전문가 상담

AFM(Atomic Force Microscope), FE-SEM, 나노인덴터, UTM

연구 리소스

  • Nanoindenters Nanoindenters 

    Nanoindenters

    Nanoindenter technology provides the most advanced and dependable nano- and microscale material analysis available today.

  • Atomic Force 마이크로스코프 Atomic Force 마이크로스코프 

    Atomic Force 마이크로스코프

    Atomic force 마이크로스코프, 스캐닝 프로브 마이크로스코프, molecular recognition 툴...

  • Scanning Electron Microscopes Scanning Electron Microscopes 

    Scanning Electron Microscopes

    The new Keysight 8500B FE-SEM has been optimized for low-voltage high-resolution imaging and now has integrated energy dispersive spectroscopy (EDS).The 8500B delivers consistent, reproducible performance and the industry’s lowest cost of ownership.

  • Universal Testing Machine (UTM) Universal Testing Machine (UTM) 

    Universal Testing Machine (UTM)

    The Keysight universal testing machine (UTM) offers researchers a superior means of nanomechanical characterization.