Here’s the page we think you wanted. See search results instead:


Contact an Expert

Long Term Evolution - LTE Test

LTE is still growing, adding subscribers around the world. The technology is evolving to LTE-Advanced and to LTE-Advanced Pro, adding measurement challenges at every step. Keysight is there to provide insight into your designs that optimize and integrate these technologies and to meet the latest standards. Our solutions reduced design uncertainty, provide faster and easier development of high-performing LTE products and help you find root causes faster. As an active member of 3GPP and other influential wireless standards bodies and leading 5G forums and consortia, we have been at the forefront of providing standard-compliant LTE test and design tools across the entire lifecycle– from simulation to R&D, design verification and pre-conformance, conformance, manufacturing, through network deployment and service assurance.

Our engineers, experts in design and test, are available to advise, assist and augment your teams all around the world. Our expertise is also readily available through white papers, application notes and webcasts for LTE, LTE-Advanced, MIMO, WLAN Test, and 5G.

To find the product that fits your stage of Long Term Evolution (LTE) development see links to the left.

Learn about LTE and its measurements in the LTE book written by 42 LTE experts

Hardware - Software - People - LTE Insights


Keysight RF and Digital Learning Center - A commitment to learning with industry experts


Explore YouTube Videos 

126-149 of 149

Agilent Technologies to Demonstrate Bench-Top LTE RF Mobile Device Characterization on E6620 Platfor 

Press Materials 2009-02-16

Agilent Technologies Publishes Comprehensive Book on LTE Measurement, Design Challenges 

Press Materials 2009-02-16

Agilent Technologies Delivers Wide Range of Commercial Test Products for TD-LTE 

Press Materials 2009-02-16

Advanced Design System: The High-Frequency/High-Speed Co-Design Platform 
Technical overview of Advanced Design System as a co-design platform.

Technical Overview 2009-02-10

Agilent Technologies' New Drive Test Measurements Speed Deployment, Cut Costs of LTE Networks 

Press Materials 2009-02-02

3GPP-LTE Wireless Library Element Overview 
Overview of 3GPP-LTE Wireless Library Element

Technical Overview 2009-02-02

Agilent Technologies to Demonstrate LTE Test Solutions for Entire Development Lifecycle at LTE World 

Press Materials 2008-11-17

Expert Advice: The Importance of Average vs. Peak Performance in Cellular Wireless 
The average efficiency of the cell remains much lower than the peaks. November 2008 article by Moray Rumney linked with permission by Microwave Journal.

Article 2008-11-17

Agilent Measurement Journal, Issue 6, September 2008 
Using a few words to convey a deeply-held spirit - read more about Agilent's contributions to the Olympic Games in Beijing in communications, electronics, life sciences, and chemical analysis.

Journal 2008-09-01

Analyze Antenna Approaches for LTE Wireless Systems 
Multiple-antenna techniques are a large part of improved performance in LTE wireless systems, but they must be properly understood in order to be properly tested.

Article 2008-08-13

LTE ARQ and Re-segmentation 
Link to August 2008 Microwave Journal Article

Article 2008-08-08

Agilent Technologies' LTE Test Solutions Now Compliant with March 2008 LTE Standard 

Press Materials 2008-06-21

Agilent Technologies Joins LTE/SAE Trial Initiative 

Press Materials 2008-02-20

Understanding LTE 

Press Materials 2008-02-11

Agilent Technologies First to Add LTE, SAE Technology to Real-Time Signaling Analyzer 

Press Materials 2008-02-11

Agilent Technologies to Introduce First-to-Market 3GPP LTE Test Solutions  

Press Materials 2008-01-09

3GPP LTE: Introducing Single-Carrier FDMA  
This article, published in issue 4 of the Agilent Measurement Journal, describes single-carrier FDMA for 3GPP LTE.

Article 2008-01-01

Agilent Technologies Announces Industry's Most Comprehensive LTE Signal Analysis Solution for Design 

Press Materials 2007-12-03

Agilent Technologies to Showcase 3GPP LTE Test Solutions at 2007 European Microwave Conference 

Press Materials 2007-10-01

Agilent Technologies Updates Advanced Design System EDA Software to Enhance Serial Link Design 

Press Materials 2007-09-27

E8895 3GPP LTE Wireless Library 

Technical Overview 2007-07-23

MIMO Manufacturing Solution - Application Note 
Compares two of the most popular MIMO manufacturing test methodologies, including examples to illustrate the relative merits.

Application Note 2007-07-10

Agilent Technologies Announces 3GPP LTE Signal-Creation Software for Next-Generation Mobile  

Press Materials 2007-05-29

Agilent Technologies Demonstrates its Commitment to Innovative 3G LTE Measurement Solutions at 3GSM  

Press Materials 2007-02-12


Previous 1 2 3 4 5 6