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制造与生产测试

随着世界的迅速转变,市场上的新技术不断涌现,消费电子工业医疗行业的工程师纷纷在产品设计中融入了最新的技术。变化的速度越来越快,而产品创新的脚步也日益扩大。

不过,有些事情没有改变,例如您仍然需要降低产品和设计成本,从而增加利润;加快产品上市速度,以便满足消费者不断增长的期望――性能卓越的现代化产品,可以不断演进升级。

是德科技可以为您提供帮助。凭借市场领先的硬件和软件,以及超过 75 年的测试与测量经验,我们能够帮助您解决最棘手的测试挑战,让您保持领先优势。

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是德科技 Mini 在线测试仪 
是德科技 Mini 在线测试仪

应用说明 2016-04-06

Boundary Scan DFT Guidelines for Good Chain Integrity and Test Coverage - Application Note 
This application note provides some key guidelines to enable good design for testability using boundary scan.

应用说明 2016-01-21

PDF PDF 1.99 MB
使用 Medalist VTEP v2.0-VTEP、iVTEP 和 NPM 使测试范围最大化 
使用 Medalist VTEP v2.0-VTEP、iVTEP 和 NPM 使测试范围最大化

应用说明 2015-12-22

Configuring Lattice BSCAN2 Scan Path Linker on Keysight x1149 Boundary Scan Analyzer - App Note 
A boundary scan linker mux device links multiple boundary scan chains into one single chain or multiple chain configurations. Find out how to configure Lattice BSCAN2 scan path linkers in this paper.

应用说明 2015-10-30

PDF PDF 6.31 MB
“Shotgunning”, a Bad Fit for Lead-Free Test 
Shotgunning, a common repair technique in functional test, will be negatively affected by lead-free processes. This article explores the technique and draws broad conclusions regarding the impact of lead-free on electronics manufacturing test

应用说明 2015-07-14

PDF PDF 99 KB
Implementing Cover-Extend Test on Keysight x1149 Boundary Scan Analyzer - Application Note 
This application note discusses the process of test generation on the x1149 boundary scan analyzer with Cover-Extend Technology, and suggestions on fixturing in order to successfully implement CET.

应用说明 2015-05-26

PDF PDF 1.67 MB
Shopfloor Operation of the Keysight i1000 In-Circuit Test Software - Application Note 
This application note helps developers of the shopfloor client to fully understand the format and behavior of the i1000 software files to enable communication between the i1000 and the client.

应用说明 2015-04-16

PDF PDF 1.24 MB
Detecting Tailgating Boards on the i3070 Inline In-Circuit Tester - Application Note 
Tailgating sensor improvements on the Keysight i3070 Series 5i inline in-circuit tester help to further minimize damages due to operator and upstream loading errors.

应用说明 2015-01-05

PDF PDF 437 KB
使用 i1000D SFP 在线测试系统 测试汽车保险丝盒 
使用 i1000D SFP 在线测试系统 测试汽车保险丝盒

应用说明 2014-08-06

Modifying DDR Libraries for Silicon Nail Test Generation on the Keysight x1149 Boundary Scan Analyzer 
This application note describes how to modify DDR libraries to generate silicon nails tests on the Keysight x1149 Boundary Scan Analyzer.

应用说明 2014-08-03

PDF PDF 1.57 MB
Offline vs Inline: Shifting to automated inline ICT - White Paper  
This paper discusses the benefits of adopting an inline in-circuit test strategy for electronics manufacturers looking to increase product quality and reliability while ensuring optimal ROIC.

应用说明 2014-05-14

High Node Count Fixturing Solutions for Keysight Short-Wire Test Fixtures 
This paper discusses problems encountered in building large, high node count vacuum actuated test fixtures for the Keysight 3070 family of board test systems.

应用说明 2008-04-30

PDF PDF 67 KB
In-circuit Testing of Low Voltage Devices 
Core technical document summarizing issues regarding the testing of low voltage devices on the 3070 and i5000, including updated Safeguard information.

应用说明 2005-05-25

PDF PDF 172 KB
Test and Inspection as Part of the Lead-free Manufacturing Process 
The paper addresses issues that will impact defect levels and defect spectrum during the transition to lead-free manufacturing. It also addresses different test and inspection systems’ readiness to test lead-free printed circuit board assemblies.

应用说明 2005-02-22

PDF PDF 421 KB
The Importance of Test and Inspection When Implementing Lead-Free Manufacturing 
Many papers, articles, and studies have been written about process issues, reliability issues, repair issues, and the merits of different alloys. This paper addresses the impacts on test and inspection when going lead-free.

应用说明 2004-08-20

PDF PDF 260 KB
Using Lead-Free PCB Finishes at Manufacturing In-circuit Test Stage 
The purpose of this document is to share experiences and educate engineers regarding different PCB surface finishes and the specific changes required in the PCB build process to allow for ICT.

应用说明 2004-08-08

PDF PDF 102 KB
Test Coverage: What Does It Mean when a Board Test Passes? 
Originally presented at the 2002 International Test Conference -- Characterizing board test coverage as a percentage of devices or nodes having tests does not accurately portray coverage, especially in a limited access testing environment.

应用说明 2003-07-28

PDF PDF 266 KB
Testing Transformers on Unpowered Systems 
This paper explains how to test basic analog parts, using unpowered systems.

应用说明 2003-03-21

PDF PDF 10 KB
What to Consider When Selecting the Optimal Test Strategy 
This paper addresses several issues for selecting the optimal inspection strategy, presenting data from many studies that Keysight has performed in the quest to find the optimal test / inspection strategy.

应用说明 2003-03-01

PDF PDF 175 KB
Using Boundary Scan to Link Design and Manufacturing Test 
By leveraging boundary-scan tests generated in Design and re-using them at Manufacturing Test, manufacturers can produce long-term benefits in terms of lower costs, greater efficiencies and higher quality products.

应用说明 2003-03-01

PDF PDF 502 KB
Boundary Scan Helps EMS Companies Cut Test Costs and Increase Revenues 
Electronics Manufacturing Services (EMS) providers can utilize boundary-scan to reduce test cost expenses and also generate additional revenue opportunities.

应用说明 2003-03-01

PDF PDF 242 KB
Ground Bounce Basics and Best Practices 
This article offers a description of the physical properties that result in ground bounce during board test.

应用说明 2003-01-28

PDF PDF 138 KB
New Features in Version 5.0 Software for 3070 
Typically, when Keysight's Manufacturing Test Division introduces a new software revision for its flagship 3070 In-Circuit Tester, it only communicates with customers about the major new features.

应用说明 2003-01-28

PDF PDF 84 KB
System Issues in Boundary-Scan Board Test 
While Boundary-Scan is a powerful test tool, test engineers are finding out that yesterday's DFT rules and test approaches may actually be detrimental to successfully testing systems on a board.

应用说明 2003-01-28

PDF PDF 37 KB
Design for Testability - Test for Designability 
This paper addresses testability considerations, both physical and logical, and focuses on both the new constraints and the new freedoms of modern manufacturing test in the ever-changing challenge.

应用说明 2003-01-28

PDF PDF 852 KB

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