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Focus where it counts

Missions evolve but one thing stays the same: the need to protect those who go in harm´s way. Success depends on a changing mix of people and technology ― and as technology becomes more complex, assuring readiness gets tougher.

Keysight is a source of assurance that your mission will succeed. Through our expertise in measurement science and test processes, we give you more time for the bigger issues: fulfilling today´s mission and managing the transition to what comes next. By helping you build greater assurance in system readiness, Keysight frees you to focus where it counts most.

See Measurement Solution Examples: Active Antenna Test, Multi-Emitter Environment Test Signals

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Solutions for Aerospace Avionics Testing 
How to optimize test systems using LXI technology.

Case Study 2008-04-15

PDF PDF 664 KB
Multiport Solutions for E5071C ENA RF Network Analyzers Using External Switches 
This app note describes how to expand the potential of multiport solutions for network analysis using the E5071C, with external electro-mechanical switches on handling high and low power signal measurements.

Application Note 2008-03-10

Airport ground radar System uses Agilent Acqiris PCI Digitizer cards Article  
Technologies and Thomas Harmon, Raytheon Electronic Systems on airport ground radar systems.

Article 2008-02-08

PDF PDF 123 KB
Advanced Design System Connected Solutions for Radar and EW Systems 
This article will explain the benefits of combining a simulated ADS radar model with physical test equipment to create what is referred to as a connect solution.

Article 2008-01-28

PDF PDF 799 KB
Avoid DUT Damage by Sequencing Multiple Power Inputs Off Upon a Fault Event 
Having the ability to control the power supply system itself can greatly reduce the effort and complexity associated with an external shut-down control method.

Application Note 2007-12-05

10 Reasons to Upgrade to a 16800 or 16900 Series Logic Analyzer 
10 Reasons to Upgrade to a 16800 or 16900 Series Logic Analyzer

Application Note 2007-12-03

PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12) 

Application Note 2007-11-28

External waveguide mixing and millimeter wave measurements with PSA Spectrum Analyzers (AN 1485) 

Application Note 2007-10-25

Measuring Group Delay of Frequency Converters with Embedded LO 

Application Note 2007-09-26

10 Practical Tips You Need to Know about Your Power Products - Application Note 
Learn ten simple ways to improve your testing capabilities with your power supplies and electronic loads.

Application Note 2007-09-21

Improving Throughput with Fast RF Signal Generator Switching 
This note describes techniques for optimizing RF signal generators within ATE systems to reduce test times and improve throughput.

Application Note 2007-09-19

Perfecting Pulsed RF Radar Measurements 
This paper examines the measurements and capabilities that are available for radar using modern spectrum analyzers, vector signal analyzers and power meters.

Article 2007-08-21

PDF PDF 100 KB
Software Defined Radio Measurement Solutions 
This Application Note introduces the SDR architecture and types of analysis tools that are available when measuring the digital, analog and RF sections of a software radio.

Application Note 2007-07-13

Modifying a GPIB System to Include LAN/LXI (AN 1465-26)  
This application note takes you through the process of replacing one instrument in a typical GPIB test system and shows how simple changes to the system software make it possible.

Application Note 2007-05-10

Using Linux in Your Test Systems: Linux Basics (AN 1465-27) 
If you haven’t used Linux in test applications, this document will provide a detailed overview. Topics include: A brief Linux history, why use Linux, free tools available for application development and an instrument control overview.

Application Note 2007-05-08

Making RF Measurements on Digital Serial Data with Keysight's Signal Extractor and the 89600 VSA 
This application note is designed to guide you through making measurements on serial data using a Keysight logic analyzer with the B4602A Signal Extractor tool and Keysight's 89601A vector signal analyzer (VSA) software. (AN 1593)

Application Note 2007-05-08

PDF PDF 2.93 MB
LXI-compliant oscilloscope boosts efficiency in ATE systems 
The LXI (LAN eXtensions for Instrumentation) standard specifies the interaction of proven, widely used standards to enable fast, efficient, and cost-effective creation and reconfiguration of test systems.

Application Note 2007-04-02

PDF PDF 286 KB
DME uses Keysight N6700 power supplies to help military test radios in the field  
Success story tells how defense electronics firm DME Corporation built a test system, known as the Advanced Tactical Agile Communications Test Set, or ATACTS, for testing military radios in the field.

Case Study 2007-03-15

PDF PDF 191 KB
Wideband Article in T&M World 
.pdf file Technology Leader Series

Article 2007-02-26

PDF PDF 1.15 MB
Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note 
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.

Application Note 2007-02-02

E3238S / 35688E Product Tour DVD 

Demo 2006-11-28

PDF PDF 185 Bytes
Using Synthetic Instruments in Your Test System (AN 1465-24) 
This note represents a brief history of SI, compares a rack-and-stack system to an SI-based system, descibes the initial applications of SIs, and illustrates the emulation of conventional instruments with SIs.

Application Note 2006-08-28

Fundamentals of RF and Microwave Power Measurements (Part 2) (AN 1449-2) 
Power Sensors and Instrumentation AN 1449-2, literature number 5988-9214EN

Application Note 2006-07-05

PDF PDF 1010 KB
How to Use VXI and PXI in Your New LXI Test System (AN 1465-23) 

Application Note 2006-06-06

Next-generation Test Systems: Advancing the Vision with LXI (AN 1465-16) 

Application Note 2006-05-01

PDF PDF 263 KB

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