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Basics & Measurement Fundamentals

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226-250 of 293

Dealing with Board Thickness Variations 
The Keysight 5DX has the capability to be implemented such that it can accommodate thickness variations on a board-by-board basis. NOTE: Content described is in the 5DX Reference Guide but is no longer in Chapter 7 as mentioned herein.

Application Note 2001-05-16

Fundamentals of RF and Microwave Power Measurements (AN 64-1C) 
This Application Note is for information only. Keysight no longer sells or supports these products.

Application Note 2001-04-16

8 Hints for Making Better RF Counter Measurements 
This Brochure focuses on making better RF counter measurements by understanding the effects of counter architecture; recognizing the difference between resolution and accuracy, and scheduling calibration to match performance needs. In addition, the impact of timebase options is discussed along...

Application Note 2001-04-10

LCR/Impedance Measurement Basics 
presents impedance, component value definitions, typical measurement problemsand their solutions, and error correction and compensation techniques.

Application Note 2001-03-28

Improved Fault Coverage in a Combined X-ray and In-Circuit Test Environment 
Cutting functional test failures in half and doubling the faults detected at process test! These are some of the case study results observed in combined X-ray and in-circuit test environments.

Application Note 2001-02-27

Electrical In-circuit Test Methods for Limited-access Boards 
This paper surveys the various electrical test methods and tools available to address testing boards that lack full electrical access.

Application Note 2001-02-27

Use of Wrong Thickness Technique Gives Bad Test Results 
Beginning with release 6.0, there are two techniques for measurement of solder thickness on the Keysight 5DX, each based on use of a different Confirmation & Adjustment panel.

Application Note 2000-12-31

Exploring the Architectures of Network Analyzers (1287-2) – Application Note 
This Application Note explains that Network analyzers have become one of the most important tools for characterizing the performance of high-frequency components and devices.

Application Note 2000-12-06

The Why, Where, What, How, and When of X-ray Test 
How do the different AXI technologies work? What are the appropriate uses of 2D vs 3D X-ray? Where in the mfg process should AXI be placed? How can AXI be used to improve the mfg process?

Application Note 2000-11-01

Hybrid32 Migration 
This document is provided to help users of HybridPlus Pin Cards more easily incorporate the Hybrid32 technology into their existing systems.

Application Note 2000-11-01

Learned Data for the 5DX 
The Keysight 5DX uses learned data in several ways to improve algorithm performance. There are basically 2 different forms of learned data.

Application Note 2000-11-01

Maximizing Accuracy in Noise Figure Measurements (PN 85719A-1) 
This Product Note discusses factors that affect accuracy with the 85719A Noise Figure Measurement System. Statistically generated curves of noise figure measurements uncertainly are also included.

Application Note 2000-10-01

Techniques for Programming the 892X Family of Instruments (PN 892X) 
This Product Note describes some key programming techniques for the Keysight 892X family of products. This Note can be used as a training tool for users that are new to programming test equipment, or it can be used by experienced programmers that need to know about unique programming required for...

Application Note 2000-09-01

Optical Spectrum Analysis Basics (AN 1550-4) 
This Application Note is intended to provide the reader with a basic understanding of optical spectrum analyzers, their technologies, specifications, and applications. Chapter 1 describes interferometer-based and diffraction- grating-based optical spectrum analyzers. Chapter 2 defines many of the...

Application Note 2000-09-01

Network Analysis - Filter And Amplifier Measurement Examples (AN 1287-4) 
The network analyzer is used for a variety of device and component characterization tasks in both laboratory and production environments.

Application Note 2000-08-01

Measuring Close-In AM in the Presence of FM (PN 8590-5) 
This Product Note explains how to use the FFT function in 8590 C/E/L-series Spectrum Analyzers with Fast Fourier Transform (FFT). FFT simplifies AM analysis by providing a smart user interface. AM measurements of RF or microwave signals are quick, continuous, and repeatable even when FM is...

Application Note 2000-07-01

Converting 8924C software for the E8285A 
This Product Note assumes you are converting software originally written for the Keysight 8924C, for use with the Keysight E8285A. Ideas are also included for modifying your software to function interchangeably with both the 8924C and the E8285A. This Note is meant to supplement the information...

Application Note 2000-07-01

Simplified Filter Tuning Using Time Domain (AN 1287-8) 
This Application Note describes a method of tuning a filter using the time-domain response of its return loss, which makes filter tuning vastly easier.

Application Note 2000-07-01

8 Hints For Successful Impedance Measurement (AN 346-4) 
Selection criteria, device characteristics, fixturing and error correction etc.

Application Note 2000-06-01

Fundamentals of Signal Analysis (AN 243) 
This Application Note is a primer for those who are unfamiliar with the advantages of analysis in the frequency and modal domains and with the class of analyzers we call dynamic signal analyzers. It explains the time, frequency and modal domains and provides an overview of the major functions and...

Application Note 2000-06-01

Fundamentals of Modal Testing (AN 243-3) 
This modal test 56 page Application Note provides an verview of structural dynamics theory, the measurement process for acquiring frequency response data, parameter estimation (curve fitting), and the analytical techniques of structural analysis and their relation to experimental testing (such...

Application Note 2000-05-01

Comparing the Accuracy and Repeatability of On-Wafer CalibrationTechniques to 110 GHz 
by Cascade Microtech

Application Note 2000-03-16

Improving Network Analyzer Measurements of Frequency-translating Devices (1287-7) – Application Note 
This Application Note explores current test equipment solutions and techniques that can be used to accurately characterize and test frequency-translating devices.

Application Note 2000-03-01

Keysight TestJet Technology White Paper 
This paper describes the Keysight TestJet technique, which makes use of a property of most digital ICs in use in the mid-1990s: the lead frame.

Application Note 2000-01-01

8 More Hints for Making Better Scopes Measurements 
This Application Note contains a variety of hints to help you understand and improve your use of oscilloscopes. It includes the following 8 hints: 1. Don't forget to check that probe 2. A quick, easy way to troubleshoot mixed hardware/software prototypes 3. Using scopes to measure noisy signals 4...

Application Note 1999-12-01


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