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Long Term Evolution - LTE Test

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Accelerate Wireless Design and Test with Flexible, High-Performance Platforms

Keysight gives you “greater insight” into your Long Term Evolution (LTE) designs and LTE Test. We provide reduced design uncertainty, faster and easier development of high-performing LTE products and help you find root causes faster. Now with first-to-market test solutions for LTE-Advanced.

To learn more about LTE technology : LTE Technology Overview

To learn more about the LTE implementation of MIMO: MIMO Test

Receive App Notes, CD's and other resources : Long Term Evolution - LTE Resources

To find the product that fits your stage of Long Term Evolution (LTE) development see links to the left.

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Interference Testing with Handheld Spectrum Analyzers Application Note 
This application note describes the techniques and procedures for interference testing in a wireless environment using the Keysight family of N934xC/N9340B handheld spectrum analyzers.

Application Note 2011-10-11

LTE-Advanced…Already? 
Article reprint from OSP magazine detailing the additional changes LTE-Advanced brings to the Network already working to implement 3GPP LTE.

Article 2011-09-01

PDF PDF 695 KB
Testing Handovers Between LTE and 3G cdma2000/1xEV-DO Cellular Networks - Application Note 
This application note explains test handovers between LTE and third generation cdma2000/1xEV-DO cellular networks as well as network evolution.

Application Note 2011-06-15

LTE Base Station (eNB) Transmitter and Component Test, Self-Guided Demonstration 
This guide provides step-by-step instructions on performing component test of single carrier/multi-carrier/multi-standard radio ACLR, EVM, and various eNB transmitter tests using select Keysight sw/hw.

Demo 2011-04-12

PDF PDF 2.96 MB
YouTube Video: System-Level Design of the LTE-Advanced Physical Layer 
Preview the wireless industry's first commercial design personality for LTE-Advanced (3GPP Release 10), as part of the SystemVue 2011.03 environment (4:21min)

Demo 2011-04-03

 
Learn about MIMO with these useful resources from Keysight 
Order posters, and CDs, download app notes

Promotional Materials 2011-03-02

 
Option BHD 3GPP LTE Modulation Analysis 89600 Vector Signal Analysis Software 
This demonstration guide provides step by step instructions for making 3GPP LTE measurements using the 89600 VSA software.

Demo 2011-02-23

Agilent Technologies Announces LTE Wireless Communications Test Set for Manufacturing 
Agilent Technologies Inc. (NYSE: A) today announced the Agilent EXT wireless communications test set for wireless device manufacturing. The new Agilent EXT includes X-Series Measurement Applications and Sequence Studio software along with enhanced Signal Studio software to support the required testing of existing and emerging communication technologies such as LTE.

Press Materials 2011-02-14

 
Agilent Technologies Introduces Three New LTE Design Verification and Conformance Systems 
Agilent Technologies Inc. (NYSE: A) today announced its new design verification and conformance systems for LTE. The three systems extend Agilent's GS-8800 series for cellular design verification and conformance and are intended for engineers testing LTE devices to meet the TS 36.521-1 standard. All three use the Agilent E6621A PXT wireless communications test set as their core signalling engine.

Press Materials 2011-02-14

 
Agilent Technologies, Altair Semiconductor Team Up to Accelerate LTE Device and Test Equipment Matur 
Agilent Technologies Inc. (NYSE: A) and Altair Semiconductor today announced they will jointly conduct interoperability testing and validation testing using Altair's 4G LTE chipset in conjunction with the Agilent PXT wireless communications test set and N6070A-series signaling conformance test software. The joint effort will accelerate the development of LTE devices and testing solutions into new operating bands.

Press Materials 2011-02-11

 
Agilent Technologies' PXT Wireless Communications Test Set Now Supports Critical LTE Inter-RAT Hand 
Agilent Technologies Inc. (NYSE: A) today announced new functional test features for its E6621A PXT wireless communications test set.

