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W-CDMA/HSPA Applications Feature Comparison
This table compares key features present in the 8960 W-CDMA/HSPA Test and Lab Application products. Click the link at the top of the Release Notes to view.

선택 가이드 2014-11-06

PDF PDF 142 KB
TS-8989 PXI Functional Test System - System Integration Guide - Application Note
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

어플리케이션 노트 2014-11-06

PDF PDF 611 KB
1xEV-DO Applications Feature Comparison
This table compares key features present in the 8960 1xEV-DO Test and Lab Application products.

선택 가이드 2014-11-06

PDF PDF 92 KB
cdma2000® Applications Feature Comparison
This table compares key features present in the 8960 cdma2000® Test and Lab Application products.

선택 가이드 2014-11-06

PDF PDF 92 KB
5600LS High Resolution Large Stage AFM - Data Sheet

데이터시트 2014-11-06

PDF PDF 712 KB
Revolutionary Keysight Express Test Option for the Nano Indenter G200 - Data Sheet
Features, benefits and specifications for the Express Test Option for the G200 indenter

데이터시트 2014-11-06

PDF PDF 473 KB
Liquid Cell and Sample Plate - Data Sheet

데이터시트 2014-11-06

PDF PDF 891 KB
Probe Resource Center
Visit the Probe Resource Center for probe manuals, data sheets, SPICE models, videos, application notes, and more.

도움말 파일 2014-11-04

T3100S Series NFC Test Systems - Technical Overview
This technical overview shows the elements and specifications that create the T3100S Series Test Systems for NFC testing during product development, R&D, pre-conformance and final certification.

기술 개요 2014-11-04

PDF PDF 3.31 MB
MIPI M-PHY, D-PHY and C-PHY Receiver Testing- Recorded webcast
MIPI M-PHY, D-PHY and C-PHY Receiver Testing- Recorded webcast

기본 데모 2014-11-03

PicoLITH, Keysight Lithography and Nanomanipulation Package – Data Sheet
Lithography and nanomanipulation software that provides for scanning probe microscopy (SPM) researchers. It allows users to sketch various shapes on a canvas (including lines, poly-lines, circles) that can then be mapped to a real sample surface.

데이터시트 2014-11-03

PDF PDF 491 KB
MAC Mode - Data Sheet

데이터시트 2014-11-03

PDF PDF 1.08 MB
EasyEXPERT Online Help
Online help file for EasyEXPERT and Desktop EasyEXPERT software

도움말 파일 2014-10-31

HTML HTML 4.08 MB
8157xA Optical Attenuators - Data Sheet
Keysight 8157xA Variable Optical Attenuators are instruments that attenuate and control the optical power level of light in single mode optical fibers. As plug-in modules for Agilent's Lightwave Solution platform (8163A/B, 8164A/B, 8166A/B) they allow you to set the attenuation factor and/or power level manually, or remotely via a common computer interface. Their high accuracy combined with their flexibility make them ideal as test and measurement equipment for the modern telecommunication industry.

기술 개요 2014-10-30

8960 Wireless Communications Test Set HSPA Applications - Application Note
key features for HSPA applications for the 8960 wireless communications test set. Specifically for the E6703F W-CDMA lab application and E1963A mobile test application.

브로셔 2014-10-29

PDF PDF 383 KB
E6640A EXM Wireless Test Set - Getting Started Guide
Getting started information for the E6640A EXM wireless test set.

사용자 매뉴얼 2014-10-28

PDF PDF 4.35 MB
IO Libraries Suite Interface Support Matrix - Technical Overview
The support matrix for I/O hardware interface, Operating System, and Keysight IO Libraries revision...

기술 개요 2014-10-28

E7515A UXM Wireless Test Set - User's and Programmer's Guide
This manual describes the following aspects of the E7515A UXM: - using the Application Switch Tool - setting up the programming connection for sending SCPI commands to each UXM software component - specifying RF Cable Compensation.

사용자 매뉴얼 2014-10-27

PDF PDF 1.21 MB
IO Libraries Suite Unsupported Interface Support Matrix - Technical Overview
The support matrix for unsupported I/O hardware interfaces, Operating Systems, and Keysight IO Libraries revisions...

기술 개요 2014-10-24

E6650A EXF One-Box Tester Scales with Volume Growth, Lowers Cost of Test in Femtocell Mfg
Keysight announces the E6650A EXF wireless test set, the industry's first one-box tester dedicated to femtocell manufacturing. Delivering speed, performance and scalability needed to ramp up production and lower the cost of test. Validation with the latest cellular and WLAN chipsets reduces start-up time.

보도자료 2014-10-21

N4980A Multi-Instrument BERT Software - Data Sheet
The N4980A Multi-Instrument BERT software is a graphical user interface that controls multiple instruments for performing a series of BER measurements.

데이터시트 2014-10-21

M8195A 65 GSa/s Arbitrary Waveform Generator - Data Sheet
New Arbitrary Waveform Generator with the highest combination of speed, bandwidth and channel density. Flexible signal generation at up to 32 Gbaud.

데이터시트 2014-10-20

N5980A 3.125 Gb/s Serial BERT - Data Sheet
The Keysight Technologies, Inc. N5980A 3.125 Gb/s Serial BERT is ideal for manual or automated manufacturing test of electrical and optical devices running at speeds between 125 Mb/s to 3.125 Gb/s.

데이터시트 2014-10-17

40GHz RIN Measurement System
RIN measurement with the world's widest 40 GHz bandwidth Best solution for 40G/100G optical TX laser characterization Unique and accurate calibration for uncertainty reduction Optional function of optical modulation depth measurement

브로셔 2014-10-16

PDF PDF 613 KB
Medalist i3070 Series 5i Inline In-Circuit Test System – Data Sheet
Keysight’s Medalist i3070 Series 5i Inline In-Circuit Test system is SMEMA-compliant and designed to bring you all the industry-leading ICT technologies into your fully automated manufacturing line.

데이터시트 2014-10-15

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