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Atomic Force Microscopes, FE-SEM, Nanoindenters, UTM

Research Resources

  • Nanoindenters Nanoindenters 

    Nanoindenters

    Nanoindenter technology provides the most advanced and dependable nano- and microscale material analysis available today.

  • Atomic Force 마이크로스코프 Atomic Force 마이크로스코프 

    Atomic Force 마이크로스코프

    Atomic force 마이크로스코프, 스캐닝 프로브 마이크로스코프, molecular recognition 툴...

  • Scanning Electron Microscopes Scanning Electron Microscopes 

    Scanning Electron Microscopes

    The new Keysight 8500 FE-SEM is an innovative, research-grade system for imaging & characterizing materials at the nanoscale. Its compact size installs easily & delivers high resolution images and repeatable performance.

  • Universal Testing Machine (UTM) Universal Testing Machine (UTM) 

    Universal Testing Machine (UTM)

    The Keysight universal testing machine (UTM) offers researchers a superior means of nanomechanical characterization.