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Control & Automation of Instruments & Systems

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A Cost-effective Way to Test Sub 1-GHz Wireless Modules - Application Note 
This app note describes a Keysight low cost RF test solution that addresses the sub 1-GHz wireless test needs.

Application Note 2015-10-22

PDF PDF 1.35 MB
Solutions for RF Power Amplifier Test - Application Note 
This “Solutions for RF Power Amplifier Test” app note gives insight into making faster, repeatable RF power amplifier tests with envelope tracking and digital pre-distortion.

Application Note 2015-09-30

Optimize Power Source Integrity Under Large Load Transients - Application Note 
This application note discusses several ways to achieve the lowest possible voltage drop by selecting optimal load leads and power supplies and using local bypassing.

Application Note 2015-07-31

PDF PDF 1.37 MB
81150A and 81160A Pulse Function Arbitrary Noise Generators - Application Note 
The Keysight 81150A and 81160A are pulse function arbitrary noise generators in different speed classes. They permit maximum test efficiency in a wide spectrum of applications.

Application Note 2015-06-18

Evaluating Battery Run-Down with the N6781A 2-Quadrant Source/Measure Unit and the 14585A 
This application note will describe in detail the procedure on evaluating battery run down to easily and accurately evaluate the battery and battery-powered device.

Application Note 2015-05-29

A Flexible Test Solution for Internet of things (IoT) devices with ASK/FSK Modulation - App Note 
Use Keysight’s basic RF instruments to measure and analyze ASK/FSK modulated signals commonly used in a variety of products and systems, ranging from personal consumer electronics and automatic meter reading, to giant industrial devices.

Application Note 2015-04-09

Power-Consumption Measurements for LTE User Equipment - Application Note 
This application note focuses on determining how certain parameters affect a specific smartphone's power consumption and figure out how to adjust the parameters to improve battery life.

Application Note 2014-08-04

PDF PDF 360 KB
Solar Cell and Module Testing 
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Keysight products and solutions.

Application Note 2009-12-07

Using IVI For Your Instrument Driver - Application Note 
This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice

Application Note 2008-11-14

Generating Narrow Pulses with a Function Generator  
Testing basic digital signals, such as triggers, clock signals, and logic control, doesn't always require the performance of a dedicated pulse generator.

Application Note 2008-04-16

Using LXI to Boost Throughput in Semiconductor Manufacturing 
This document is a case study that discusses the successful customer implementation of a Keysight LXI solution for a multinational semiconductor manufacturer

Application Note 2007-04-25

PDF PDF 234 KB
Cathodic Protection of Steel in Concrete Using LXI 
This document discusss Cathodic protection as a remarkable technique that can substantially extend the life of a building structure by impeding corrosion.

Application Note 2007-04-25

PDF PDF 390 KB
Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly 
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.

Application Note 2007-02-23

Using Synthetic Instruments in Your Test System (AN 1465-24) 
This note represents a brief history of SI, compares a rack-and-stack system to an SI-based system, descibes the initial applications of SIs, and illustrates the emulation of conventional instruments with SIs.

Application Note 2006-08-28

N6700 Modular Power System: Determining Specifications when Paralleling Outputs (AN 1560) 

Application Note 2005-07-27

Innovative Power Supplies Save Rack Space 
In the past, many programmable system DC power supplies in the medium power range (500W to 2kW) have been packaged in 2U-high (2-EIA rack units) and even 3U, full rack width chassis...

Application Note 2004-12-16

 
Increase Automotive ECU Test Throughput (AN 1505) 

Application Note 2004-10-22

Simplify Multiple Bias Voltage Sequencing and Ramping for PC Motherboard Test (AN 1504) 

Application Note 2004-10-22

Increase DC-input Battery Adapter Test Throughput by Several-fold (AN 1506) 

Application Note 2004-10-22

How to use the Keysight N6700 Modular Power System to replace a Keysight 662xA (AN 1467)  
This is a high-level overview to help current 662xA owners easily convert to a Keysight N6700.

Application Note 2004-08-02

Multi-channel signals with the Keysight E1440A 
The attached Application Note is an example describing the test of vehicle receivers used in Decca-type location systems that require a number of synthesizers to simulate the signals from a number of fixed transmitters. The frequencies, which are multiples of the master transmitter frequency...

Application Note 2004-02-20

PDF PDF 17 KB
Multi-channel Setup with Programmable Inter-channel Phase 
In the past, the problem has been to generate a number of synchronous signals with programmable phase difference. The attached Product Note explains how this can be solved by master/slaving a number of Keysight 3324A synthesized function generators.

Application Note 2004-02-20

PDF PDF 10 KB
Optimizing Power Product Usage to Speed Design Validation Testing (AN 1434) - Application Note 
This 15-page application note presents methods and techniques to decrease setup time and test time.

Application Note 2002-11-22

Testing Uninterruptible Power Supplies Using Keysight 6800 Series ac Power Source/Analyzers 
This Product Note describes how Keysight ac sources can be used to help test uninterruptible power supplies in many different environments, including research and development, manufacturing, and incoming inspection.

Application Note 2001-01-16

PDF PDF 430 KB
Increasing dc Power Supply Test System Throughput 
This Product Note describes some of the ways this new family of electronic loads can be used to achieve maximum throughput for your dc power supply test system.

Application Note 2000-05-01

PDF PDF 157 KB

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