Here’s the page we think you wanted. See search results instead:


Contact an Expert

Long Term Evolution - LTE Test

LTE is still growing, adding subscribers around the world. The technology is evolving to LTE-Advanced and to LTE-Advanced Pro, adding measurement challenges at every step. Keysight is there to provide insight into your designs that optimize and integrate these technologies and to meet the latest standards. Our solutions reduced design uncertainty, provide faster and easier development of high-performing LTE products and help you find root causes faster. As an active member of 3GPP and other influential wireless standards bodies and leading 5G forums and consortia, we have been at the forefront of providing standard-compliant LTE test and design tools across the entire lifecycle– from simulation to R&D, design verification and pre-conformance, conformance, manufacturing, through network deployment and service assurance.

Our engineers, experts in design and test, are available to advise, assist and augment your teams all around the world. Our expertise is also readily available through white papers, application notes and webcasts for LTE, LTE-Advanced, MIMO, WLAN Test, and 5G.

To find the product that fits your stage of Long Term Evolution (LTE) development see links to the left.

Learn about LTE and its measurements in the LTE book written by 42 LTE experts

Hardware - Software - People - LTE Insights


Explore YouTube Videos 

76-100 of 149

P-Series Power Meter/Sensor LTE Measurement 
This article covers the technical overview and features, benefits and specifications of the P-Series power meters and sensors for LTE-TDD measurement applications.

Technical Overview 2010-11-19

Agilent Technologies Wins Informa LTE North America Award 
Moray Rumney, the lead technologist specializing in LTE at Agilent, has won the Informa LTE North America 2010 award for individual contribution to LTE development.

Press Materials 2010-11-17

Agilent Technologies and Nomor Research GmbH Generate LTE Uplink Inter-cell Interference Signals 
Agilent Technologies Inc. (NYSE: A) and Nomor Research GmbH today announced the availability of a simple, cost-effective method for generating realistic LTE uplink inter-cell interference signals using Agilent's MXG signal generators.

Press Materials 2010-10-22

YouTube video: LTE 5MHz Downlink signal demonstrated on a Keysight VSA 89600 
View an LTE downlink signal then watch it being demodulated and decoded for further analysis. (YouTube video, 5 min)

Demo 2010-09-24

YouTube Video: LTE Master and System Information Block Recovery 
This is a demonstration of how the master information block and system information blocks can be recovered from the LTE downlink signal using the Keysight 89600 VSA signal analysis software.(YouTube video, 5:53min)

Demo 2010-09-24

LTE eNB Closed-loop Conformance Testing 
This is a demonstration of how the Keysight N5106A PXB baseband generator and channel emulator, N7624B Signal Studio for LTE software, and N5182A MXG signal generator are configured for eNB closed-loop conformance test. (8.27min)

Demo 2010-09-24

Agilent | Agilent Technologies and Innofidei Announce Joint Development of RF Tests for TD-LTE Chips 
The test development is based on the 3GPP LTE specifications, Innofidei’s TD-LTE test requirements, included Agilent’s N5182A signal generator and N9020A signal analyzer and followed the 3GPP LTE standard chapter 6 and 7 TX / RX characteristics.

Press Materials 2010-09-15

Agilent Technologies' New LTE Base-Station Emulator Speeds Development and Verification of LTE User  
Agilent Technologies Inc. (NYSE: A) today announced the PXT Wireless Communications Test Set, a powerful, common hardware test platform for use across the LTE development lifecycle.

Press Materials 2010-09-01

Agilent Technologies Launches Measurement Applications, Expands LTE Leadership  
Agilent Technologies Inc. (NYSE: A) today introduced eight new measurement applications for its PXA X-Series signal analyzer.

Press Materials 2010-09-01

The MIMO Antenna: Unseen, Unloved, Untested! 
Microwave Journal (August 2010) article (.pdf) written by Agilent’s Moray Rumney. With the shift of MIMO from theory to real world this article focuses on performance testing in real world conditions.

Article 2010-08-20

Measuring MIMO In LTE Tx And Rx Tests 
Find the right combination of LTE test instruments and techniques to evaluate the performance of Long Term Evolution (LTE) components and systems under real-world conditions. A link to the MWJ article by Agilent.

Article 2010-08-18

Solutions for MIMO RF Test and Debug 
Ensuring Quick and Accurate Four-Channel, Phase-Coherent MIMO Measurements

Application Note 2010-07-14

E-UTRA Base Station Transmit ON/OFF Power Measurement  
This application note describes the LTE TDD E-UTRA base station transmit ON/OFF power measurement-also known as the power-versus-time measurement- as provided in the N9082A LTE TDD measurement app.

Application Note 2010-06-22

Solutions for Testing LTE FDD and TDD Performance  
Ensuring Simpler, More Cost-Effective Conformance Testing of LTE Base Stations

Application Note 2010-05-17

Solutions for Memory Effects in Microwave Components 
This "Solutions for Memory Effects in Microwave Components" app note explains how to use X-Parameters to characterize and model long-term memory effects of wideband modulated signals.

Application Note 2010-05-13

Agilent Technologies Partners with Innowireless on LTE Test Solutions 
Agilent Technologies Inc. (NYSE: A) today announced it has formed a strategic partnership with Innowireless Co., Ltd. to enhance the rapid development of LTE wireless test platforms.

Press Materials 2010-05-05

Agilent Technologies to Showcase LTE Test Solutions at LTE World Summit 2010 
Agilent Technologies to Showcase LTE Test Solutions at LTE World Summit 2010

Press Materials 2010-05-04

Stimulus-Response Testing for LTE Components - Application Note 
This note focuses on the 3GPP LTE specifications that present some new challenges for manufacturers of components and equipment for LTE systems.

Application Note 2010-05-03

Agilent Technologies Extends LTE Leadership with New Signal Studio for 3GPP LTE and VSA Software 
Agilent Technologies Extends LTE Leadership with New Signal Studio for 3GPP LTE and VSA Software Capabilities

Press Materials 2010-05-03

Solutions for Characterizing Complex and Multi-Stage Circuits 
This app note combines X-parameters with load-pull measurements to characterize load-dependent device behavior included in a large signal model for analysis of complex PA circuits.

Application Note 2010-04-07

Solutions for Characterizing High-Power Devices—Using X-parameters to Make Nonlinear Measurements of 
This “Solutions for…” app note discusses X-parameters used to properly characterize and understand the behavior of high power amplifiers, as engineers push them to their limit, into nonlinear operation.

Application Note 2010-03-04

YouTube Video: LTE eNB Closed-loop Conformance Testing  
This is a demonstration of how the Keysight N5106A PXB baseband generator and channel emulator, N7624B Signal Studio for LTE software, and N5182A MXG signal generator are configured for eNB closed-loop conformance test. (Youtube video, 8.27min)

Demo 2010-03-04

Agilent Technologies’ New LTE Applications Target 4G System-Level Designers 

Press Materials 2010-02-16

Agilent Extends PXA with Embedded LTE and HSPA+ Measurement Applications 

Press Materials 2010-02-15

A primer on MIMO in LTE 
An article in Electronic Products, written by Agilent’s Jan Whitacre, exploring the special employment of multiple-input, multiple-output radios to utilize spectrum in Long Term Evolution (LTE) systems.

Article 2010-02-01


Previous 1 2 3 4 5 6 Next