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Long Term Evolution - LTE Test

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Accelerate Wireless Design and Test with Flexible, High-Performance Platforms

Keysight gives you “greater insight” into your Long Term Evolution (LTE) designs and LTE Test. We provide reduced design uncertainty, faster and easier development of high-performing LTE products and help you find root causes faster. Now with first-to-market test solutions for LTE-Advanced.

To learn more about LTE technology : LTE Technology Overview

To learn more about the LTE implementation of MIMO: MIMO Test

Receive App Notes, CD's and other resources : Long Term Evolution - LTE Resources

To find the product that fits your stage of Long Term Evolution (LTE) development see links to the left.


Explore YouTube Videos 

126-150 of 153

Agilent Technologies Delivers First Real-Time LTE Base Station Test for R&D Engineers 

Press Materials 2009-02-16

Agilent Technologies, ASTRI, PicoChip Demonstrate Design and Test of TD-LTE Femtocell at 2009 Mobile 

Press Materials 2009-02-16

Agilent Technologies Now Offers Most Comprehensive Real-Time Diagnostics, Analysis for LTE 

Press Materials 2009-02-16

Agilent Technologies Delivers Wide Range of Commercial Test Products for TD-LTE 

Press Materials 2009-02-16

Agilent Technologies to Demonstrate Bench-Top LTE RF Mobile Device Characterization on E6620 Platfor 

Press Materials 2009-02-16

Agilent Technologies Publishes Comprehensive Book on LTE Measurement, Design Challenges 

Press Materials 2009-02-16

Advanced Design System: The High-Frequency/High-Speed Co-Design Platform 
Technical overview of Advanced Design System as a co-design platform.

Technical Overview 2009-02-10

Agilent Technologies' New Drive Test Measurements Speed Deployment, Cut Costs of LTE Networks 

Press Materials 2009-02-02

3GPP-LTE Wireless Library Element Overview 
Overview of 3GPP-LTE Wireless Library Element

Technical Overview 2009-02-02

Agilent Technologies to Display Newest Mobile Communications Test, Measurement Solutions at 2009 Mob 

Press Materials 2009-02-02

Expert Advice: The Importance of Average vs. Peak Performance in Cellular Wireless 
The average efficiency of the cell remains much lower than the peaks. November 2008 article by Moray Rumney linked with permission by Microwave Journal.

Article 2008-11-17

Agilent Technologies to Demonstrate LTE Test Solutions for Entire Development Lifecycle at LTE World 

Press Materials 2008-11-17

Agilent Measurement Journal, Issue 6, September 2008 
Using a few words to convey a deeply-held spirit - read more about Agilent's contributions to the Olympic Games in Beijing in communications, electronics, life sciences, and chemical analysis.

Journal 2008-09-01

Analyze Antenna Approaches for LTE Wireless Systems 
Multiple-antenna techniques are a large part of improved performance in LTE wireless systems, but they must be properly understood in order to be properly tested.

Article 2008-08-13

LTE ARQ and Re-segmentation 
Link to August 2008 Microwave Journal Article

Article 2008-08-08

Agilent Technologies' LTE Test Solutions Now Compliant with March 2008 LTE Standard 

Press Materials 2008-06-21

Agilent Technologies Joins LTE/SAE Trial Initiative 

Press Materials 2008-02-20

Agilent Technologies First to Add LTE, SAE Technology to Real-Time Signaling Analyzer 

Press Materials 2008-02-11

Understanding LTE 

Press Materials 2008-02-11

Agilent Technologies to Introduce First-to-Market 3GPP LTE Test Solutions  

Press Materials 2008-01-09

3GPP LTE: Introducing Single-Carrier FDMA  
This article, published in issue 4 of the Agilent Measurement Journal, describes single-carrier FDMA for 3GPP LTE.

Article 2008-01-01

Agilent Technologies Announces Industry's Most Comprehensive LTE Signal Analysis Solution for Design 

Press Materials 2007-12-03

Agilent Technologies to Showcase 3GPP LTE Test Solutions at 2007 European Microwave Conference 

Press Materials 2007-10-01

Agilent Technologies Updates Advanced Design System EDA Software to Enhance Serial Link Design 

Press Materials 2007-09-27

E8895 3GPP LTE Wireless Library 

Technical Overview 2007-07-23


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