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Focus where it counts

Missions evolve but one thing stays the same: the need to protect those who go in harm´s way. Success depends on a changing mix of people and technology ― and as technology becomes more complex, assuring readiness gets tougher.

Keysight is a source of assurance that your mission will succeed. Through our expertise in measurement science and test processes, we give you more time for the bigger issues: fulfilling today´s mission and managing the transition to what comes next. By helping you build greater assurance in system readiness, Keysight frees you to focus where it counts most.

See Measurement Solution Examples: Active Antenna Test, Multi-Emitter Environment Test Signals

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Reproducing DC Power Transients, Using an N6705B DC Power Analyzer to Create Transients - video 
DC power transients can easily be reproduced with N6705B DC Power Analyzer. Power transients can be used to test a DUT resilience to a change in voltage. Two examples are provided an automobile's voltage during engine turn-on and a PS interrupt specified in the DO-160F avionics test manual. Transients can also occur when the load on a PS changes.

Demo 2012-05-10

 
Spectrum and Signal Analyzer Measurements and Noise Application Note 1303 
Noise is the classical limitation of electronics. In this application note, the characteristics of noise and its direct measurement are discussed in detail.

Application Note 2012-05-04

6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems 

Application Note 2012-04-30

Agilent Technologies Named Oscilloscope Company of the Year 
The award is based on Frost & Sullivan's recent analysis of the oscilloscope market.

Press Materials 2012-04-26

 
Agilent Technologies’ Advanced Design System Selected by Comtech EF Data for Satellite Communication 
...a clear-cut advantage compared to other tools we had evaluated,” said Tibi Artzi, unit manager with Comtech EF Data

Press Materials 2012-04-25

 
EE Times Design article: Options for simulating wideband signals 

Article 2012-02-23

 
Using Software Defined Instruments to Address the Mixed-Signal Test Challenges of Today’s Software 
Link to a NASA Tech Brief article which states to ensure successful operation of SDR designs requires use of modern instruments capable of bridging the digital-analog divide, while also addressing any challenges stemming from use of the SDR technology itself

Article 2012-02-01

 
Making Wideband Measurements Application Note 
This paper will discuss using the Keysight PXA signal analyzer as a microwave down converter for an Infiniium oscilloscope or Acqiris digitizer running the 89600 VSA software.

Application Note 2012-01-24

Using Keysight SystemVue to Create Realistic Scenarios for Radar and EW Applications  
Shows how the combination of software and hardware capabilities makes it possible to create dynamic and realistic scenarios for both component testing and scenario simulation for system test.

Application Note 2012-01-24

PDF PDF 3.01 MB
Flexible OFDM Signal Generation, Analysis and Troubleshooting  
This application note presents a flexible solution for rapid OFDM waveform generation and analysis that employs traditional signal generation and analysis using a practical commercial off-the-shelf (COTS) approach.

Application Note 2012-01-12

High-Power Measurement Using The E5072A Network Analyzer Application Note 
This application note describes how to make high-power measurements with unique functions of the E5072A network analyzer.

Application Note 2011-12-23

Time Sidelobe Measurements to see Performance of Compressed-Pulse Radars 
This application brief defines problems seen in measurements of compressed-pulse radars, describes the time sidelobe method, and outlines uses of this approach.

Application Note 2011-12-07

PDF PDF 2.33 MB
Microwaves & RF article: Enhancing Analysis Of Spurious Emissions 
Enhancing analysis of spurious emissions shows that understanding the test instrument and measured signal can impact speed and accuracy.

Article 2011-11-07

 
Agilent Technologies Introduces World's First 67-GHz Nonlinear Vector Network Analyzer 
Using this hardware, designers can easily characterize and model components accurately up to frequencies of 67 GHz. In addition, X-parameters can be measured up to 67 GHz, providing an accurate model of linear and nonlinear component behavior at very high frequencies and wide bandwidth.

Press Materials 2011-10-17

 
Technology refresh, Asset management and Code compatibility 
Maximize your return on investment and minimize your risk with one of these programs.

Brochure 2011-09-09

 
Microwave Journal Article: Addressing the Challenges of Wideband Waveform Generation and Analysis 

Article 2011-09-08

 
Microwave Journal Article: Raising the Bar on Advanced Signal Simulation Using an AWG 

Article 2011-09-08

 
Solutions for Using a Frequency Counter to Measure Phase Noise Close to a Carrier Signal 
A local oscillator (LO) is the heart of any modern radar, electronic warfare or communication system. See how you can use this to your advantage.

Application Note 2011-08-01

Low Cost Radar Verification Testing with USB Sensor-Based Scalar Network 
Perform accurate measurements of RF and microwave power.

Application Note 2011-07-28

New Level of Realism in Testing and Evaluation of Advanced Radar and Electronic-Warfare Systems 

Press Materials 2011-07-27

 
Ultra-wideband radar system design article in EE Times 

Feature Story 2011-07-27

 
Reducing Phase Noise at RF and Microwave Frequencies 
Reviews the causes of phase noise and how it is specified.

Application Note 2011-07-05

Learn About the Latest in Signals Intelligence with these Resources From Keysight  
Order application notes, product notes and a CD.

Promotional Materials 2011-06-30

 
Aerospace/Defense Radar Test Solutions from Keysight - Brochure 
This brochure describes Keysight’s commitment to, and solutions for, the Aerospace/Defense market worldwide.

Brochure 2011-06-24

PDF PDF 1.84 MB
Creating a Radar Threat Simulator and Receiver Calibrator with Precise Angle of Arrival  
This application brief focuses on a solution for radar testing and covers three key topics: the problem, the solution, and the associated results and benefits.

Application Note 2011-06-20

PDF PDF 1.66 MB

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