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Long Term Evolution - LTE Test

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Accelerate Wireless Design and Test with Flexible, High-Performance Platforms

Keysight gives you “greater insight” into your Long Term Evolution (LTE) designs and LTE Test. We provide reduced design uncertainty, faster and easier development of high-performing LTE products and help you find root causes faster. Now with first-to-market test solutions for LTE-Advanced.

To learn more about LTE technology : LTE Technology Overview

To learn more about the LTE implementation of MIMO: MIMO Test

Receive App Notes, CD's and other resources : Long Term Evolution - LTE Resources

To find the product that fits your stage of Long Term Evolution (LTE) development see links to the left.

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Solutions for LTE-Advanced Manufacturing Test - Application Note 
This “Solutions for LTE-Advanced Manufacturing Test” application note gives insight into how to better understand the requirements for LTE-Advanced Carrier Aggregation manufacturing test.

Application Note 2014-08-04

Solutions and Measurement Tools for Use in Average Power and Envelope Tracking Design - Application  
This app note provides an outline of the techniques involved and the solutions Agilent provides for RF, baseband and system developers.

Application Note 2014-08-02

89600 WLA Software - Technical Overview 
The 89600 WLA software provides wireless link analysis that decodes higher layer control messages and correlates them with the PHY-layer signals they manage.

Technical Overview 2014-05-15

89601B/BN-BHD, BHE, BHG, BHH LTE & LTE-Advanced FDD & TDD, 89600 VSA Software - Technical Overview 
The 89600 VSA software has the capability to analyze LTE-Advanced as well as LTE signals in both FDD and TDD formats.

Technical Overview 2014-05-14

Agilent's UXM Wireless Test Set Accelerates Marvell's LTE-Advanced Category 7 Chipset Development 
Agilent and Marvell worked in concert to achieve sustained bidirectional 300 Mbps downlink/100 Mbps uplink data throughput using 3GPP release 10 downlink and uplink carrier aggregation.

Press Materials 2014-05-06

 
M9380A PXIe CW Source - Configuration Guide 
This configuration guide provides instructions to help you configure the M9380A PXIe CW Source and expand the system to meet your requirements. Product upgrades, related products and physical connection schematics are also featured.

Configuration Guide 2014-03-20

PDF PDF 3.23 MB
Accelerate PXI VSA Measurements with X-Series Measurement Applications for Modular Instrument 
This brochure describes the modular X-Series measurement applications which increase the efficiency and capability of the PXI VSA for specific communications standards

Brochure 2014-03-06

PDF PDF 1.31 MB
UXM Wireless Test Set Demo Videos on YouTube 
Explore YouTube for videos of the UXM wireless test set

Demo 2014-02-13

 
Agilent’s UXM Wireless Test Set Enables New Insights into LTE-Advanced Category 6 Chipsets, Devices 
Introducing the E7515A UXM wireless test set, the most highly integrated signaling test set created for functional and RF design validation in the 4G era and beyond.

Press Materials 2014-02-13

 
E6640A EXM Wireless Test Set Ready for Volume Production of LTE-A, 802.11ac WLAN Devices 
Agilent Technologies today announced the E6640A EXM wireless test set, which offers breakthrough manufacturing-test scalability in technology coverage, performance and capacity to test up to 32 cellular and wireless-connectivity devices in parallel.

Press Materials 2014-02-13

 
Greater Insight into LTE Design and Test 
This brochure discusses Keysight's leadership in LTE and presents our set of design and test solutions for LTE - from design simulation to signal generation and analysis through manufacturing and deployment.

Brochure 2013-12-31

PDF PDF 2.11 MB
Correlating Microwave Measurements between Handheld and Benchtop Analyzers - Application Note 
This application note discusses the powerful capabilities of modern-day handheld analyzers and includes measurement comparisons between FieldFox handheld analyzers and several benchtop instruments.

Application Note 2013-11-17

 
Measuring the Burst Time-Gated Power Signal of Wireless Technologies Using Keysight Power Sensors 
Measuring pulse, burst, or modulated signals for wireless technologies such as TDMA, GSM, WLAN, WiMAX, and LTE is very important because it is part of functionality testing and power amplifier module verification during the manufacturing process.

