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Basics & Measurement Fundamentals

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RF & Microwave Measurement Fundamentals 
This 4-day class studies the principles of microwaves on transmission lines and power measurements, signal sources, mixers and modulation techniques, and the use of signal types in test applications.

Classroom Training

 
5 Ways Your DMM is Lying - Webcast 
Original broadcast January 21 2016

Webcast - recorded

 
Unlocking Insights with Improved Sensitivity and Noise Measurements Webcast 
Original broadcast January 13, 2016

Webcast - recorded

 
Power Integrity Challenges, Measurements and Labs Webcast 
Live broadcast February 23, 2016; 10am PT / 1pm ET

Webcast

 
RF and Microwave Back to Basics Education Series 
Webcast Series

Webcast

 
Power Integrity Measurements Webcast – Choosing the Right Tools 
Live broadcast January 6, 2016; 10am PT/1pm ET

Webcast - recorded

 
Fundamentals of Wavelength Dependent Optical Component Testing Webcast 
Original broadcast September 29, 2015

Webcast - recorded

 
Fundamentals of Low Current and Ultra-High Resistance Measurement Webcast 
Original broadcast April 14, 2015

Webcast - recorded

 
Introducing the New Infiniium V-Series High-Performance Oscilloscope Webcast 
Original broadcast April 14, 2015

Webcast - recorded

 
PCI Express 3.0 Compliance - Successfully Navigating the Standard Webcast 
Original broadcast May 7, 2013

Webcast - recorded

 
Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast 
Original broadcast May 7, 2013

Webcast - recorded

 
Innovations in EDA: High Performance Digital Pre-Distortion (DPD) for Wideband Systems 
Original broadcast Sept 1, 2011

Webcast - recorded

 
Innovations in EDA: Accelerating Radar/EW System Design using Wideband Virtual Scenarios Webcast 
Original broadcast April 4, 2013

Webcast - recorded

 
Millimeter Signal Measurements: Best Practices, Solutions, and Accuracy Webcast 
Original broadcast Jan 26, 2012

Webcast - recorded

 
Beyond CMOS vs. GaAs – Finding the Best Technology Mix for a Handset PA Webcast 
Original broadcast June 13, 2013

Webcast - recorded

 
Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs) 
Original broadcast Feb 2, 2012

Webcast - recorded

 
Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro 
Originally broadcast Jan 27, 2011

Webcast - recorded

 
Signal Generator Fundamentals and New Applications Webcast 
Original broadcast January 30, 2013

Webcast - recorded

 
Signal Analyzer Fundamentals and New Applications Webcast 
Original broadcast March 13, 2013

Webcast - recorded

 
Setting Up IC-CAP WaferPro For On-Wafer Measurements 
Original broadcast June 22, 2011

Webcast - recorded

 
Analyze Agile or Elusive Signals Using Real-time Measurement and Triggering Webcast 
Original broadcast April 24, 2013

Webcast - recorded

 
The Importance and Value of PXI Multi-Vendor Interoperability 
Original broadcast March 28, 2012

Webcast - recorded

 
Metrology Events 
Attending events that focus on metrology let you network and learn at the same time.

Tradeshow

 
3070 Boundary Scan 
Learn concepts of Boundary-Scan technology. TAP (test access port), the functionality of registers (BYPASS, boundary, IDCODE), and the structure of the "boundary-cell" are described.

Classroom Training

 
Fundamentals of CDMA 
This 2-day course covers the CDMA technology - its advantages and limitations.

Classroom Training

 

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