Contact an Expert

Aerospace & Defense

This content requires a browser with JavaScript enabled and the Adobe Flash Player.

Get Flash 

Focus where it counts

Missions evolve but one thing stays the same: the need to protect those who go in harm´s way. Success depends on a changing mix of people and technology ― and as technology becomes more complex, assuring readiness gets tougher.

Keysight is a source of assurance that your mission will succeed. Through our expertise in measurement science and test processes, we give you more time for the bigger issues: fulfilling today´s mission and managing the transition to what comes next. By helping you build greater assurance in system readiness, Keysight frees you to focus where it counts most.

See Measurement Solution Examples: Active Antenna Test, Multi-Emitter Environment Test Signals

Explore YouTube Videos 

Refine the List

By Industry/Technology

By Type of Content

By Product Category

51-75 of 310

Sort:
Creating Multi-Emitter Signal Scenarios with COTS Software and Instrumentation – Solution Brief 
Describes a key problem, describes a commercial, off-the-shelf (COTS) solution for signal generation and analysis, and presents two example scenarios.

Application Note 2013-11-12

PDF PDF 1017 KB
AXIe and PXI Modular Test Solution for Multiband SATCOM Monitoring - Application Note 
This application overview will show how to simplify multiple satellite band monitoring and analysis using the Keysight AXIe M9703A high-speed digitizer, N5183A LO, and 89601B VSA software.

Application Note 2013-11-07

PDF PDF 1.16 MB
Simplifying Complex Benchtop Measurements with USB Switches - Application Note 
This application note provides a brief overview of switching topologies before outlining three measurement scenarios that include the U1810B USB switch.

Application Note 2013-11-06

PDF PDF 953 KB
Availability of Courseware on Radar Operating Principles and Systems – Press Release 
The courseware provides students instant access to high-quality professional instruction and hands-on experience for the latest radar systems and operating principles.

Press Materials 2013-10-29

 
Considerations in Making Small Signal Measurements - Application Brief 
The increasing demand for battery-powered mobile devices and energy-efficient green products has triggered a rising demand for a scope measurement solution that can measure the small signals.

Application Note 2013-10-29

PDF PDF 841 KB
Addressing the Challenges of Radar and EW System Design and Test using a Model-Based Platform 
Article reprint, High Frequency Electronics, October 2013. Due to the challenges of Electronic Warfare (EW) environments, today’s designers require a solution for designing, verifying and testing their Radar and EW systems in an effective way.

Article 2013-10-10

PDF PDF 1.45 MB
Keysight EEsof EDA Product Overview 
Keysight EEsof EDA premier communications design software product overview brochure.

Brochure 2013-09-30

PDF PDF 1.68 MB
Agilent Technologies Accelerates Smartphone, Defense Simulations by a Factor of 64 – Press Release 
New capabilities harness compute clusters for faster system-level validation and test.

Press Materials 2013-09-24

 
A Modern Solution for Multi-aperture and Phased-array Antenna Characterization 
Discusses a solution to characterize each element of the array antenna in a relative way to the others and accelerating the test using multiple coherent measurement channels.

Article 2013-09-04

 
M9703A AXIe High-Speed Digitizer with Real-Time Digital Downconversion Capability - Application Note 
This application note describes how to use the M9703A AXIe high-speed digitizer with real-time digital downconversion (DDC) capability to perform ultra-fast relative phase and gain measurements.

Application Note 2013-08-19

PDF PDF 5.48 MB
8990B Peak Power Analyzer and N1923A/N1924A Wideband Power Sensors - Data Sheet 
This data sheet includes the description and technical specifications of the 8990B Peak Power Analyzer and N1923A/N1924A Wideband Power Sensors.

Data Sheet 2013-08-08

Phase Noise Measurement Solutions - Selection Guide 
This selection guide will discuss and compare Keysight's most common phase noise measurement techniques -- direct spectrum, phase detector, two-channel cross correlation, including selection tips.

Selection Guide 2013-07-31

PDF PDF 5.43 MB
Discovering SystemVue 
A collection of Keysight EEsof EDA SystemVue video demonstrations and tutorials.

Demo 2013-07-26

 
Creating and Analyzing Custom OFDM Waveforms for Software-Defined Radio (SDR) - Application Note 
This note outlines the complexities of generating and analyzing COTS and custom waveforms, proposes solutions that address those problems, and presents the results of the suggested approaches.

Application Note 2013-06-19

PDF PDF 1.07 MB
Keysight EEsof EDA Customer Support Brochure 
Whether you are a novice or an experienced user, Keysight EEsof EDA’s customer support offerings are designed to help you every step of the way.

Brochure 2013-05-28

PDF PDF 681 KB
Radar, EW & ELINT Testing: Identifying Common Test Challenges - Application Note 
This application note reviews some of the latest test equipment for radar, EW & ELINT systems. Since this is a complex subject, we begin with a brief review of the fundamental radar and EW/ELINT challenges.

Application Note 2013-04-29

PDF PDF 1.32 MB
Ensuring The Highest Quality Microwave Measurements - Article 
High frequencies and stringent application specifications drives a number of critical challenges to be addressed in this article.

Article 2013-04-22

 
Enabling Simulation and Test of Custom OFDM Signals 
Orthogonal frequency division multiplexing (OFDM) has become attractive for many current and emerging commercial applications because it provides a combination of data throughput, scalability, and robustness.

Article 2013-04-01

 
Aerospace and Defense Application Resources 
Order DVD and download application notes

Promotional Materials 2013-03-26

 
Achieving High-Quality Microwave Measurements with the Right Test Accessories - Application Note 
With high-performance instrumentation and accessories pushing the envelope of advanced high-frequency applications, it is now more crucial than ever for engineers to select the right test accessories.

Application Note 2013-03-06

PDF PDF 1.12 MB
Exploring Phase Noise Measurement Methods and Techniques - Application Note 
This note provides a heuristic overview of phase noise fundamentals before describing the three most common measurement techniques and where they apply.

Application Note 2013-03-04

PDF PDF 1.50 MB
Make High Sensitivity, Wide Dynamic Range Current Measurement - Application Note 
The new N2820A Series high-sensitivity current probes from Keysight Technologies address the need for high-sensitivity current measurements with a wide dynamic range.

Application Note 2013-02-26

PDF PDF 623 KB
An Improved SDR FPGA Verification Methodology for Emerging OFDMA Waveforms - TechBriefs Article 
An article on Improved SDR FPGA Verification Methodology for Emerging OFDMA Waveforms.

Article 2013-02-01

 
Simple Scalar Network Analysis of Frequency Converter Devices - Application Note 
This application note shows the way to make easy scalar network analysis or power measurement using the Keysight U2000 series USB power sensor with the ENA network analyzers.

Application Note 2013-01-28

PDF PDF 606 KB
Extending the Measurement Plane up to 1 km in Vector Network Analysis - Application Note  
This application note outlines the problem and the solution, explains how to extend the measurement plane, and describes the OXI modules that enable accurate, cost-effective measurements over long distances.

Application Note 2013-01-22

PDF PDF 154 KB

Previous 1 2 3 4 5 6 7 8 9 10 ... Next