Application Note 2013-07-08

Agilent Technologies announces 160-MHz bandwidth and real-time capability for MXA signal analyzer 
Agilent Technologies announced significant enhancements to its midrange N9020A MXA X-Series signal analyzer. New options for 160-MHz analysis bandwidth and real-time spectrum analyzer (RTSA) capability address the challenges of measuring interference in the next generation of heterogeneous wireless networks.

Press Materials 2013-06-04

 
Agilent Technologies announces industry-first capabilities for envelope tracking  
Agilent Technologies announced two software releases that support the design and verification of envelope tracking, a technique that improves the efficiency and linearity of power amplifiers used in mobile handsets

Press Materials 2013-06-04

 
Agilent PXT Wireless Communications Test Set Selected by Tri-L Solutions for LTE Over-the-Air Test 
Agilent Technologies Inc. (NYSE: A) today announced that Tri-L Solutions Inc. has selected Agilent's PXT wireless communications test set and integrated it with Tri-L Solutions SmarTest measurement software for testing LTE over the air.

Press Materials 2013-04-08

 
Learn about LTE and its measurements in the LTE book written by 42 LTE experts 
Keysight’s new Long Term Evolution (LTE) book delves into the new 3GPP LTE cellular technology and offers tips for design, test and required equipment.

Promotional Materials 2013-01-24

 
Agilent Technologies Introduces Industry's First LTE-Advanced 8x8 MIMO Signal-Generation and Analysi 
Agilent Technologies Introduces Industry's First LTE-Advanced 8x8 MIMO Signal-Generation and Analysis Solutions

Press Materials 2013-01-03

 
Agilent Technologies and CATR (TMC) to Collaborate on TD-LTE MIMO  
Agilent Technologies Inc. (NYSE: A) announced a memorandum of understanding has been signed with the China Academy of Telecommunication Research (Telecommunication Metrology Center), or CATR (TMC). The two organizations have agreed to work together on TD-LTE MIMO over-the-air (OTA) test research.

Press Materials 2012-09-13

 
Techniques for Precise Cable and Antenna Measurements in the Field - Application Note 
This app note introduces measurement and calibration techniques for cable and antenna testing using FieldFox handheld analyzers.

Application Note 2012-08-30

 
Techniques for Precise Measurement Calibrations in the Field - Application Note 
This app note discusses recent advances in VNA calibration and compares measurements made on a FieldFox analyzer using different calibration types for a variety of RF and microwave devices.

Application Note 2012-08-30

 
Techniques for Precise Interference Measurements in the Field - Application Note 
This app note discusses the different types of interference in current and new systems and methods to measure a variety of interference types using spectrum analyzers such the FieldFox Series.

Application Note 2012-08-30

 
Agilent Technologies Announces Wireless Communications Test Set with Innovative Multiport Adapter 
Agilent Technologies introduced the E6607B EXT wireless communications test set and companion E6617A multiport adapter. Optimized for non-signaling testing, the EXT/MPA combination increases test throughput and reduces the cost of test in the manufacturing of current- and next-generation smartphones and tablets that contain multiformat and multiband technologies.

Press Materials 2012-08-01

 
EXT Wireless Communications Test Set Non-signaling Test Overview 
This application note explains how non-signaling test methods make it possible for manufacturers to reduce both test times and test equipment costs across a range of wireless technologies

Application Note 2012-08-01

PDF PDF 290 KB
Agilent Technologies Accelerates Early Wireless Design Verification with New Release of SystemVue 
Agilent will demonstrate SystemVue 2012.06 along with a range of solutions for everything from circuit-level modeling through system verification for general RF, microwave, 4G communications, and aerospace/defense applications at DAC2012 (Booth 313), June 3-7, in San Francisco. SystemVue 2012.06 will also be demonstrated at IMS 2012/IEEE MTT-S (Booth 1015), June 19-21, in Montr al, Canada. A range of premier partner solutions will be available on Agilent Avenue and throughout the event area.

Press Materials 2012-06-05

 

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