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Focus where it counts

Missions evolve but one thing stays the same: the need to protect those who go in harm´s way. Success depends on a changing mix of people and technology ― and as technology becomes more complex, assuring readiness gets tougher.

Keysight is a source of assurance that your mission will succeed. Through our expertise in measurement science and test processes, we give you more time for the bigger issues: fulfilling today´s mission and managing the transition to what comes next. By helping you build greater assurance in system readiness, Keysight frees you to focus where it counts most.

See Measurement Solution Examples: Active Antenna Test, Multi-Emitter Environment Test Signals

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Realistic Ultra Wideband Radar Signal - Demo 
Testing of radar systems can be extremely time-consuming and expensive. Radar transceivers must be designed and tested with realistic environment and jamming scenarios, which often involve costly outdoor ranges, chambers, and real-time hardware simulators.

Demo 2013-11-25

 
Correlating Microwave Measurements between Handheld and Benchtop Analyzers - Application Note 
This application note discusses the powerful capabilities of modern-day handheld analyzers and includes measurement comparisons between FieldFox handheld analyzers and several benchtop instruments.

Application Note 2013-11-17

 
A new approach for multi-emitter test signal generation – Article 
A new capture and playback approach generates multi-emitter test signals using a combination of COTS test equipment and simulation software.

Article 2013-11-15

 
Creating Multi-Emitter Signal Scenarios with COTS Software and Instrumentation – Solution Brief 
Describes a key problem, describes a commercial, off-the-shelf (COTS) solution for signal generation and analysis, and presents two example scenarios.

Application Note 2013-11-12

PDF PDF 1017 KB
AXIe and PXI Modular Test Solution for Multiband SATCOM Monitoring - Application Note 
This application overview will show how to simplify multiple satellite band monitoring and analysis using the Keysight AXIe M9703A high-speed digitizer, N5183A LO, and 89601B VSA software.

Application Note 2013-11-07

PDF PDF 1.16 MB
Simplifying Complex Benchtop Measurements with USB Switches - Application Note 
This application note provides a brief overview of switching topologies before outlining three measurement scenarios that include the U1810B USB switch.

Application Note 2013-11-06

PDF PDF 953 KB
Considerations in Making Small Signal Measurements - Application Brief 
The increasing demand for battery-powered mobile devices and energy-efficient green products has triggered a rising demand for a scope measurement solution that can measure the small signals.

Application Note 2013-10-29

PDF PDF 841 KB
Availability of Courseware on Radar Operating Principles and Systems – Press Release 
The courseware provides students instant access to high-quality professional instruction and hands-on experience for the latest radar systems and operating principles.

Press Materials 2013-10-29

 
Addressing the Challenges of Radar and EW System Design and Test using a Model-Based Platform 
Article reprint, High Frequency Electronics, October 2013. Due to the challenges of Electronic Warfare (EW) environments, today’s designers require a solution for designing, verifying and testing their Radar and EW systems in an effective way.

Article 2013-10-10

PDF PDF 1.45 MB
Keysight EEsof EDA Product Overview 
Keysight EEsof EDA premier communications design software product overview brochure.

Brochure 2013-09-30

PDF PDF 1.68 MB
Agilent Technologies Accelerates Smartphone, Defense Simulations by a Factor of 64 – Press Release 
New capabilities harness compute clusters for faster system-level validation and test.

Press Materials 2013-09-24

 
A Modern Solution for Multi-aperture and Phased-array Antenna Characterization 
Discusses a solution to characterize each element of the array antenna in a relative way to the others and accelerating the test using multiple coherent measurement channels.

Article 2013-09-04

 
M9703A AXIe High-Speed Digitizer with Real-Time Digital Downconversion Capability - Application Note 
This application note describes how to use the M9703A AXIe high-speed digitizer with real-time digital downconversion (DDC) capability to perform ultra-fast relative phase and gain measurements.

Application Note 2013-08-19

PDF PDF 5.48 MB
8990B Peak Power Analyzer and N1923A/N1924A Wideband Power Sensors - Data Sheet 
This data sheet includes the description and technical specifications of the 8990B Peak Power Analyzer and N1923A/N1924A Wideband Power Sensors.

Data Sheet 2013-08-08

Phase Noise Measurement Solutions - Selection Guide 
This selection guide will discuss and compare Keysight's most common phase noise measurement techniques -- direct spectrum, phase detector, two-channel cross correlation, including selection tips.

Selection Guide 2013-07-31

PDF PDF 5.43 MB
Using a Model-Based Platform to Quickly and Effectively Test Radar and Electronic Warfare Systems  
Today’s designers require a solution for designing, verifying and testing their EW systems in an effective way. This application note covers how this can be achieved.

Solution Brief 2013-07-31

PDF PDF 838 KB
Discovering SystemVue 
A collection of Keysight EEsof EDA SystemVue video demonstrations and tutorials.

Demo 2013-07-26

 
Creating and Analyzing Custom OFDM Waveforms for Software-Defined Radio (SDR) - Application Note 
This note outlines the complexities of generating and analyzing COTS and custom waveforms, proposes solutions that address those problems, and presents the results of the suggested approaches.

Application Note 2013-06-19

PDF PDF 1.07 MB
Keysight EEsof EDA Customer Support Brochure 
Whether you are a novice or an experienced user, Keysight EEsof EDA’s customer support offerings are designed to help you every step of the way.

Brochure 2013-05-28

PDF PDF 681 KB
Cost Savings in Creating Realistic Multi-Emitter Signal Scenarios 
Describes a commercial, off-the-shelf (COTS) solution for signal generation and analysis, and presents two example scenarios.

Application Note 2013-05-02

Radar, EW & ELINT Testing: Identifying Common Test Challenges - Application Note 
This application note reviews some of the latest test equipment for radar, EW & ELINT systems. Since this is a complex subject, we begin with a brief review of the fundamental radar and EW/ELINT challenges.

Application Note 2013-04-29

PDF PDF 1.32 MB
Ensuring The Highest Quality Microwave Measurements - Article 
High frequencies and stringent application specifications drives a number of critical challenges to be addressed in this article.

Article 2013-04-22

 
Enabling Simulation and Test of Custom OFDM Signals 
Orthogonal frequency division multiplexing (OFDM) has become attractive for many current and emerging commercial applications because it provides a combination of data throughput, scalability, and robustness.

Article 2013-04-01

 
Aerospace and Defense Application Resources 
Order DVD and download application notes

Promotional Materials 2013-03-26

 
Achieving High-Quality Microwave Measurements with the Right Test Accessories - Application Note 
With high-performance instrumentation and accessories pushing the envelope of advanced high-frequency applications, it is now more crucial than ever for engineers to select the right test accessories.

Application Note 2013-03-06

PDF PDF 1.12 MB

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