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Improve Your Data Acquisition IQ! 
Live broadcast October 19, 2016; 10am PT / 1pm ET

웹캐스트

 
NFC Automated Device Validation using an Oscilloscope Webcast 
Live broadcast October 18, 2016; 10am PT / 1pm ET

웹캐스트

 
Keysight EEsof EDA Customer Education and Services 
Brief overview of Keysight EDA Customer Education and Services.

교육 자료 2016-07-20

 
Accuracy matters: Calibration Options for Lab Standards Webcast 
Original broadcast May 19, 2016

웹캐스트

 
International Microwave Symposium (IMS) 2016 
May 22-27, 2016; San Francisco, CA

트래이드쇼

 
Power Conversion Efficiency Measurement Methods Webcast 
Original broadcast November 4, 2015

웹캐스트 - recorded

 
Multiport and Multi-site Test Optimization Techniques Webcast 
Original broadcast June 3, 2015

웹캐스트 - recorded

 
DynaFET: Advanced model for GaN/GaAs HEMTs from NVNA measurements and ANNs Webcast 
Original broadcast September 4, 2014

웹캐스트 - recorded

 
Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast 
Original broadcast May 7, 2013

웹캐스트 - recorded

 
Hybrid-Active Load Pull with PNA-X and Maury Microwave 
Original broadcast Jun 12, 2012

웹캐스트 - recorded

 
Setting Up IC-CAP WaferPro For On-Wafer Measurements 
Original broadcast June 22, 2011

웹캐스트 - recorded

 
Fundamentals of Fast Pulsed IV Measurement Webcast 
Original broadcast January 9, 2014

웹캐스트 - recorded

 
MQA: Automating Library Validation 
MQA is the industry standard qualification platform that assists modeling experts and model users to perform comprehensive model qualification with an knowledge-based, rules-driven approach.

세미나 프리젠테이션 2013-10-22

PDF PDF 1.48 MB
Automating SPICE Library Validation 
Recorded webcast and slide set for a Model Quality Assurance (MQA) webcast held on October 22, 2013.

세미나 프리젠테이션 2013-10-22

 
Measurement Based FET Modeling using Artifical Neural Networks (ANN) 
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.

세미나 프리젠테이션 2012-02-07

PDF PDF 2.51 MB
Setting up IC-CAP WaferPro for On-Wafer Measurements 
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.

세미나 프리젠테이션 2011-06-22

PDF PDF 3.07 MB
IC-CAP User Training 
This 3-day course will show device modelers how to use Keysight EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations.

교육