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Cellular

Insight. It comes upon you in a flash. And you know at once you have something special. At Keysight Technologies, the foundation is our unique mix of hardware, software and people. You can count on test equipment and design software that is built on more than 75 years of leadership in measurement science.

The continuing innovation across new and existing cellular technologies present challenges in designing and testing of mobile networks and devices. As the world’s leading electronic measurement company, Keysight technologies continues to be at the forefront offering full portfolio of cellular test and design solutions that span the entire lifecycle – from simulation to R&D, design verification and pre-conformance, conformance, manufacturing, through network deployment and service assurance.

We know what it takes for your designs to meet the latest cellular standards. As an active member of 3GPP and other most influential wireless standards bodies and leading 5G forums and consortia, we have been at the forefront of providing standard-compliant cellular test and design tools from the legacy 1G through latest 4G technologies, and maintain our leadership position by providing the largest array of design and test solutions for 5G research covering simulation and test.

We design our instruments to be future-proof, making it easier for you to evolve with changing technologies and stay on the leading edge. You can carry your investment forward with consistent measurement science that spans research and development today and extends to manufacturing and deployment in the future.

Our engineers, experts in design and test, are available to advise, assist and augment your teams all around the world. Our expertise is also readily available through white papers, application notes and webcasts for 5G, Cellular, MIMO and WLAN Test.

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3070 Boundary Scan 
Learn concepts of Boundary-Scan technology. TAP (test access port), the functionality of registers (BYPASS, boundary, IDCODE), and the structure of the "boundary-cell" are described.

Classroom Training

 
3070 Family Multiplexed User Fundamentals Class I 
Learn the basics needed to develop a Board Test program with the i3070 Multiplexed Board Test system. Design, develop, turn-on and debug tests. Typically, Class I and II are taken consecutively.

Classroom Training

 
Advanced Troubleshooting Con Oscilloscopi Serie 4000 
Advanced Troubleshooting Con Oscilloscopi Serie 4000

Seminar

 
Advanced Troubleshooting with Oscilloscopes 
Advanced Troubleshooting with Oscilloscopes

Seminar

 
Aerospace & Defense Seminar Italy 
Aerospace & Defense Seminar Italy

Seminar

 
Affidabilità & Tecnologie 
Keysight Technologies sarà presente quest’anno alla 9° edizione di Affidabilità & Tecnologie Fiera Internazionale, Lingotto Fiere.

Seminar

 
Cable and Connector Care 
Accelerated Education Curriculum: Training for fundamentals of connector care

Classroom Training

 
Debug di PCB - Misure di Pre-conformita’ EMC 
Debug di PCB - Misure di Pre-conformita’ EMC

Seminar

 
Electronic Measurement Course Calendar for Europe 
Calendar of Electronic Measurement courses scheduled in Europe. Course details, dates, and locations.

Classroom Training

 
European Microwave Week 2007 
European Microwave Week 2007 is an annual pan-European event combining four conferences and a tradeshow during the course of the week with the addition of short courses and workshops to complement the main sessions.

Tradeshow

 
Eventi di Keysight Italia 
Benvenuti nella pagina degli eventi di Keysight Italia

Seminar

 
High Speed Digital Seminar Italy 
High Speed Digital Seminar Italy

Seminar

 
High Speed Digital Seminar Italy 
High Speed Digital Seminar Italy

Seminar

 
i3070 Family Multiplexed User Fundamentals Class II  
Enhanced training to take the programmer beyond the basics into custom test generation. Get more performance and coverage from your i3070. Typically, Class I and II are taken consecutively.

Classroom Training

 
Keysight EEsof MMIC Design Symposium - Tuesday 8th November 2011 
Keysight EEsof MMIC Design Symposium

Seminar

 
Keysight TS-5400 Series II Developers Training 
This class is an introduction to TestExec SL and the TS5400 series library’s. Topics covered include hardware and software architecture, built in diagnostic routines and hands on use of the TS5400 series platform.

Classroom Training

 
Misure di compatibilita‘ elettromagnetica 
Keysight Technologies in collaborazione con Microlease Italia hanno il piacere di invitarla al seminario sulle Misure di compatibilita’ elettromagnetica

Seminar

 
MMIC Design Solution & foundries for GaN technology 
MMIC Design Solution & foundries for GaN technology

Seminar

 
Seminari Agilent in collaborazione con Microlease 
Debug di PCB: Signal Integrity su circuiti con bus ad alta velocita' Problematiche di compatibilita’ EMC Analisi Termodinamica

Seminar Materials - Archived

 
Seminari Finmeccanica 
Radar, EW and ELINT signal analysis and simulation Wideband Solutions for Radar/EW Millimeter Signal Measurements: Techniques, Solutions and Best Practices Repair and Calibration challenges for latest and next generation instruments

Seminar

 
Seminari Finmeccanica 
Radar, EW and ELINT signal analysis and simulation Wideband Solutions for Radar/EW Millimeter Signal Measurements: Techniques, Solutions and Best Practices Repair and Calibration challenges for latest and next generation instruments

Seminar

 
Seminari Keysight in collaborazione con Microlease 
Misure scalari e vettoriali dei parametri S con un analizzatore di Rete Palmare – Field Fox Introduzione alla nuova tecnologia wireless LTE – dalle caratterizzazione completa del livello fisico fino al test di coformita’

Seminar

 
Seminario Aerospazio e Difesa 
Se vi occupate di misura su dispositivi A&D e siete interessati ad approfondimenti sugli ultimi sviluppi nel settore,

Seminar

 
Seminario RF e Microonde  
Seminario RF e Microonde

Seminar

 
Seminario RF e Microonde  
Seminario RF e Microonde

Seminar

 

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