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Basics & Measurement Fundamentals

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Network Analysis Basics - Applying Error Correction To Network Analyzer Measurements (AN 1287-3) 
Only perfect test equipment would not need correction. Imperfections exist in even the finest test equipment and cause less than ideal measurement results.

Application Note 2002-03-27

Network Analysis - Balanced and Multiport Device Measurements (1373-2) 
The use of differential components such as surface acoustic wave (SAW) filters and differential amplifiers is becoming more common in the wireless industry because they have greater performance than their single-ended counterparts.

Application Note 2002-03-08

PDF PDF 1.09 MB
Keysight 3070 Outsource Series Pay-Per-Use Board Test System 
With a Keysight 3070 Outsource Pay-Per-Use System, you can define your system according to the products you have to test.

Application Note 2002-03-08

PDF PDF 247 KB
8 Hints for Debugging and Validating High-speed Buses 
8 Hints for Debugging High-speed Buses

Application Note 2002-03-05

PDF PDF 2.24 MB
PLD Programming on the Keysight 3070 Using the PLD ISP Product 
In-System Programmable PLDs are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.

Application Note 2002-02-26

PDF PDF 242 KB
Power Supply Testing (AN 372-1) 
An electronic load offers a broad range of operating modes, providing versatile loading configurations needed for characterizing and verifying DC power supply design specifications.

Application Note 2002-02-22

How to use the Keysight 81200 together with Keysight VEE - Application Note 
This attached Product Note shows how to use the Keysight 81200 Data Generator/Analyzer together with Keysight VEE for Signal Integrity Analysis.

Application Note 2002-01-28

PDF PDF 383 KB
Cryogenic On-Wafer Measurement Techniques to 18K 
by Cascade Microtech

Application Note 2002-01-17

PDF PDF 71 KB
Network Analysis Basics - Understanding and Improving Dynamic Range (1363-1) 
This Application Note explains that achieving the highest possible network analyzer dynamic range is extremely important when characterizing many types of microwave devices, and in some cases the key factor in determining measurement performance.

Application Note 2001-11-01

The Life of a 5DX Inspection C# File 
The {Hashed Panel Name}.C# file is basically cad information about a panel program. It is used in conjunction with various utilities to overlay cad data on images or provide cad data for filters.

Application Note 2001-10-16

PDF PDF 97 KB
Synchronizing 3070 System Clocks 
These instructions are for synchronizing the system clocks of several network-connected UX workstations in the absence of an existing timeserver.

Application Note 2001-09-27

PDF PDF 66 KB
Network Analysis - Balanced Measurement Example: SAW Filters (1373-5) 
SAW filters are commonly used in wireless communication products because of their very sharp response characteristics, relatively low insertion loss, and low cost.

Application Note 2001-09-17

Network Analysis - Balanced Measurement Example: Baluns (1373-6) 
Differential circuits are becoming more widely used in RF circuits for the same reasons that they have been used for years in lower frequency analog circuits.

Application Note 2001-09-17

Network Analysis Basics - 10 Hints for Making Better Network Analyzer Measurements (AN 1291-1B) 
This Application Note contains hints to help you understand and improve your use of network analyzers, and a summary of network analyzers and their capabilities.

Application Note 2001-09-17

3070 Series 3 Flash70 Programming Guide 
This guide contains information about the procedures, tasks, and syntax required to perform flash programming with HP 3070 test systems.

Application Note 2001-09-12

PDF PDF 1.85 MB
Network Analysis - Balanced Measurement Example: Differential Amplifiers (1373-7) 
This Application Note describes Keysight balanced-measurement solutions they have developed that offer the most accurate method available for measuring differential RF circuits.

Application Note 2001-09-10

3070 Board Tests are Reliable, Repeatable and Transportable. Here's Why. 
It would take a very long paper to discuss all of the factors that make Keysight 3070 tests so reliable, repeatable, and transportable. This paper selects a few of the important ones.

Application Note 2001-08-15

PDF PDF 223 KB
Advanced impedance measurement capability of the RF I-V method (AN 1369-2) 
This application note describes the difference between the network analyzer and impedance analyzer for the measurement principle and actual measurement performance.

Application Note 2001-07-26

Comparing AOI and AXI 
Choosing the right technology requires looking at board mix, capital budget and other business considerations. But most of all, you need to understand the typical characteristics of each technology.

Application Note 2001-07-25

PDF PDF 42 KB
Version 7.x ASAP Best Practices  
In an effort to standardize programming practices for the Keysight 5DX, Keysight has created a set of procedures representing 5DX "best practices" that address various aspects of the programming process.

Application Note 2001-07-25

 
Digital Basics for Cable Television Systems 
If you install, upgrade, or maintain digital or mixed digital/analog systems, this book is your complete guide to this new world.

Application Note 2001-07-19

 
In-System Programming on the Keysight 3070 
In-System Programmable devices are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.

Application Note 2001-07-02

PDF PDF 205 KB
Tying a Power Supply to Multiple Boards in a Panel 
If you have a situation with multiple boards on a panel, and you need to wire one or more power supplies to each board, you often can wind up with problems wiring power and ground. Usually, you'll see warnings of the type FXT66.

Application Note 2001-06-12

PDF PDF 16 KB
Writing Flash Memory with Keysight 3070 Systems 
Flash memory is traditionally programmed on PROM programmers, but some manufacturers report a one percent damage rate due to the extra handling steps required!

Application Note 2001-05-18

PDF PDF 31 KB
Reducing Process Defect Escapes with Vectorless Test 
Process defects that escape in-circuit test lead at best to increased repair costs, and at worst to a "bone pile1" problem.

Application Note 2001-05-17

PDF PDF 512 KB

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