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The Benefits of Updating Your 3499A/B/C Switching System to the 34980A Switch/Measure Unit 
This application note will describe differences and advantages of the new 34980A as compared to the 3499A/B/C.

Application Note 2013-08-15

Solutions for Testing NFC Devices 
Using an accurate, configurable and versatile test bench with qualified test tools to address test challenges throughout the NFC product development cycle

Application Note 2013-07-29

No Programming Required: Multisignal Capture and Analysis DMMs - Application Note 
This measurement brief describes how to use a DMM to make multisignal captures and analysis without programming.

Application Note 2013-05-01

Make High Sensitivity, Wide Dynamic Range Current Measurement - Application Note 
The new N2820A Series high-sensitivity current probes from Keysight Technologies address the need for high-sensitivity current measurements with a wide dynamic range.

Application Note 2013-02-26

Optimize burn-in test with the Keysight 34980A multifunction switch/measure unit apnote overview 
This application overview will discuss the complexities of burn-in test based on the Keysight 340980A switch/measure unit

Application Note 2013-01-31

PDF PDF 440 KB
Test-System Development Guide: A Comprehensive Handbook for Test Engineers 
Test-System Development Guide

Application Note 2012-05-07

6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems - Application Note 

Application Note 2012-04-30

Using .NET Methods to Add Functionality to IVI-COM Drivers  
This application note discusses the use of .NET methods to add functionality to IVI-COM drivers to access a deeper set of instrument functionality with minimal programming.

Application Note 2012-03-01

Ground Resistance Measurement with Smart Ohm - Application Note 
Smart Ohm function can help user to measure accurate resistance with the presence of leakage current or residual voltage.

Application Note 2011-10-13

Stray Voltage Testing Made Easy With U1272A - Application Note 
This application note presents an alternative tool for identifying the presence of stray voltages: the Keysight U1272A handheld digital multimeter (HH DMM.)

Application Note 2011-10-13

PDF PDF 212 KB
Solar Cell and Module Testing 
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Keysight products and solutions.

Application Note 2009-12-07

Getting Test Programs Up and Running Quickly with Driver Tracing and I/O Monitor 
This note helps you create an example program and then shows you how to use driver tracing and IO Monitor to examine, verify and troubleshoot I/O activity in IVI-COM drivers.

Application Note 2009-05-05

Tips in Using Keysight GPIB Solutions in National Instrument’s LabVIEW Environment- Application Note 
Tips for using Keysight GPIB solutions in National Instrument’s LabVIEW environment.

Application Note 2009-03-04

Application Note: Tips & Tricks for Using USB, GPIB, & LAN (AN 1465-20) 
Application Note: Tips & Tricks for Connectivity

Application Note 2009-01-22

Troubleshooting Three-Phase AC Motors with U1210 Series Handheld Clamp Meters 
In this application note, you will discover the common causes of a three-phase AC motor failure and how to diagnose them with Keysight U1210 Series Handheld Clamp Meters, thereby preventing costly replacement.

Application Note 2009-01-13

Using IVI For Your Instrument Driver - Application Note 
This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice

Application Note 2008-11-14

Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

Keysight LXI Compliant E5818A Trigger Box - Understanding Its Capability and Use Cases 
Learn more about the LXI Compliant E5818A trigger box and its capabilities through this white paper. You will also discover how to create a precise time synchronization system over LAN or enhance trigger operations applications.

Application Note 2008-07-25

PDF PDF 424 KB
Small Engine Dynamometer Testing - Application Note 
Performing Dynamometer Testing on Combustion Engines

Application Note 2008-06-01

PDF PDF 443 KB
High Node Count Fixturing Solutions for Keysight Short-Wire Test Fixtures 
This paper discusses problems encountered in building large, high node count vacuum actuated test fixtures for the Keysight 3070 family of board test systems.

Application Note 2008-04-30

PDF PDF 67 KB
Generating Narrow Pulses with a Function Generator  
Testing basic digital signals, such as triggers, clock signals, and logic control, doesn't always require the performance of a dedicated pulse generator.

Application Note 2008-04-16

Building Hybrid Test Systems Part 1: Laying the groundwork for a successful transition 

Application Note 2008-03-19

PDF PDF 270 KB
Tips for Optimizing Test System Performance in Linux Soft Real-Time Applications (AN 1465-31) 
This application note offers several tips for optimizing the soft real-time performance of off-the-shelf Linux systems.

Application Note 2008-02-19

PMU Troubleshooting Using U2531A Simultaneous Data Acquisition 
This application note describes how PMU troubleshooting can be performed using the U2500A Series Simultaneous Sampling DAQ.

Application Note 2007-11-14

PDF PDF 158 KB
Using Linux to Control USB Instruments (AN 1465-30) - Application Note 
Keysight’s USB instruments are compatible with USBTMC, a vendor-independent device class for test and measurement resources. This application note explains how USBTMC works and how you can use the generic services to control your USB instruments.

Application Note 2007-11-07

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