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Streamline EMC Compliance Testing with Prescan Analysis Tools 
Original broadcasts April 26, 2016

網路廣播 -- 存檔

 
DOCSIS 3.1 Signal Generation and Analysis Solution Webcast 
Original broadcast June 25, 2014

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Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs) 
Original broadcast Feb 2, 2012

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Innovations in EDA: IC, Laminate, Package Multi-Technology PA Module Design Methodology 
Original broadcast August 2, 2012

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Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast 
Original broadcast May 7, 2013

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Beyond CMOS vs. GaAs – Finding the Best Technology Mix for a Handset PA Webcast 
Original broadcast June 13, 2013

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Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro 
Originally broadcast Jan 27, 2011

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Setting Up IC-CAP WaferPro For On-Wafer Measurements 
Original broadcast June 22, 2011

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