Here’s the page we think you wanted. See search results instead:


Contact an Expert

Basics & Measurement Fundamentals

Refine the List

By Industry/Technology

By Type of Content

By Product Category

226-250 of 282

Maximizing Accuracy in Noise Figure Measurements (PN 85719A-1) 
This Product Note discusses factors that affect accuracy with the 85719A Noise Figure Measurement System. Statistically generated curves of noise figure measurements uncertainly are also included.

Application Note 2000-10-01

Optical Spectrum Analysis Basics (AN 1550-4) 
This Application Note is intended to provide the reader with a basic understanding of optical spectrum analyzers, their technologies, specifications, and applications. Chapter 1 describes interferometer-based and diffraction- grating-based optical spectrum analyzers. Chapter 2 defines many of the...

Application Note 2000-09-01

Techniques for Programming the 892X Family of Instruments (PN 892X) 
This Product Note describes some key programming techniques for the Keysight 892X family of products. This Note can be used as a training tool for users that are new to programming test equipment, or it can be used by experienced programmers that need to know about unique programming required for...

Application Note 2000-09-01

Network Analysis - Filter And Amplifier Measurement Examples (AN 1287-4) 
The network analyzer is used for a variety of device and component characterization tasks in both laboratory and production environments.

Application Note 2000-08-01

Measuring Close-In AM in the Presence of FM (PN 8590-5) 
This Product Note explains how to use the FFT function in 8590 C/E/L-series Spectrum Analyzers with Fast Fourier Transform (FFT). FFT simplifies AM analysis by providing a smart user interface. AM measurements of RF or microwave signals are quick, continuous, and repeatable even when FM is...

Application Note 2000-07-01

Simplified Filter Tuning Using Time Domain (AN 1287-8) 
This Application Note describes a method of tuning a filter using the time-domain response of its return loss, which makes filter tuning vastly easier.

Application Note 2000-07-01

Converting 8924C software for the E8285A 
This Product Note assumes you are converting software originally written for the Keysight 8924C, for use with the Keysight E8285A. Ideas are also included for modifying your software to function interchangeably with both the 8924C and the E8285A. This Note is meant to supplement the information...

Application Note 2000-07-01

Fundamentals of Signal Analysis (AN 243) 
This Application Note is a primer for those who are unfamiliar with the advantages of analysis in the frequency and modal domains and with the class of analyzers we call dynamic signal analyzers. It explains the time, frequency and modal domains and provides an overview of the major functions and...

Application Note 2000-06-01

8 Hints For Successful Impedance Measurement (AN 346-4) 
Selection criteria, device characteristics, fixturing and error correction etc.

Application Note 2000-06-01

Fundamentals of Modal Testing (AN 243-3) 
This modal test 56 page Application Note provides an verview of structural dynamics theory, the measurement process for acquiring frequency response data, parameter estimation (curve fitting), and the analytical techniques of structural analysis and their relation to experimental testing (such...

Application Note 2000-05-01

Comparing the Accuracy and Repeatability of On-Wafer CalibrationTechniques to 110 GHz 
by Cascade Microtech

Application Note 2000-03-16

Improving Network Analyzer Measurements of Frequency-translating Devices (1287-7) – Application Note 
This Application Note explores current test equipment solutions and techniques that can be used to accurately characterize and test frequency-translating devices.

Application Note 2000-03-01

Keysight TestJet Technology White Paper 
This paper describes the Keysight TestJet technique, which makes use of a property of most digital ICs in use in the mid-1990s: the lead frame.

Application Note 2000-01-01

Reducing Load Time for Loaderless Systems 
For Series 2L systems, it may be possible to reduce the time it takes to load a panel.

Application Note 1999-12-01

8 More Hints for Making Better Scopes Measurements 
This Application Note contains a variety of hints to help you understand and improve your use of oscilloscopes. It includes the following 8 hints: 1. Don't forget to check that probe 2. A quick, easy way to troubleshoot mixed hardware/software prototypes 3. Using scopes to measure noisy signals 4...

Application Note 1999-12-01

Printed Circuit Board Split-Pad Test Method and Design 
This application note describes the split-pad concept for use with a bed of nails style test fixture.

Application Note 1999-06-01

A Software Algorithm for Implementing Automatic Power Ranging in the 8960 Series 10 Wireless... 
This Product Note presents a software algorithm for performing automatic power ranging in the Keysight 8960 Series 10 wireless communications test set with the Keysight E1960A GSM mobile test application installed. Keysight E1960A GSM mobile test application revisions, up to and including, A.01.04...

Application Note 1999-04-01

Test Strategy for Complex Printed Circuit Board Assemblies 
This paper proposes a new test strategy for complex boards since the trend in Printed Circuit Board Assembly (PCBA) technology is towards higher complexity.

Application Note 1999-02-22

8 Hints for Debugging Siemens MCU-based Designs 
A new type of instrument, the mixed signal oscilloscope (MSO), closes the gap in MCU debugging tools. The Keysight 54645D from Hewlett-Packard combines two analog scope channels with 16 digital logic channels, so you can monitor analog and digital lines at the same time. This MSO offers more...

Application Note 1998-11-01

Discreet Analog Device Testing 
The Keysight 3070 series has quite a few built in features to make developing board tests easier, while protecting the operator, the board under test, and the 3070 itself from harm.

Application Note 1998-10-29

4 Hints for Making Better Microwave Counter Measurements 
This Product Note provides four pertinent hints for making better microwave counter measurements, describes the advantages of using a microwave counter, and deals with the unique measurement problems created by the advancement in counter technology.

Application Note 1998-09-01

NDF and RTF - Hashed Names 
There have been many questions about hashed directory names. This is a brief explanation of why they are, and how they are generated.

Application Note 1998-06-30

Fundamentals of RF and Microwave Power Measurements (AN 64-1A) 
This Application Note is for information only. Keysight no longer sells or supports these products.

Application Note 1998-06-01

Boundary-Scan Technology, Justification, and Test Implementation for Designers 
This paper provides practical insight for designers on the merits, design, and test implementation of Boundary-Scan Technology.

Application Note 1998-05-27

Effects of Lead Free Solders on Imaging Characteristics of the Keysight 5DX Laminographic X-ray Test  
The electronics industry is under pressure to migrate solder processes away from the usage of eutectic tin-lead solder and towards utilization of lead-free compounds.

Application Note 1998-05-01


Previous 1 2 3 4 5 6 7 8 9 10 ... Next