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Keysight EEsof EDA Customer Education and Services 
Brief overview of Keysight EDA Customer Education and Services.

培训资料 2016-07-20

 
Accuracy matters: Calibration Options for Lab Standards Webcast 
Original broadcast May 19, 2016

网上直播

 
International Microwave Symposium (IMS) 2016 
May 22-27, 2016; San Francisco, CA

展览会

 
Power Conversion Efficiency Measurement Methods Webcast 
Original broadcast November 4, 2015

网上直播 -- 已存档的

 
Site Hazard, Safety & Risk Mitigation for Beginning Thermographers Webcast 
Original broadcast September 30, 2015

网上直播 -- 已存档的

 
Multiport and Multi-site Test Optimization Techniques Webcast 
Original broadcast June 3, 2015

网上直播 -- 已存档的

 
DynaFET: Advanced model for GaN/GaAs HEMTs from NVNA measurements and ANNs Webcast 
Original broadcast September 4, 2014

网上直播 -- 已存档的

 
2011 年国际微波会议(IEEE MTT-S)—是德将在 Agilent Avenue 架起业界专家与领先公司之间的桥梁  
2011 show, last June, 2011; Baltimore Convention Center

展览会

 
Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast 
Original broadcast May 7, 2013

网上直播 -- 已存档的

 
Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro 
Originally broadcast Jan 27, 2011

网上直播 -- 已存档的

 
Setting Up IC-CAP WaferPro For On-Wafer Measurements 
Original broadcast June 22, 2011

网上直播 -- 已存档的

 
Hybrid-Active Load Pull with PNA-X and Maury Microwave 
Original broadcast Jun 12, 2012

网上直播 -- 已存档的

 
Fundamentals of Fast Pulsed IV Measurement Webcast 
Original broadcast January 9, 2014

网上直播 -- 已存档的

 
MQA: Automating Library Validation 
MQA is the industry standard qualification platform that assists modeling experts and model users to perform comprehensive model qualification with an knowledge-based, rules-driven approach.

研讨会演示 2013-10-22

PDF PDF 1.48 MB
Automating SPICE Library Validation 
Recorded webcast and slide set for a Model Quality Assurance (MQA) webcast held on October 22, 2013.

研讨会演示 2013-10-22

 
Measurement Based FET Modeling using Artifical Neural Networks (ANN) 
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.

研讨会演示 2012-02-07

PDF PDF 2.51 MB
Setting up IC-CAP WaferPro for On-Wafer Measurements 
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.

研讨会演示 2011-06-22

PDF PDF 3.07 MB
IC-CAP User Training 
This 3-day course will show device modelers how to use Keysight EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations.

课堂培训