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Education Corner - For Researchers and Educators

When classmates or colleagues work together, they can change the world. That’s our legacy, and it drives our vision: Keysight is dedicated to meaningful collaboration with researchers and educators. In the research lab, our history of innovation continues to enable new breakthroughs in science and technology. In classrooms and teaching labs, our instruments and software offer students experience with the same tools used by our customers in government and industry. When you connect with Keysight, we can help you shine in the lab and the classroom.

Faculty Spotlight highlights innovative university faculty programs’ collaboration with Keysight in their classroom and research. See the latest from the University of Leeds where two new Labs showcase high frequency and terahertz electronics research and the National Facility for Innovative Robotic Systems.

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3070 Boundary Scan 
Learn concepts of Boundary-Scan technology. TAP (test access port), the functionality of registers (BYPASS, boundary, IDCODE), and the structure of the "boundary-cell" are described.

Classroom Training

 
3070 Family Multiplexed User Fundamentals Class I 
Learn the basics needed to develop a Board Test program with the i3070 Multiplexed Board Test system. Design, develop, turn-on and debug tests. Typically, Class I and II are taken consecutively.

Classroom Training

 
Electronic Measurement Course Calendar for Europe 
Calendar of Electronic Measurement courses scheduled in Europe. Course details, dates, locations, and costs.

Classroom Training

 
Evénements Keysight en France 
Bienvenue sur la page des événements auxquels participe Keysight en France

Seminar

 
Formation Keysight VEE 
Le contenu des modules de formation VEE est destiné aux ingénieurs et techniciens débutants avec le logiciel VEE ou les utilisateurs plus expérimentés voulant consolider leurs connaissances.

Classroom Training

 
i3070 Family Multiplexed User Fundamentals Class II  
Enhanced training to take the programmer beyond the basics into custom test generation. Get more performance and coverage from your i3070. Typically, Class I and II are taken consecutively.

Classroom Training

 
Introduction à Keysight VEE 
L’objectif de ce cours est d’apprendre à résoudre vos problèmes de tests en développant des programmes à l’aide du langage de programmation Keysight VEE (Visual Engineering Environment), comprendre les fondamentaux du logiciel VEE, ...

Classroom Training

 
Keysight TS-5400 Series II Developers Training 
This class is an introduction to TestExec SL and the TS5400 series library’s. Topics covered include hardware and software architecture, built in diagnostic routines and hands on use of the TS5400 series platform.

Classroom Training

 
Keysight VEE Avancé 
L’objectif de ce cours est de découvrir les instructions détaillées, maitriser l’environnement VEE et les fonctionnalités vous permettant de travailler en programmation avancée avec le langage de programmation Keysight VEE ...

Classroom Training

 
Solutions innovantes d’analyse et de génération vectorielles 
1 journée de séminaire pour présenter les dernières solutions innovantes d’analyse et de génération vectorielles.

Seminar

 
Tour de France – Caen, le 26 mars 2012 : La conception et l’analyse de liens rapides 
Tour de France – Caen, le 26 mars 2012 : La conception et l’analyse de liens rapides

Seminar

 
Tour de France – Caen, le 7 février 2012 : L’analyse de spectre et l’analyse de réseaux 
Tour de France – Caen, le 7 février 2012 : L’analyse de spectre et l’analyse de réseaux

Tradeshow

 
Tour de France – Massy, le 16 février 2012 : Le futur du Wireless 
Tour de France – Massy le 16 février 2012 : Le futur du Wireless

Seminar

 
Tour de France – Nice le 19 avril 2012 : Conception et analyse de liens rapides  
Tour de France – Nice Sophia Antipolis, le 19 avril 2012 : Innovations en techniques de conception et de mesure selon Keysight

Seminar

 
10-Steps to Determine 3G/4G IP Data Throughput 
10-Steps to Determine 3G/4G IP Data Throughput

Webcast - recorded

 
10-Steps to Determine 3G/4G IP Data Throughput  
Original broadcast September 27, 2012

Webcast - recorded

 
2012 Wireless Seminar 
2012 Wireless Seminar

Seminar

 
3G Technology Overview 
This 2-day course will introduce engineers to the concepts of third generation cellular technologies.

Classroom Training

 
3GPP LTE Standards Update: Release 11, 12 and Beyond 
Original broadcast October 25, 2012

Webcast - recorded

 
86100C/83496B and E5052B SSA-J Phase Noise e-Seminar 
You've Measured The Jitter, Now How Do You Reduce It? (1 hour, recorded April 26, 2007)

Seminar Materials 2007-04-26

 
8x8 MIMO and Carrier Aggregation Test Challenges for LTE Webcast 
Original broadcast April 25, 2013

Webcast - recorded

 
A Practical Approach to Verifying RFICs with Fast Mismatch Analysis 
Originally broadcast October 28, 2010

Webcast - recorded

 
Accelerating USB 3.0 Product Development 
Super speed USB presents new challenges for designers and developers. Whether you are designing host, hub or device, Electrical or protocol, Agilent offers a complete solution for debug and validate your design.

Webcast - recorded

 
Achieving Success at 16 Gigabit Operation with PCI Express® 4.0 Webcast 
Live broadcast September 10, 2015; 10am PT / 1pm ET

Webcast

 
Addressing Challenging New Test Requirements for DOCSIS 3.1 Upstream Signals Webcast 
Live broadcast August 12, 2015; 10am PT / 1pm ET

Webcast

 

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