you have to test.

Notes d’application 2002-03-08

PDF PDF 247 KB
PLD Programming on the Keysight 3070 Using the PLD ISP Product 
In-System Programmable PLDs are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.

Notes d’application 2002-02-26

PDF PDF 242 KB
Effective Multitap Transformer Testing Using a Scanner (AN 1224-5) 
This Application Note shows an effective multi-tap transformer measurement using a scanner and the Keysight 4263B LCR Meter.

Notes d’application 2001-11-05

The Life of a 5DX Inspection C# File 
The {Hashed Panel Name}.C# file is basically cad information about a panel program. It is used in conjunction with various utilities to overlay cad data on images or provide cad data for filters.

Notes d’application 2001-10-16

PDF PDF 97 KB

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