Press Materials 2011-02-09

 
PXT Wireless Communications Test Set (E6621A) - Application Note 
This application note provides you with the basic steps to making data throughput measurements with your E6621A PXT.

Application Note 2011-02-04

LTE-Advanced FDD and TDD Signal Generation and Analysis - Flyer 
Keysight provides the industry's first LTE-Advanced signal generation and analysis software tools to enable testing of physical layer implementations with greater insight and confidence. Keywords: 89600B, VSA, 89601B, LTE, LTE-Advanced,Signal Studio, N7624B, N7625B, FDD, TDD

Brochure 2011-02-03

PDF PDF 178 KB
LTE-Advanced Signal Generation and Measurement Using SystemVue - Application Note 
This application note introduces changes in Release 10 of the 3GPP specification for LTE-Advanced, a new generation of the LTE standard that promises dramatic improvements in throughput.

Application Note 2010-12-23

P-Series Power Meter/Sensor LTE Measurement 
This article covers the technical overview and features, benefits and specifications of the P-Series power meters and sensors for LTE-TDD measurement applications.

Technical Overview 2010-11-19

Agilent Technologies Wins Informa LTE North America Award 
Moray Rumney, the lead technologist specializing in LTE at Agilent, has won the Informa LTE North America 2010 award for individual contribution to LTE development.

Press Materials 2010-11-17

 
Agilent Technologies and Nomor Research GmbH Generate LTE Uplink Inter-cell Interference Signals 
Agilent Technologies Inc. (NYSE: A) and Nomor Research GmbH today announced the availability of a simple, cost-effective method for generating realistic LTE uplink inter-cell interference signals using Agilent's MXG signal generators.

Press Materials 2010-10-22

 
YouTube Video: LTE Master and System Information Block Recovery 
This is a demonstration of how the master information block and system information blocks can be recovered from the LTE downlink signal using the Keysight 89600 VSA signal analysis software.(YouTube video, 5:53min)

Demo 2010-09-24

 
LTE eNB Closed-loop Conformance Testing 
This is a demonstration of how the Keysight N5106A PXB baseband generator and channel emulator, N7624B Signal Studio for LTE software, and N5182A MXG signal generator are configured for eNB closed-loop conformance test. (8.27min)

Demo 2010-09-24

 
Keysight Video: LTE MIMO Composite EVM 
This is a demonstration of a 2x2 LTE MIMO system configuration where the Keysight 89600 VSA software and Keysight N9020A MXA signal analyzers are used to make an LTE MIMO composite EVM measurement. (4.43min)

Demo 2010-09-24

 
YouTube video: LTE 5MHz Downlink signal demonstrated on a Keysight VSA 89600 
View an LTE downlink signal then watch it being demodulated and decoded for further analysis. (YouTube video, 5 min)

Demo 2010-09-24

 
YouTube Video: LTE MIMO Composite EVM 
This is a demonstration of a 2x2 LTE MIMO system configuration where the Keysight 89600 VSA software and Keysight N9020A MXA signal analyzers are used to make an LTE MIMO composite EVM measurement. (Youtube video, 4.43min)

Demo 2010-09-24

 
Agilent | Agilent Technologies and Innofidei Announce Joint Development of RF Tests for TD-LTE Chips 
The test development is based on the 3GPP LTE specifications, Innofidei’s TD-LTE test requirements, included Agilent’s N5182A signal generator and N9020A signal analyzer and followed the 3GPP LTE standard chapter 6 and 7 TX / RX characteristics.

Press Materials 2010-09-15

 
Agilent Technologies Launches Measurement Applications, Expands LTE Leadership  
Agilent Technologies Inc. (NYSE: A) today introduced eight new measurement applications for its PXA X-Series signal analyzer.

Press Materials 2010-09-01

 
Agilent Technologies' New LTE Base-Station Emulator Speeds Development and Verification of LTE User  
Agilent Technologies Inc. (NYSE: A) today announced the PXT Wireless Communications Test Set, a powerful, common hardware test platform for use across the LTE development lifecycle.

Press Materials 2010-09-01

 

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