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Operational Test

Returning a vehicle to service as soon as possible is crucial in operational-level support. To enable rapid identification of faulty subsystems, the versatility of our handheld and portable instruments accelerates troubleshooting at the O-level ― and provides insights that help intermediate- and depot-level teams quickly pinpoint defective modules and components.

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Keysight Veranstaltungs-Webseite für Deutschland 
Willkommen zur neuen Keysight Veranstaltungs-Webseite für Deutschland

Seminar

 
Best practices in implementing boundary scan on limited access boards 
Live broadcast December 18, 2014; 9am PT / 12pm ET

Webcast

 
Boundary Scan Webcast Series 
Live and on-demand webcasts

Webcast

 
Common DFT guidelines for implementing boundary scan on limited access boards webcast 
Original broadcast September 11, 2014

Webcast - recorded

 
Electronic Measurement Events in Europe, Middle East & Africa 
Electronic Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.

Seminar

 
Embedded testing of Intel Haswell and Broadwell chipsets on limited access client boards webcast 
Live broadcast November 13, 2014; 9am PT / 12pm ET

Webcast

 
Extending boundary scan tests to improve test coverage of limited access boards webcast 
Original broadcast September 25, 2014

Webcast - recorded

 
Introduction to the Keysight x1149 Boundary Scan Analyzer Webcast 
Original broadcast August 26, 2014; 9am PT / 12pm ET

Webcast - recorded

 
Maximizing test coverage of multiple limited access boards by linking multiple boundary scan chains 
Original broadcast October 9, 2014

Webcast - recorded

 
Testing DDR on limited access boards using boundary scan silicon nails 
Live broadcast October 30, 2014; 9am PT / 12pm ET

Webcast

 
Testing limited access SSD boards with boundary scan and external instruments webcast 
Live broadcast December 4, 2014; 9am PT / 12pm ET

Webcast