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Basics & Measurement Fundamentals

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Understanding the Effects of Racking & System Interconnections (AN 1465-6) 

Application Note 2004-12-21

PDF PDF 235 KB
Choosing Your Test-System Hardware Architecture & Instrumentation (AN 1465-5) 

Application Note 2004-12-21

Test-System Development Guide: Operational Maintenance (AN 1465-8) 

Application Note 2004-12-21

Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note 
Using SCPI and Direct I/O vs. Drivers, the fifth note in the series, outlines the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems

Application Note 2004-12-13

PDF PDF 408 KB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note 
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

Application Note 2004-12-09

PDF PDF 189 KB
Testing FPGullwing Misalignment Across the Pad 
A technique is described which enables detection of misalignment of gullwing joints across the joint using duplicate components and FPGullwing Misalignment.

Application Note 2004-12-08

PDF PDF 1.58 MB
Understanding the PCAP Polarity Reject Signal 
This paper describes the algorithm used to determine if polarized capacitors are properly oriented.

Application Note 2004-12-02

PDF PDF 1.09 MB
Handling Surface Mapping with Varying Board Construction 
This paper describes a method for dealing with lot-to-lot or supplier-to-supplier variations in board construction. Often the variations in board construction result in different color boards which otherwise cause problems with surface mapping.

Application Note 2004-12-02

PDF PDF 1.02 MB
Understanding and Configuring the 5DX Selftest and Black/White Level Tests 
This paper discusses the theory and practice of 5DX automatic compensation tools, Selftest and gray level correction.

Application Note 2004-12-01

PDF PDF 158 KB
Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note 
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

Application Note 2004-11-19

PDF PDF 194 KB
System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note 
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

Application Note 2004-10-19

PDF PDF 204 KB
Network Analyzer Basics 
This 94-page note covers the principles of measuring high-frequency electrical networks with network analyzers, including the types of measuremetns and how they allow you to characterize both linear and nonlinear behavior of your devices.

Application Note 2004-09-15

PDF PDF 5.82 MB
Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note 
The decision to use LAN in a test system delivers important benefits to your company and your team. From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking

Application Note 2004-09-14

PNA Automation - Software Application Development (1408-13) 

Application Note 2004-09-13

5DX Virus Protection Software Policy 
Keysight recognizes that customers require data protection for their PC workstations and computer controlled manufacturing equipment such as the 5DX Test System and associated workstations.

Application Note 2004-08-26

 
The Importance of Test and Inspection When Implementing Lead-Free Manufacturing 
Many papers, articles, and studies have been written about process issues, reliability issues, repair issues, and the merits of different alloys. This paper addresses the impacts on test and inspection when going lead-free.

Application Note 2004-08-20

PDF PDF 260 KB
Using Lead-Free PCB Finishes at Manufacturing In-circuit Test Stage 
The purpose of this document is to share experiences and educate engineers regarding different PCB surface finishes and the specific changes required in the PCB build process to allow for ICT.

Application Note 2004-08-08

PDF PDF 102 KB
How to use the Keysight N6700 Modular Power System to replace a Keysight 662xA (AN 1467)  
This is a high-level overview to help current 662xA owners easily convert to a Keysight N6700.

Application Note 2004-08-02

Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note 
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.

Application Note 2004-07-29

PDF PDF 270 KB
PNA - Pulsed Measurement Accuracy (1408-11) 

Application Note 2004-02-17

Mixer Conversion-Loss and Group-Delay Meas. Techniques and Comparisons (1408-02) – Application Note 
This paper compares techniques and instruments for measuring conversion loss and group delay on a single stage converter with an embedded low pass filter. Conversion loss using a: spectrum, scalar, and vector network analyzer.

Application Note 2004-01-28

Jitter Fundamentals: Jitter Tolerance Testing with Keysight ParBERT 81250 - Application Note 
This applicaiton note describes gain fast and efficient insight into the operation and performance of CDR, clock system and jitter tolerance.

Application Note 2003-12-02

PDF PDF 3.18 MB
Solder Paste Inspection - Organize the Pieces 
Published in Global SMT & Packaging, November 2003

Application Note 2003-11-01

PDF PDF 818 KB
Realizing the Benefits of 3D Inline Solder Paste Inspection 
Published in SMT Magazine/Germany, August 2003

Application Note 2003-08-01

PDF PDF 67 KB
Test Coverage: What Does It Mean when a Board Test Passes? 
Originally presented at the 2002 International Test Conference -- Characterizing board test coverage as a percentage of devices or nodes having tests does not accurately portray coverage, especially in a limited access testing environment.

Application Note 2003-07-28

PDF PDF 266 KB

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