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Focus where it counts

Missions evolve but one thing stays the same: the need to protect those who go in harm´s way. Success depends on a changing mix of people and technology ― and as technology becomes more complex, assuring readiness gets tougher.

Keysight is a source of assurance that your mission will succeed. Through our expertise in measurement science and test processes, we give you more time for the bigger issues: fulfilling today´s mission and managing the transition to what comes next. By helping you build greater assurance in system readiness, Keysight frees you to focus where it counts most.

See Measurement Solution Examples: Active Antenna Test, Multi-Emitter Environment Test Signals

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Using LXI to go beyond GPIB, PXI and VXI (AN 1465-20) 
This application note focuses on the key attributes of the LXI standard, the major challenges in system development, the ways in which LXI addresses the key challenges, and the new possibilities in testing enabled by LXI devices.

Application Note 2006-01-17

Simplify your Avionics testing with a 400 Hz single phase power source that includes a built-in 26 V 
Learn how the Keysight 6812B-026, designed for the avionics industry, can easily generate a stable 26 V reference signal.

Application Note 2005-12-16

PDF PDF 153 KB
Generating and measuring 400 Hz AC power for Military and Avionics Instrument manufacturers 
This 4 page paper explores the technical capabilities of Keysight AC power source/analyzers for generating voltage and frequency variations as well as power transients.

Application Note 2005-12-15

PDF PDF 70 KB
Calibrating Signal Paths in RF/Microwave Test Systems (AN 1465-19) 

Application Note 2005-10-31

Digital Predistortion Linearizes Wireless Power Amplifiers 
This Article by Wan-Jong Kim, Shawn P. Stapleton, Jong Heon Kim, and Cory Edelman focuses on how digital predistortion linearizes wireless power amplifiers.

Article 2005-09-01

PDF PDF 1.75 MB
Keysight Ultrawideband Communication RF Measurements - AN 1488 
This application note is written for people who need to understand the configuration and testing of ultra-wideband (UWB) devices, and some of the issues surrounding their use.

Application Note 2005-07-29

Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs 
Topics include balancing cost, convenience and security in three common LAN scenarios: sharing instruments, remote monitoring and data acquisition, and functional test systems. Includes downloadable example programs.

Application Note 2005-04-01

 
Using LAN in Test Systems: Setting up System I/O (AN 1465-15) - Application Note 
This set of application notes shows you how to simplify test system integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.

Application Note 2005-03-29

PDF PDF 263 KB
N7502A Signal Simulation System 
Generate precision wideband signals easily and repeatedly with Keysight's new N7502A signal simulation system

Data Sheet 2005-02-04

PDF PDF 303 KB
Introduction to Test-System Design (AN 1465-1) 

Application Note 2005-01-20

Maximizing System Throughput and Optimizing System Deployment (AN 1465-7) 

Application Note 2004-12-21

Understanding the Effects of Racking & System Interconnections (AN 1465-6) 

Application Note 2004-12-21

PDF PDF 235 KB
Test-System Development Guide: Operational Maintenance (AN 1465-8) 

Application Note 2004-12-21

Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note 
This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument.

Application Note 2004-12-21

PDF PDF 374 KB
Choosing Your Test-System Hardware Architecture & Instrumentation (AN 1465-5) 

Application Note 2004-12-21

PNA - Antenna/RCS - Reduce Measurement Test Times 
This white paper describes new technology features applicable to antenna/RCS measurements, configuration diagrams, typical antenna/RCS measurement scenarios, and measurement time comparisons.

Application Note 2004-12-20

Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note 
Using SCPI and Direct I/O vs. Drivers, the fifth note in the series, outlines the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems

Application Note 2004-12-13

PDF PDF 408 KB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note 
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

Application Note 2004-12-09

PDF PDF 189 KB
Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note 
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

Application Note 2004-11-19

PDF PDF 194 KB
System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note 
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

Application Note 2004-10-19

PDF PDF 204 KB
81100 Family of Pulse Pattern/Generators Radar Distance Test to Airborne Planes (PN 1) - App Note 
This Product Note describes how a trigger pulse train of double pulses is sent from the control tower's radar system to an airplane.

Application Note 2004-10-12

PDF PDF
Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note 
The decision to use LAN in a test system delivers important benefits to your company and your team. From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking

Application Note 2004-09-14

Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note 
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.

Application Note 2004-07-29

PDF PDF 270 KB
Ultra-wideband Communication RF Measurements 

Application Note 2004-05-21

A New Gated-CW Radar Implementation 
Review a gated-CW solution that provides performance and speed improvements for RCS measurements. Reprinted with the permission of Orbit/FR Inc.

Application Note 2004-03-03

PDF PDF 154 KB

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