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Imaging with self-sensing cantilever on Keysight 5500/5600LS Atomic Force Microscopes - App Note
In this collaborative work, a brief technical background of self-sensing cantilevers and the developed Convert Unit for Keysight 5500/560LS AFM systems is introduced.

アプリケーション・ノート 2017-08-21

PDF PDF 5.16 MB
Wideband Electrostatic Force Microscopy (EFM): Broad Frequency Range with High Sensitivity -App Note
Wideband electrostatic force microscopy that extends the available EFM frequency range from the kHz to the GHz range as well as the measuring capabilities, which works in tapping or lift mode therefore reduces the tip wear and sample modifications.

アプリケーション・ノート 2017-08-21

PDF PDF 598 KB
KFM & CSAFM, Environmental Control in Fuel Cell Research for the Automotive Industry - App Note
Explanation of two AFM modes used in automotive research for fuel cells

アプリケーション・ノート 2017-02-21

PDF PDF 1.75 MB
AFM/SPM Accessories - Brochure
Catalog of all AFM accessories and options

ブローシャ 2016-09-22

PDF PDF 4.63 MB
Scanning Microwave Microscopy for Quantitative Imaging of Biological Samples Including Live Cells
The use of Scanning Microwave Microscopy with AFM for quantitative imaging of biological samples including live cell imaging.

アプリケーション・ノート 2016-08-30

PDF PDF 2.89 MB
Scanning Microwave Microscopy Solutions for Quantitative Semiconductor Device Characterization
Discussion of Scanning Microwave combined with Atomic Force Microscopy for calibrated measurements for Semiconductor devices

アプリケーション・ノート 2016-07-15

PDF PDF 3.31 MB
Post Processing Pico Image Software for Keysight AFM Systems - Data Sheet
Pico Image surface imaging and analysis software is dedicated to Keysight AFMs and SPMs. It contains three levels for basic, advanced, and expert users. Standalone and network licenses are available.

データシート 2016-07-02

PDF PDF 2.89 MB
Using Nanomeasurement Systems for Nanoscale Investigations of Graphene - Application Note

アプリケーション・ノート 2016-03-11

PDF PDF 7.96 MB
Keysight Technologies ナノ測定ソリューション カタログ
柔軟性の高い高分解能のAFMソリューションで、複数のアプリケーションに対応

ブローシャ 2016-02-26

PDF PDF 2.20 MB
Atomic Force Microscopy Studies in Various Environments - Application Note
Overview of using the environmental chamber with water, humidity and gaseous vapors in Polymer research

アプリケーション・ノート 2015-03-23

PDF PDF 5.80 MB
Compositional Mapping of Materials with Single Pass Kelvin Force Microscopy - Application Note
Applications of single-pass KFM showing that the mode complements phase imaging in compositional mapping of complex materials.

アプリケーション・ノート 2015-03-13

PDF PDF 8.09 MB
High Resolution Scanning Probe Microscopy in Controlled Environments - Application Note
This Application Note reports investigations involving high resolution SPM experiments with Keysight Technologies SPMs working in a glove box environment without compromising the SPM performance.

アプリケーション・ノート 2015-02-02

PDF PDF 1.57 MB
Electrical Measurement - Application Note
Overview of electrical measurements using AFM in various modes

アプリケーション・ノート 2014-12-15

PDF PDF 4.11 MB
How to choose your MAC Lever - Technical Overview

技術概要 2014-12-09

PDF PDF 168 KB
Attaching Antibodies to AFM Probes with Sulfhydryl Reactive PEG Tether NHS-PEG18-PDP - App Note

アプリケーション・ノート 2014-12-08

PDF PDF 329 KB
Attaching Antibodies to MAC Levers with the Bifunctional Amine-Amine Reactive PEG Tether - App Note

アプリケーション・ノート 2014-12-08

PDF PDF 742 KB
Temperature Control - Data Sheet

データシート 2014-11-17

PDF PDF 491 KB
Liquid Cell and Sample Plate - Data Sheet

データシート 2014-11-06

PDF PDF 891 KB
MAC Mode - Data Sheet

データシート 2014-11-03

PDF PDF 1.08 MB
PicoLITH, Keysight Lithography and Nanomanipulation Package – Data Sheet
Lithography and nanomanipulation software that provides for scanning probe microscopy (SPM) researchers. It allows users to sketch various shapes on a canvas (including lines, poly-lines, circles) that can then be mapped to a real sample surface.

データシート 2014-11-03

PDF PDF 491 KB
New Investigations into Energy: Keysight Nanomeasurement Systems - Application Note
The data presented demonstrates just a few of the ways in which the latest atomic force microscopy (AFM), nanoindentation, and field-emission scanning electron microscope can be utilized to enhance energy-related materials research.

アプリケーション・ノート 2014-04-24

PDF PDF 2.58 MB
Friction, Phase and KFM Characterization of Functionalized Graphene Oxide

アプリケーション・ノート 2012-08-09

PDF PDF 443 KB
Graphene Oxide & Its Applications Revealed by Atomic Force Microscopy

アプリケーション・ノート 2012-06-27

PDF PDF 305 KB
Quantitative Surface Potential Measurement Using KFM - Application Note

アプリケーション・ノート 2012-04-20

PDF PDF 360 KB
Thickness-dependent Electrical Properties of Single-layer Graphene and Few-layer Graphene
Thickness-dependent Electrical Properties of Single-layer Graphene and Few-layer Graphene: a Kelvin Force Microscopy Study

アプリケーション・ノート 2012-03-13

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