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Long Term Evolution - LTE Test

LTE is still growing, adding subscribers around the world. The technology is evolving to LTE-Advanced and to LTE-Advanced Pro, adding measurement challenges at every step. Keysight is there to provide insight into your designs that optimize and integrate these technologies and to meet the latest standards. Our solutions reduced design uncertainty, provide faster and easier development of high-performing LTE products and help you find root causes faster. As an active member of 3GPP and other influential wireless standards bodies and leading 5G forums and consortia, we have been at the forefront of providing standard-compliant LTE test and design tools across the entire lifecycle– from simulation to R&D, design verification and pre-conformance, conformance, manufacturing, through network deployment and service assurance.

Our engineers, experts in design and test, are available to advise, assist and augment your teams all around the world. Our expertise is also readily available through white papers, application notes and webcasts for LTE, LTE-Advanced, MIMO, WLAN Test, and 5G.

To find the product that fits your stage of Long Term Evolution (LTE) development see links to the left.

Learn about LTE and its measurements in the LTE book written by 42 LTE experts

Hardware - Software - People - LTE Insights
 

  

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T4010S Conformance Test System - Technical Overview 
The T4010S LTE RF test systems are automated solutions for conformance test and design verification of LTE UE. This document covers key benefits, features, technical specifications and ordering info.

Technical Overview 2016-10-07

M9391A PXIe Vector Signal Analyzer 1 MHz to 3 GHz or 6 GHz - Data Sheet 
This data sheet contains specifications and other technical information related to the M9391A PXIe Vector Signal Analyzer.

Data Sheet 2015-07-10

M9381A PXIe Vector Signal Generator - Data Sheet 
The Keysight M9381A is the modular signal generator that provides Keysight quality and performance in the PXI form factor. It accelerates throughput by delivering new levels of speed in signal generation—the fastest RF tuning, Keysight proprietary innovative baseband tuning, versatile list mode, and more. Add the M9381A to your system—and break the speed barrier.

Data Sheet 2015-07-10

N9080A/W9080A LTE FDD & N9082A/W9082A LTE TDD X-Series Application - Technical Overview 
An overview of the LTE FDD/TDD (N/W9080A & N/W9082A) X-Series measurement applications.

Technical Overview 2015-04-04

89600 WLA Software - Technical Overview 
The 89600 WLA software provides wireless link analysis that decodes higher layer control messages and correlates them with the PHY-layer signals they manage.

Technical Overview 2014-05-15

89601B/BN-BHD, BHE, BHG, BHH LTE & LTE-Advanced FDD & TDD, 89600 VSA Software - Technical Overview 
The 89600 VSA software has the capability to analyze LTE-Advanced as well as LTE signals in both FDD and TDD formats.

Technical Overview 2014-05-14

P-Series Power Meter/Sensor LTE Measurement 
This article covers the technical overview and features, benefits and specifications of the P-Series power meters and sensors for LTE-TDD measurement applications.

Technical Overview 2010-11-19

LTE Solutions in Network Deployment and Optimization 
Keysight’s E6474A and N9912A provide air interface troubleshooting and optimization, cell site test and interference hunting on LTE systems

Technical Overview 2009-11-13

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W1910 LTE Boasband Verification Library, W1912 LTE Baseband Exploration 
The W1910EP/ET and W1912ET LTE baseband PHY libraries save time, reduce engineering effort and accelerate the maturity of baseband PHY designs for next-generation 3GPP LTE systems.

Data Sheet 2009-07-27

Advanced Design System: The High-Frequency/High-Speed Co-Design Platform 
Technical overview of Advanced Design System as a co-design platform.

Technical Overview 2009-02-10

 
3GPP-LTE Wireless Library Element Overview 
Overview of 3GPP-LTE Wireless Library Element

Technical Overview 2009-02-02

 
E8895 3GPP LTE Wireless Library 

Technical Overview 2007-07-23