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锁相环

使用完整的系列设计及仿真工具,设计、合成和仿真锁相环(PLL)及频率合成器。 确保能够达到关键性能标准并可靠地进行产品制造。 可使用 Keysight EDA 软件产品,例如先进设计系统(ADS)、GoldenGate RFIC 仿真器和/或 Genesys,研究并优化关键特性(例如设置时间和相位噪声),以获得卓越的性能。

在完成设计后,您可以使用是德测试测量设备(例如信号源分析仪、示波器和频谱分析仪)测量和验证设计原型和产品。

E5052B SSA 信号源分析仪可为 PLL/VCO 设计和制造提供快速精确的测量,有助于在较短交付周期内生产出高质量的盈利产品。 仅使用这一综合解决方案,您即可对相位噪声、AM 噪声、锁定时间、VCO 调谐性能、谐波、直流电源噪声进行测量。

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Accuracy matters: Calibration Options for Lab Standards Webcast 
Live broadcast May 19, 2016; 10am PT / 1pm ET

网上直播

 
“示波器测量”网上直播系列  
Live and on-demand broadcasts that will teach you how to make precise measurements with its Infiniium line of real-time and sampling oscilloscopes.

网上直播

 
Keysight EEsof EDA Customer Education and Services 
Brief overview of Keysight EDA Customer Education and Services.

培训资料 2015-12-07

 
PCI Express 3.0 Compliance - Successfully Navigating the Standard Webcast 
Original broadcast May 7, 2013

网上直播 -- 已存档的

 
A Practical Approach to Verifying RFICs with Fast Mismatch Analysis 
Originally broadcast October 28, 2010

网上直播 -- 已存档的

 
Successful Modulation Analysis in 3 Steps Webcast 
Original broadcast January 22, 2014

网上直播 -- 已存档的

 
Genesys 网络研讨会--“如何设计”系列 
Originally broadcast in 2009. Access the 6 WebEX recordings

网上直播 -- 已存档的

 
适合低频测量应用的全新 5Hz 至 3GHz 矢量网络分析仪 - PDN、传感器等 
Originally broadcast Jan 20, 2010

网上直播 -- 已存档的

 
Agilent EEsof EDA 客户教育与服务 
Brief overview of Agilent EEsof EDA Customer Education and Services.

培训资料 2012-02-02

 
Keysight EEsof EDA 客户教育与服务  
Keysight EEsof MMIC Design Symposium

研讨会

 
Presentation on Simulating Phase Locked Loops using ADS 
This Presentation details PLL simulation using ADS, Envelope simulation, PLL component behavioral modeling, Phase noise, Spurs, Fractional N-simulation and Divide ratio using sigma delta modulator.

研讨会演示 2010-08-19

PDF PDF 1 MB
Keysight EEsof EDA Customer Education and Services 
Brief overview of Keysight EEsof EDA Customer Education and Services.

培训资料 2010-08-11

 
SSA presentation material – customer viewable slides with speaker notes 

研讨会演示 2008-10-10

PDF PDF 1.01 MB
Characterizing phase-locked-loop signal transition behaviors such as microphonic/phase-hits 

研讨会演示 2008-10-10

PDF PDF 1.26 MB
Presentation on Trends in Signal Integrity Tests 
A joint Presentation presented by Michael Reser and Rainer Plitschka (Agilent Technologies) on parametric tests for high-speed serial technologies focusing on latest trends in Signal Integrity tests.

培训资料 2006-09-01

PDF PDF 2.13 MB
Making Early Design Tradeoffs using Advanced Measurement Based Behavioral Models 
This Presentation (Connecting Design and Test Seminar, paper #2) decribes early design tradeoffs using advanced measurement based behavioral models in detail.

研讨会演示 2003-05-29

PDF PDF 2.22 MB
Understanding Jitter and Wander Measurements and Standards, Second Edition 

培训资料 2003-02-01

PDF PDF 6.18 MB
Presentation on ADS for Wireline and High Speed Analog Design 
A detailed Presentation (presented on 21 May 2002) on using Advanced Design System for Wireline and High Speed Analog Design.

研讨会演示 2002-05-21

PDF PDF 4.75 MB