전문가 상담

Discontinued and Obsolete Parametric Test Equipment

  • 4140B pA Meter / DC Voltage Source [폐기] 4140B pA Meter / DC Voltage Source [폐기] 

    4140B pA Meter / DC Voltage Source [폐기]

    The 4140B was discontinued on November 1, 2000 and became obsolete on January 1, 2006.

  • 4142B Modular DC Source/Monitor [폐기] 4142B Modular DC Source/Monitor [폐기] 

    4142B Modular DC Source/Monitor [폐기]

    The 4142B was discontinued on July 1, 2003, and became obsolete on September 1, 2008.

  • 4145A/B Semiconductor Parameter Analyzers [폐기] 4145A/B Semiconductor Parameter Analyzers [폐기] 

    4145A/B Semiconductor Parameter Analyzers [폐기]

    The 4145A was discontinued on March 1, 1986 and became obsolete on November 1, 1993. The 4145B was discontinued in November 1, 1994 and became obsolete on November 1, 1999.

  • 4155A / 4156A / 41501A Semiconductor Parameter Analyzers [폐기] 4155A / 4156A / 41501A Semiconductor Parameter Analyzers [폐기] 

    4155A / 4156A / 41501A Semiconductor Parameter Analyzers [폐기]

    The 4155A, 4156A, and 41501A were discontinued on January 1, 1998 and became obsolete on January 31, 2003.

  • 4155B / 4156B Semiconductor Parameter Analyzers [폐기] 4155B / 4156B Semiconductor Parameter Analyzers [폐기] 

    4155B / 4156B Semiconductor Parameter Analyzers [폐기]

    The 4155B and 4156B were discontinued on December 1, 2000 and became obsolete on February 1, 2006.

  • 4280A 1 MHz C Meter / C-V Plotter [폐기] 4280A 1 MHz C Meter / C-V Plotter [폐기] 

    4280A 1 MHz C Meter / C-V Plotter [폐기]

    The 4280A was discontinued on November 1, 2000 and became obsolete on January 1, 2006.

  • E5270A / E5272A / E5273A Parametric Measurement Solutions [폐기] E5270A / E5272A / E5273A Parametric Measurement Solutions [폐기] 

    E5270A / E5272A / E5273A Parametric Measurement Solutions [폐기]

    The E5270A, E5272A, and E5273A were discontinued on November 1, 2004, and are under support through December 31, 2012.

  • 4157B Modular Semiconductor Parameter Analyzer [생산 중단] 4157B Modular Semiconductor Parameter Analyzer [생산 중단] 

    4157B Modular Semiconductor Parameter Analyzer [생산 중단]

    The 4157B offers flexibility, expandability, and upgradeability in a PC-based measurement environment, providing a complete solution for parametric measurement and analysis.

  • VPA/PME Software [생산 중단] VPA/PME Software [생산 중단] 

    VPA/PME Software [생산 중단]

    VPA/PME helps you visually analyze, manipulate, manage, and re-use large quantities of test data, reducing parametric testing time in semiconductor process, development and integration environments.

  • 41000 Series Integrated Parametric Analysis and Characterization Environment (iPACE) [단종됨] 41000 Series Integrated Parametric Analysis and Characterization Environment (iPACE) [단종됨] 

    41000 Series Integrated Parametric Analysis and Characterization Environment (iPACE) [단종됨]

    The Keysight 41000 Series is a highly accurate CV-IV parametric measurement solution for the characterization of wafers in low-volume R&D, laboratory and process development environments.

  • 4155C / 4156C Semiconductor Parameter Analyzers [단종됨] 4155C / 4156C Semiconductor Parameter Analyzers [단종됨] 

    4155C / 4156C Semiconductor Parameter Analyzers [단종됨]

    A comprehensive set of instrument solutions for parametric test, usable standalone or through provided Windows-based software

  • Discontinued Parametric Test Systems [단종됨] Discontinued Parametric Test Systems [단종됨] 

    Discontinued Parametric Test Systems [단종됨]

    Provides a broad range of system configurations to meet your production parametric testing needs.

  • Flat Panel Display Test Systems [단종됨] Flat Panel Display Test Systems [단종됨] 

    Flat Panel Display Test Systems [단종됨]

    Product information for discontinued flat panel display test systems

  • N9201A Array Structure Parametric Test System [생산 중단] N9201A Array Structure Parametric Test System [생산 중단] 

    N9201A Array Structure Parametric Test System [생산 중단]

    Supports up to 40 total SMUs for extremely fast characterization of in-line array test structures.

  • Obsolete product - I/CV 3.0 Lite Automation Software [폐기] Obsolete product - I/CV 3.0 Lite Automation Software [폐기] 

    Obsolete product - I/CV 3.0 Lite Automation Software [폐기]

    Provides interactive and automated control of parametric instruments in a PC-based environment.

  • Reliability Tests [단종됨] Reliability Tests [단종됨] 

    Reliability Tests [단종됨]

    The ASUR (Advanced Scalable Unified Reliability) product family provides a range of semiconductor reliability test structures, measurement and analysis (C1280A, C1281A and C1282A).